GaAs基InAs量子点中类氢杂质的束缚能

在有效质量近似下,采用微扰法研究了InAs/GaAs量子点内类氢杂质基态及低激发态的束缚能.受限势采用抛物形势,在二维平面极坐标下,精确地求解了电子的薛定谔方程.数值计算结果表明,类氢杂质基态及低激发态的束缚能敏感地依赖于抛物形势的角频率,受类氢杂质的影响,谱线发生蓝移.这一结果对设计和制备量子点器件是有价值的.

GaAs(331)A面InAs自组织纳米结构形貌演化

采用分子束外延方法在CaAs(331)A高指数衬底上制备自对齐InAs纳米线(QWRs)或者三维(3D)岛状结构.InAs纳米线(QWRs)选择性生长在CaAs层的台阶边缘.通过原子力显微镜(AfM)仔细研究了InAs纳米微结构的表面形貌,发现不同的生长条件,包括:衬底温度、生长速率、和InAs层厚度等,对InAa表面形貌有很大的影响.如,低温更容易导致线状纳米微结构的形成,而高温更利于3D岛状结构形成.表面形貌的转变归结于表面能同应变能之间的竞争.

光致发光谱研究自组织InAs双模量子点态填充

采用固态源分子束外延技术在GaAs（100）衬底上，制备了InAs量子点，对样品进行原子力显微镜测试，统计结果表明量子点尺寸呈双模分布。光致发光谱研究表明，在室温和77K下，小量子点的发光峰均占主导地位，原因可能是

Mn离子注入InAs/GaAs量子点结构材料的光电性质研究

用高能离子注入(160 keV)的方法对InAs/GaAs量子点结构进行掺杂,研究了不同退火工艺处理后量子点的光致发光和电学性能.相对于长时间退火,快速退火处理后的量子点发光通常较强.在相同的退火条件下,量子点发光峰位随着Mn注入剂量的增加,先是往高能量端快速移动,而后发光峰又往低能方向移动.后者可能是由于Mn原子进入InAs量子点,释放了InAs量子点中的应变所致.对于高注入剂量样品和长时间退火样品,变温电阻曲线在40 K附近会出现反常行为.

GaAs基GaSb体材料及InAs/GaSb超晶格材料的MBE生长

采用分子束外延方法在GaAs(100)衬底上生长GaSb体材料,以此GaSb为缓冲层生长了不同InAs厚度的InAs/GaSb超晶格,其10K光致发光谱峰值波长在2.0～2.6 μm.高分辨透射电子显微镜观察证实超晶格界面清晰,周期完整.

InAs单层和亚单层结构中的自旋动力学研究

利用偏振时间分辨光谱和时间分辨Kerr旋转谱,研究了(GaAs中的InAs单层和亚单层的电子自旋动力学.实验发现,在非共振激发条件下,厚度为l/3单层的InAs山亚单层中电子自旋弛豫寿命长达3.4 ns,而1个单层厚的InAs层的电子自旋寿命只有0.48 ns;而在共振激发条件下,亚单层结构中的电子自旋寿命大大减少,只有70ps,单层hLAs中电子自旋寿命没有显著变化.分析表明,低温下InAa单层和亚单层结构中,Bir-Aronov-Pikus(BAP)自旋弛豫机理占主导地位.通过改变材料结构特性和激发条件来改变电子空穴的空间相关性,从而达到控制自旋弛豫的目的.

DCXRD Investigation of a Ge/Si（001） Island Multilayer Structure

A Ge/Si（001） island multilayer structure is investigated by double crystal X-ray diffraction, transmission electron microscopy,and atomic force microscopy. We fit the satellite peaks in the rocking curve by two Lorentz lineshapes, which originate from the wetting layer region and the island region. Then from the ratio of the thick- nesses of the Si and Ge （GeSi） layers as determined by TEM,tbe Ge compositions of the wetting layer and islands are estimated to be about 0. 51 and 0. 67, respectively,according to the positions of the fitted peaks. This proves to be a relatively simple way to investigate the Ge/Si （001） island multilayer structure.

GaAs基上的InAs量子环制备

在分子束外延系统中,利用3 nm GaAs薄盖层将InAs自组装量子点部分覆盖,然后在500℃以及As_2气氛中退火一分钟,制成纳米尺度的InAs量子环.这一形成敏感地依赖于退火时的生长条件和生长InAs自组装量子点时的淀积量.InAs在GaAs表面的扩散以及同时发生的In-Ga互混控制着InAs量子环的形成.

Room temperature continuous wave operation of 1.33-micron InAs/GaAs quantum dot laser with high output power

Continuous wave operation of a semiconductor laser diode based on five stacks of InAs quantum dots (QDs) embedded within strained InGaAs quantum wells as an active region is demonstrated. At room temperature, 355-mW output power at ground state of 1.33-1.35 microns for a 20-micron ridge-waveguide laser without facet coating is achieved. By optimizing the molecular beam epitaxy (MBE) growth conditions, the QD density per layer is raised to 4*10^(10) cm^(-2). The laser keeps lasing at ground state until the temperature reaches 65 Celsius degree.

不同淀积厚度InAs量子点的喇曼散射

利用喇曼散射方法在77K温度下对不同淀积厚度的InAs/GaAs量子点材料进行了研究.在高于InAs体材料LO模的频率范围内观察到了量子点的喇曼特征峰,分析表明应变效应是影响QD声子频率的主要因素.实验显示,随着量子点层淀积厚度L的增加,InAs量子点的声子频率由于应变释放发生红移.在加入InAlAs应变缓冲层的样品中,类AlAs声子峰随L增大发生了蓝移,从侧面证实了InAs量子点层的应变释放过程.

Fabrication of an AlAs/In0.53Ga0.47As/InAs Resonant Tunneling Diode on InP Substrate for High-Speed Circuit Applications

A high performance AlAs/In0.53 Ga0.47 As/InAs resonant tunneling diode （RTD） on InP substrate is fabricated by inductively coupled plasma etching. This RTD has a peak-to-valley current ratio （PVCR） of 7. 57 and a peak current density Jp = 39.08kA/cm^2 under forward bias at room temperature. Under reverse bias, the corresponding values are 7.93 and 34.56kA/cm^2 . A resistive cutoff frequency of 18.75GHz is obtained with the effect of a parasitic probe pad and wire. The slightly asymmetrical current-voltage characteristics with a nominally symmetrical structure are also discussed.

高质量InAs单晶材料的制备及其性质

利用液封直拉法（LEC）生长了直径50mm〈100〉和（111〉晶向的InAs单晶．分析研究了n型杂质Sn，S和p型杂质Zn，Mn的分凝特性、晶格硬化作用、掺杂效率等．利用X射线双晶衍射分析了晶体的完整性．对InAs晶片的抛光、化学腐蚀和清洗进行了分析，在此基础上实现了抛光晶片的开盒即用（EPI—READY）．

InAs/GaAs透镜形量子点超晶格材料的纵向和横向周期对应变场分布的影响

对量子点超晶格材料中量子点纵向周期和同层量子点的横向周期间距对量子点及其周围应变场分布的影响进行了系统的研究.结果表明，横向和纵向周期通过衬底材料之间的长程相互作用对量子点沿中心轴路径应变分布的影响效果正好相反，在适当条件下，两者对量子点应变场分布的影响可以部分抵消.同时也论证了在单层量子点和超晶格量子点材料中，计算量子点的电子结构时，应综合考虑量子点空间周期分布对载流子限制势的影响，不能简单的利用孤立量子点模型来代替.

1.3μm InGaAs/InAs/GaAs Self-Assembled Quantum Dot Laser Diode Grown by Molecular Beam Epitaxy

The growth of multi-layer InGaAs/InAs/GaAs self-assembled quantum dots （QDs） by molecular beam epitaxy （MBE） is investigated,and a QD laser diode lasing at 1.33μm in continuous operation mode at room temperature is reported. The full width at half maximum of the band edge emitting peaks of the photoluminescence （PL） spectra at room temperature is less than 35meV for most of the multi-layer QD samples,revealing good,reproducible MBE growth conditions. Moreover,atomic force microscopy images show that the QD surface density can be controlled in the range from 1×10^10 to 7 ×10^10 cm^-2 . The best PL properties are obtained at a QD surface density of about 4×10^10cm^-2. Edge emitting lasers containing 3 and 5 stacked QD layers as the active layer lasing at room temperature in continuous wave operation mode are reported.

InAs Wires on InP （001）

The heterostructure of InAs/In0.52Al0.48As/InP is unique in that InAs wires instead of dots self-assemble in molecular beam epitaxy. These InAs wires have some distinctive features in their growth and structure. This paper summarizes the investigations of the growth and structural properties of InAs wires that have been performed in our laboratory recently.