994 resultados para Soi


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设计和制作了多模干涉马赫曾德型热光调制器.通过合理选择SOI光波导的埋层和包层的厚度,使制作出的调制器有良好的综合性能.调制器调制深度为91%,功耗为0.35W,调制速度约为27μs.减小多模干涉耦合器的设计误差和提高刻蚀均匀性可以改善调制器的性能.

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A silicon-on-insulator based channel-shifted multimode interference coupler is designed and fabricated. A two dimensional beam propagation method is used to analyze the dependence of coupler′s performances on the width and length of the multimode waveguide. The device fabricated has a power shift ratio of 73 and an excess loss of about 2.2 dB. An enhancement of fabrication accuracies could further improve the coupler performances.

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近年来,随着SOI技术的快速发展,SOI集成电路的ESD保护已成为一个主要的可靠性设计问题.介绍了SOI ESD保护器件方面的最新进展,阐述了在SOI ESD保护器件设计和优化中出现的新问题,并进行了详细的讨论.

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SOI CMOS模拟集成电路(IC)中存在的关键问题--浮体效应--及其影响出发,介绍了在解决浮体效应以后,已实现的有代表性的模拟集成电路的发展状况.特别指出了SOICMOS在实现RF电路及SOC芯片中的优点.

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Silicon-on-insulator (SOI) technology offers tremendous potential for integration of optoelectronic functionson a silicon wafer. In this letter, a 1 * 1 multimode interference (MMI) Mach-Zender interferometer(MZI) thermo-optic modulator fabricated by wet-etching method is demonstrated. The modulator has anextinction ratio of -11.0 dB, extra loss of -4.9 dB and power consumption of 420 mW. The response timeis less than 30μs.

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SOI(Silicon-on-Insulator)光电子集成已成为十分引人注目的研究课题,其工艺与CMOS工艺完全兼容,可以实现低成本的SOI基整片集成光电子回路。本文综述了近几年来SOI集成光电子器件的发展以及一些最新的研究进展,着重分析几种最新型光无源器件的工作原理和结构,包括SOI光波导、SOI光波导耦合器、SOI光波导开关、相位阵列波导光栅(PAWG)、基于SOI的光探测器等,并介绍了中国科学院半导体所集成光电子国家重点实验室的研究进展。

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异质外延法是目前制备新型SOI材料的技术途径之一。采用低压化学气相沉积技术(LPCVD)在硅衬底上先外延r-A1-2O-3绝缘单晶薄膜,制备出硅衬底上外延氧化物外延结构r-Al-2O-3/Si(EOS),然后采用类似SOS薄膜生长的常压CVD(APCVD)方法在EOS上外延硅单晶薄膜,形成新型硅基双异质SOl材料Si/r-Al-2O-3/Si。利用反射高能电子衍射(RHEED)、X射线衍射(XRD)、俄歇电子能谱(AES)及MOS电学测量等技术表征分析了Si(100)/r-Al-2O-3(100)/Si(100)SOI异质结构的晶体结构、组分和电学性能。测试结果表明,已成功实现了高质量的新型双异质外延SOI结构材料Si(100)/ r-Al-2O-3(100)/Si(100),r-Al-2O-3与Si外延薄膜均为单晶,r-Al-2O-3薄膜具有良好绝缘性能,SOI结构界面清晰陡峭,该SOI材料可应用于CMOS电路的研制。

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分析了SOI(silicon-on-insulator)2×2电光开关工作时热光效应对等离子色散效应的影响。采用二维半导器件模拟器PISCES-Ⅱ对器件进行模块。结果表明,热光效应对等离子色散效应的影响与调制区长度密切相关,当调制区长度较短时,热光效应的影响不容忽视;当调制区长度大于500μm时,这种影响可以忽略不计

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对全耗尽CMOS/SOI工艺进行了研究,成功地开发出成套全耗尽CMOS/SOI抗辐照工艺,其关键工艺技术包括:氮化H2-O2合成薄栅氧、双栅和注Ge硅化物等技术,经过工艺设计,获得性能良好的抗辐照CMOS/SOI器件和电路(包括101级环振、2000门门海阵列等)其中,nMOS:Vt=0.7V,Vds=4.5-5.2V,μeff=465cm^2/(V·S),PMOS:Vt=-0.8V,Vds=-5~-6.3V,μeff=264cm^2/(V·S),当工作电压为5V时,0.8μm环振单级延迟为45ps。

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The temperature dependence of characteristics for multimode interference (MMI) based 3-dB coupler in silicon-on-insulator is analyzed, which originates from the relatively high thermo-optic coefficient of silicon. For restricted interference 3-dB MMI coupler, the output power uniformity is ideally 0 at room temperature and becomes 0. 32 dB when temperature rises up to 550 K. For symmetric interference 3-dB MMI coupler, the power uniformity keeps ideally 0 due to its intrinsic symmetric interference mechanism. With the temperature rising, the excess loss of the both devices increases. The performance deterioration due to temperature variety is more obvious to restricted interference MMI 3-dB coupler, comparing with that of symmetric interference MMI 3-dB coupler.

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利用MOCVD(metalorganic chemical vapor deposition)和APCVD(atmosphere chemical vapor deposition)硅外延技术在Si(100)衬底上成功地制备了双异质Si/γ-Al_2O_3/Si SOI材料。利用反射式高能电子衍射(RHEED)、X射线衍射(XRD)及俄歇能谱(AES)对材料进行了表征。测试结果表明,外延生长的γ-Al_2O_3和Si薄膜都是单晶薄膜,其结晶取向为(100)方向,外延层中Al与O化学配比为2:3。同时,γ-Al_2O_3外延层具有良好的绝缘性能,其介电常数为8.3,击穿场强为2.5MV/cm。AES的结果表明,Si/γ-Al_2O_3/Si双异质外延SOI材料两个异质界面陡峭清晰。

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提出了一种新的紧缩型SOI多模干涉(MMI)光开关。开关由单模输入输出波导和MMI耦合器组成。通过在多模波导区域引入调制区,利用Si的等离子色散效应(PDE)改变调制区的折射率来实现开关动作。用FD-BPM方法对开关的工作原理和性能进行了模拟与分析。结果表明,光开尖良好的综合性能,而整个开关的长度只有7mm。

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SOI waveguides fabricated by wet-etching method are demonstrated. The single mode waveguide and 1×2 3dB BBI splitter are analyzed and designed by three dimensional beam propagation method to correct the error of effective index method and guided mode method. The devices are fabricated. Excellent performances, such as low propagation loss of -1.37dB/cm, low excess of -2.2dB, and good uniformity of 0.3dB, are achieved.

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在超紧缩双曲锥形3 dB多模干涉耦合器的基础上,设计了一种新的Silicon-on-insulator (SOI) Mach-Zehnder干涉型电光调制器。与传统的Y分支器相比,双曲锥形3 dB耦合器的制作容差大,而长度缩短了近30%,使得整个器件的尺寸大幅减小。调制区采用横向注入的PIN结构,模拟结果表明

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采用有效折射率和转移矩阵理论相结合的方法得到了SOI梯形光波导的本征模方程。计算得到的有效折射率与WKB法相比误差不超过10~(-5),其垂直方向电场分布与BPM模拟结果基本相符。首次得到了SOI梯形波导的单模曲线和其近似解析表达式,此结果与修正的WKB法一致。