GaAs基GaSb体材料及InAs/GaSb超晶格材料的MBE生长

采用分子束外延方法在GaAs(100)衬底上生长GaSb体材料,以此GaSb为缓冲层生长了不同InAs厚度的InAs/GaSb超晶格,其10K光致发光谱峰值波长在2.0～2.6 μm.高分辨透射电子显微镜观察证实超晶格界面清晰,周期完整.

InAs单层和亚单层结构中的自旋动力学研究

利用偏振时间分辨光谱和时间分辨Kerr旋转谱,研究了(GaAs中的InAs单层和亚单层的电子自旋动力学.实验发现,在非共振激发条件下,厚度为l/3单层的InAs山亚单层中电子自旋弛豫寿命长达3.4 ns,而1个单层厚的InAs层的电子自旋寿命只有0.48 ns;而在共振激发条件下,亚单层结构中的电子自旋寿命大大减少,只有70ps,单层hLAs中电子自旋寿命没有显著变化.分析表明,低温下InAa单层和亚单层结构中,Bir-Aronov-Pikus(BAP)自旋弛豫机理占主导地位.通过改变材料结构特性和激发条件来改变电子空穴的空间相关性,从而达到控制自旋弛豫的目的.

GaAs基上的InAs量子环制备

在分子束外延系统中,利用3 nm GaAs薄盖层将InAs自组装量子点部分覆盖,然后在500℃以及As_2气氛中退火一分钟,制成纳米尺度的InAs量子环.这一形成敏感地依赖于退火时的生长条件和生长InAs自组装量子点时的淀积量.InAs在GaAs表面的扩散以及同时发生的In-Ga互混控制着InAs量子环的形成.

Room temperature continuous wave operation of 1.33-micron InAs/GaAs quantum dot laser with high output power

Continuous wave operation of a semiconductor laser diode based on five stacks of InAs quantum dots (QDs) embedded within strained InGaAs quantum wells as an active region is demonstrated. At room temperature, 355-mW output power at ground state of 1.33-1.35 microns for a 20-micron ridge-waveguide laser without facet coating is achieved. By optimizing the molecular beam epitaxy (MBE) growth conditions, the QD density per layer is raised to 4*10^(10) cm^(-2). The laser keeps lasing at ground state until the temperature reaches 65 Celsius degree.

不同淀积厚度InAs量子点的喇曼散射

利用喇曼散射方法在77K温度下对不同淀积厚度的InAs/GaAs量子点材料进行了研究.在高于InAs体材料LO模的频率范围内观察到了量子点的喇曼特征峰,分析表明应变效应是影响QD声子频率的主要因素.实验显示,随着量子点层淀积厚度L的增加,InAs量子点的声子频率由于应变释放发生红移.在加入InAlAs应变缓冲层的样品中,类AlAs声子峰随L增大发生了蓝移,从侧面证实了InAs量子点层的应变释放过程.

Fabrication of an AlAs/In0.53Ga0.47As/InAs Resonant Tunneling Diode on InP Substrate for High-Speed Circuit Applications

A high performance AlAs/In0.53 Ga0.47 As/InAs resonant tunneling diode （RTD） on InP substrate is fabricated by inductively coupled plasma etching. This RTD has a peak-to-valley current ratio （PVCR） of 7. 57 and a peak current density Jp = 39.08kA/cm^2 under forward bias at room temperature. Under reverse bias, the corresponding values are 7.93 and 34.56kA/cm^2 . A resistive cutoff frequency of 18.75GHz is obtained with the effect of a parasitic probe pad and wire. The slightly asymmetrical current-voltage characteristics with a nominally symmetrical structure are also discussed.

高质量InAs单晶材料的制备及其性质

利用液封直拉法（LEC）生长了直径50mm〈100〉和（111〉晶向的InAs单晶．分析研究了n型杂质Sn，S和p型杂质Zn，Mn的分凝特性、晶格硬化作用、掺杂效率等．利用X射线双晶衍射分析了晶体的完整性．对InAs晶片的抛光、化学腐蚀和清洗进行了分析，在此基础上实现了抛光晶片的开盒即用（EPI—READY）．

InAs/GaAs透镜形量子点超晶格材料的纵向和横向周期对应变场分布的影响

对量子点超晶格材料中量子点纵向周期和同层量子点的横向周期间距对量子点及其周围应变场分布的影响进行了系统的研究.结果表明，横向和纵向周期通过衬底材料之间的长程相互作用对量子点沿中心轴路径应变分布的影响效果正好相反，在适当条件下，两者对量子点应变场分布的影响可以部分抵消.同时也论证了在单层量子点和超晶格量子点材料中，计算量子点的电子结构时，应综合考虑量子点空间周期分布对载流子限制势的影响，不能简单的利用孤立量子点模型来代替.

1.3μm InGaAs/InAs/GaAs Self-Assembled Quantum Dot Laser Diode Grown by Molecular Beam Epitaxy

The growth of multi-layer InGaAs/InAs/GaAs self-assembled quantum dots （QDs） by molecular beam epitaxy （MBE） is investigated,and a QD laser diode lasing at 1.33μm in continuous operation mode at room temperature is reported. The full width at half maximum of the band edge emitting peaks of the photoluminescence （PL） spectra at room temperature is less than 35meV for most of the multi-layer QD samples,revealing good,reproducible MBE growth conditions. Moreover,atomic force microscopy images show that the QD surface density can be controlled in the range from 1×10^10 to 7 ×10^10 cm^-2 . The best PL properties are obtained at a QD surface density of about 4×10^10cm^-2. Edge emitting lasers containing 3 and 5 stacked QD layers as the active layer lasing at room temperature in continuous wave operation mode are reported.

InAs Wires on InP （001）

The heterostructure of InAs/In0.52Al0.48As/InP is unique in that InAs wires instead of dots self-assemble in molecular beam epitaxy. These InAs wires have some distinctive features in their growth and structure. This paper summarizes the investigations of the growth and structural properties of InAs wires that have been performed in our laboratory recently.

Growth of Space Ordered on GaAs（100） Vicinal 1.3μm InAs Quantum Dots Substrates by MOCVD

Space ordered 1.3μm self-assembled InAs QDs are grown on GaAs（100） vicinal substrates by MOCVD. Photoluminescence measurements show that the dots on vicinal substrates have a much higher PL intensity and a narrower FWHM than those of dots on exact substrates, which indicates better material quality. To obtain 1.3μm emissions of InAs QDs, the role of the so called InGaAs strain cap layer （SCL） and the strain buffer layer （SBL） in the strain relaxation process in quantum dots is studied. While the use of SBL results only in a small change of emission wavelength,SCL can extend the QD＇s emission over 1.3μm due to the effective strain reducing effect of SCL.

多层InAs量子点的光致发光研究

采用MBE设备生长了多层InAs／GaAs量子点结构，测量了其变温光致发光谱和时间分辨光致发光谱。结果表明多层量子点结构有利于减小发光峰的半高宽，并且可以提高发光峰半高宽和发光寿命的温度稳定性。实验发现，加InGaAs盖层后，量子点发光峰的半高宽进一步减小，最小达到23．6meV，并且发光峰出现红移。原因可能在于InGaAS盖层减小了InAs岛所受的应力，阻止了In组分的偏析，提高了InAs量子点尺寸分布的均匀性和质量，导致载流子在不同量子点中的迁移效应减弱。

超品格覆盖层对拓展InAs量子点发光波长的影响

提出了一种调节InAs量子点长波长发光的方法．采用分子束外延生长GaAs／InAs短周期超晶格作覆盖层，可以拓展量子点发光波长至1．3μm～1．5μm．研究了不同超晶格周期作覆盖层对InAs量子点的晶体结构和光学特性的影响

垂直耦合自组织InAs双量子点中激子能的计算

在有效质量近似条件下研究了垂直耦合的自组织InAs/GaAs量子点的激子态.在绝热近似条件下,采用传递矩阵方法计算了电子和空穴的能谱.通过哈密顿量矩阵的对角化,对电子和空穴间的库仑相互作用进行了精确处理.讨论了两量子点间的垂直距离对激子基态能的影响.从基态波函数概率分布的角度,讨论了激子的束缚能.计算了重空穴和轻空穴激子的基态能随外部垂直磁场变化的函数关系.计算了量子点大小(量子点半径)对激子能的影响.

大尺寸InAs/GaAs量子点的静压光谱

在低温15K和0～9GPa范围内对厚度为7.3nm、横向尺寸为78nm的自组织InAs/GaAs量子点进行了压力光谱研究.观测到大量子点的基态与第一激发态发光峰,其压力系数只有69和72meV/GPa,比小量子点的压力系数更小.基于非线性弹性理论的分析表明失配应变与弹性系数随压力的变化是大量子点压力系数小的主要原因之一.压力实验结果还表明大量子点的第一激发态发光峰来源于电子的第一激发态到空穴的第一激发态的跃迁.