939 resultados para RICH SIO2
Resumo:
Silica spheres doped with Eu(TTFA)(3) and/or Sm(TTFA)(3) were synthesized by using the modified Stober method. The transmission electron microscope image reveals that the hybrid spheres have smooth surfaces and an average diameter of about 210 nm. Fluorescence spectrometer was used to analyze the fluorescence properties of hybrid spheres. The results show that multiple energy transfer processes are simultaneously achieved in the same samples co-doped with Eu (TTFA)(3) and Sm(TTFA)(3), namely between the ligand and Eu3+ ion, the ligand and Sm3+ ion, and Sm3+ ion and Eu3+, ion. Energy transfer of Sm3+-> Eu3+, in the hybrid spheres leads to fluorescence enhancement of Eu3+ emission by approximately an order of magnitude. The lifetimes of the hybrid spheres were also measured.
Resumo:
我国江西龙南稀土矿是目前世界上储量最大的富钇稀土矿、研制具有多种用途的钇(Y)-铝(Al)或富钇混合稀土(Ymm)-铝中间合金,对于开拓我国龙南稀土矿的应用领域扩大稀土合金出口具有重要意义。基于这一背景并针对目前氟化物体系制取Ymm-Al合金时存在着电解温度高,腐蚀现象严重,电效偏低等缺点,本文系统开展了在氯化物熔盐体系中电解制取Ymm-Al合金的研究工作。本工作由三部分组成:在第一部分工作中,开展了熔盐电解所需要基本原料-无水稀土氯化物制取的工艺研究。利用化学分析和结构分析手段,弄清了干法氯化过程中YmmCl_3水解的机理,提出了减弱水解的措施,即YmmCl_3先在850-900 ℃灼烧1.5 + 0.2hr,脱掉吸附水并将碱式碳酸盐转化为氧化物,增加稀土氧化物的比表面。通过条件试验得到最佳工艺条件为:采用NH_4 Cl:Ymm_2 O_3 = 14:1(摩尔比)的配料比,每次投入氯化装置的原料量为0.26 - 0.36 kg, 在400-450 ℃氯化反应激烈开始后迅速降温至400 ℃以下,待物料粘结现象消失后,再行升温氯化。出料及后期控制温在475 ± 25 ℃。经过3.8 ± 0.2hr氯化,可制得水不溶物小于1%并符合熔盐电解要求的YmmCl_3原料。此新工艺与原有干法工艺相比,流程短,装置简单,不需密闭抽真空,成本低,适于制取任何量的优质熔盐电解所需氯化稀土原料。在第二部分工作中,利用上述YmmCl_3原料,以液态铝为阴极,在氯化物体系中进行熔盐电解,通过试验得出在小型试验规模制取Ymm-Al合金的最隹工艺条件为:电解质组成(重量比)40%YmmCl_3-1%NaF-59%等摩尔的NaCl-KCl;电解温度为790 ± 5 ℃;阴极电流密为0.7 - 0.02A/cm~2;电解电量为333 ± 5库仑/克铝,制得钇铝合金中Ymm含量为10 ± 2%。添加1%的NaF可消除阴极表面生成枝状物,减少合金中夹渣和熔盐中沉渣。在电解工作中,将方差分析应用于试验数据处理,方差分析结果表明,各种试验因素对电效有明显影响,试验数据可靠,试验误差在允许范围以内。在第三部分工作中,利用线性扫描伏安法测定了在最隹电解工艺条件下Y~(3+)和Ymm在液态铝及钼电极上的析出电位。测定结果表明:Y~(3+)和Ymm~(3+)在液态铝阴极上的析出电位比在钼阴极上偏正0.2 ~ 0.8伏,氟离子的加入要比不加氟时析出电位不有同程度的负移,但考虑到氟离了具有消渣作用,加入少量氟比物添加剂对提高电效有利。
Resumo:
The interaction of Co with Si and SiO2 during rapid thermal annealing has been investigated. Phase sequence, layer morphology, and reaction kinetics were studied by sheet resistance, x-ray diffraction, Auger electron spectroscopy, x-ray photoelectron spectroscopy, and scanning electron microscopy. With increasing annealing temperature, Co film on Si(100) is transformed sequentially into Co2Si, CoSi, and finally CoSi2 which corresponds to the minimum of sheet resistance. No evidence of silicide formation was observed for Co/SiO2 annealed even at the high temperature of 1050-degrees-C.