Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast

We present a method of image-speckle contrast for the nonprecalibration measurement of the root-mean-square roughness and the lateral-correlation length of random surfaces with Gaussian correlation. We use the simplified model of the speckle fields produced by the weak scattering object in the theoretical analysis. The explicit mathematical relation shows that the saturation value of the image-speckle contrast at a large aperture radius determines the roughness, while the variation of the contrast with the aperture radius determines the lateral-correlation length. In the experimental performance, we specially fabricate the random surface samples with Gaussian correlation. The square of the image-speckle contrast is measured versus the radius of the aperture in the 4f system, and the roughness and the lateral-correlation length are extracted by fitting the theoretical result to the experimental data. Comparison of the measurement with that by an atomic force microscope shows our method has a satisfying accuracy. (C) 2002 Optical Society of America.

Crystals that count! Physical principles and experimental investigations of DNA tile self-assembly

Algorithmic DNA tiles systems are fascinating. From a theoretical perspective, they can result in simple systems that assemble themselves into beautiful, complex structures through fundamental interactions and logical rules. As an experimental technique, they provide a promising method for programmably assembling complex, precise crystals that can grow to considerable size while retaining nanoscale resolution. In the journey from theoretical abstractions to experimental demonstrations, however, lie numerous challenges and complications.

In this thesis, to examine these challenges, we consider the physical principles behind DNA tile self-assembly. We survey recent progress in experimental algorithmic self-assembly, and explain the simple physical models behind this progress. Using direct observation of individual tile attachments and detachments with an atomic force microscope, we test some of the fundamental assumptions of the widely-used kinetic Tile Assembly Model, obtaining results that fit the model to within error. We then depart from the simplest form of that model, examining the effects of DNA sticky end sequence energetics on tile system behavior. We develop theoretical models, sequence assignment algorithms, and a software package, StickyDesign, for sticky end sequence design.

As a demonstration of a specific tile system, we design a binary counting ribbon that can accurately count from a programmable starting value and stop growing after overflowing, resulting in a single system that can construct ribbons of precise and programmable length. In the process of designing the system, we explain numerous considerations that provide insight into more general tile system design, particularly with regards to tile concentrations, facet nucleation, the construction of finite assemblies, and design beyond the abstract Tile Assembly Model.

Finally, we present our crystals that count: experimental results with our binary counting system that represent a significant improvement in the accuracy of experimental algorithmic self-assembly, including crystals that count perfectly with 5 bits from 0 to 31. We show some preliminary experimental results on the construction of our capping system to stop growth after counters overflow, and offer some speculation on potential future directions of the field.

Influência de agentes clareadores na rugosidade de compósitos dentários

O clareamento dental é o meio disponível mais simples, comum e conservador para o cirurgião-dentista proporcionar aos pacientes o padrão de cor de seus dentes mais desejado. Em alguns casos, os dentes que vão ser clareados podem apresentar restaurações realizadas com compósitos dentais, que são mais suscetíveis a alterações químicas, quando comparados a outros materiais restauradores. Alguns estudos mostraram que diferentes concentrações de agentes clareadores levaram a um aumento significativo da rugosidade superficial e das porosidades em compósitos dentais. Este estudo avaliou o efeito de dois agentes clareadores (Whiteness HP Blue 20%, Whiteness HP Max) sobre a rugosidade superficial de dois compósitos dentais, um micro-híbrido (Esthet X, Denstply) e outro nanoparticulado (Z 350, 3M ESPE). Um total de oito corpos de prova (9 x 2 mm) foram confeccionados com auxílio de uma matriz de teflon, sendo divididos em 4 grupos (Esthet X + Whiteness HP Blue 20%; Esthet X + Whiteness HP Max; Z 350 + Whiteness HP Blue 20%; Z 350 + Whiteness HP Max), sendo n=2. Os corpos de prova foram armazenados em saliva artificial neutra e, após 24 horas, foram polidos com discos de óxido de Alumínio (Sof-lex, 3M ESPE). Após sete dias de imersão salivar, cada corpo de prova foi levado a um microscópio de força atômica para obtenção do valor inicial de rugosidade superficial (Ra em nm). Em seguida, sem remover o corpo de prova do microscópio, o agente clareador foi aplicado sobre a superfície do corpo de prova, segundo as instruções do fabricante, de modo que permitisse uma posterior observação da mesma área do corpo de prova observada inicialmente, para obtenção do valor final de rugosidade superficial. Imagens em duas e três dimensões foram obtidas de cada corpo de prova para observação de alterações da topografia. Os resultados foram tratados estatisticamente por ANOVA e pelo teste de contraste Student-Newman-Keuls (p < 0,05). Não houve alteração significativa na rugosidade superficial (Ra) dos corpos da prova de compósitos micro-híbrido e nanoparticulado, submetidos aos agentes clareadores Whiteness HP Blue 20% e Whiteness HP Maxx. No entanto, independente do agente clareador utilizado, foram observadas maiores alterações topográficas nas imagens de microscopia de força atômica da superfície do compósito micro-híbrido do que nas imagens do nanoparticulado.

掺铒磷酸盐玻璃离子交换波导表面保护的研究

对离子交换波导制备过程中掺铒磷酸盐玻璃表面的侵蚀问题进行了研究，分析了产生侵蚀的原因，提出镀K9玻璃薄膜的方法，对掺铒磷酸盐玻璃表面进行保护．采用光学显微镜和原子力显微镜对波导表面特性进行了表征。同时对平板波导的光学特性进行了测试．研究表明K9玻璃薄膜不仅能够对掺铒磷酸盐玻璃起到保护作用，同时允许交换离子透过进入磷酸盐玻璃形成波导层．

针尖扫描原子力显微镜的光点跟踪设计

提出了一种用于针尖扫描原子力显微镜（AFM）的光点跟踪设计方案，结构简单，容易实现。设计方案对扫描器的负载能力要求不高，而且能使原子力显微镜实现较大范围的针尖扫描。实验结果表明，采用此光点跟踪设计方案的针尖扫描原子力显微镜能实现最大100μm×100μm范围的扫描，z方向上的误差最大1nm，能很好地满足大样品扫描的需要。

A feasible approach to optical-electrical hybrid data storage using phase change material

We present our experimental results supporting optical-electrical hybrid data storage by optical recording and electrical reading using Ge2Sb2Te5as recording medium. The sheet resistance of laser- irradiated Ge2Sb2Te5. lms exhibits an abrupt change of four orders of magnitude ( from 10 7 to 10 3./ sq) with increasing laser power, current- voltage curves of the amorphous area and the laser- crystallized dots, measured by a conductive atomic force microscope ( C- AFM), show that their resistivities are 2.725 and 3.375 x 10- 3., respectively, the surface current distribution in the. lms also shows high and low resistance states. All these results suggest that the laser- recorded bit can be read electrically by measuring the change of electrical resistivity, thus making optical electrical hybrid data storage possible.

A large-area photolithography technique based on surface plasmons leakage modes

An atomic force microscope (AFM) assisted surface plasmons leakage radiation photolithography technique has been numerically demonstrated by using two-dimensional finite-difference time-domain (2D-FDTD) method. With the aid of a metallic AFM tip, particular characteristic of the Kretstchmann configuration to excite surface plasmons (SPs) is utilized to achieve large-area patterns with high spatial resolution and contrast, the photoresist could be exposed with low power laser due to the remarkable local field enhancement at the metal/dielectric interface and the resonant localized SPs modes near the tip. Good tolerance on the film thickness and incident angle has been obtained, which provides a good practicability for experiments. This photolithography technique proposed here can realize large-area, high-resolution, high-contrast, nondestructive, arbitrary-structure fabrication of nanoscale devices. (c) 2007 Elsevier B.V. All rights reserved.

Structural change of laser-irradiated Ge2Sb2Te5 films studied by electrical property measurement

Sheet resistance of laser-irradiated Ge2Sb2Te5 thin films prepared by magnetron sputtering was measured by the four-point probe method. With increasing laser power the sheet resistance undergoes an abrupt drop from 10(7) to 10(3) Omega/square at about 580 mW. The abrupt drop in resistance is due to the structural change from amorphous to crystalline state as revealed by X-ray diffraction (XRD) study of the samples around the abrupt change point. Crystallized dots were also formed in the amorphous Ge2Sb2Te5 films by focused short pulse laser-irradiated, the resistivities at the crystallized dots and the non-crystallized area are 3.375 x 10(-3) and 2.725 Omega m, sheet resistance is 3.37 x 10(4) and 2.725 x 10(7) Omega/square respectively, deduced from the I-V Curves that is obtained by conductive atomic force microscope (C-AFM). (C) 2008 Elsevier B.V. All rights reserved.

Study on readout durability of super-RENS disk

Characteristics essential for the readout durability of a superresolution near-field structure (super-RENS) disk are studied experimentally by using a home-built optical measuring setup and atomic force microscope, based on a simplified PtOx super-RENS disk. The experimental results show that for a super-RENS disk with constant structure and materials, readout signals including transmittance and reflectance vary with changes in bubble shape and size, indicating that the readout durability of the disk has a strong dependence on bubble stability, which is closely related to the thickness of the cover layer, the recording power and readout power, and the mechanical properties of the dielectric layer. Based on our experimental results, the main direction for improving readout durability is also proposed. (c) 2008 Optical Society of America.

Preparation and characterization of hybrid ZnO/ormosils films

Hybrid ZnO/ormosils Elms are prepared by the sol-gel method. A FT-IR spectrometer, 900 UV/VIS/NIR spectrophotometer, atomic force microscope, and ellipsometer are employed to investigate microstructure and optical properties of the films fired at different temperatures. The results show that the films with high transmittance and low surface roughness could be obtained at the heat-treatment temperature of 150 degrees C, the refractive index and thickness of the film are 1.413, 2.11 mu m, respectively. Higher temperatures (350 degrees C, 550 degrees C) change the Elm microstructure severely, and then decrease the transmittance of the films.

Homoepitaxial growth of ZnO films via low-temperature liquid-phase epitaxy

Homoepitaxial ZnO films have been grown via liquid-phase epitaxy (LPE) on (000 1) oriented ZnO substrates. X-ray rocking curve revealed the high quality of the ZnO films with a FWHM of 40 arc sec. Films of thickness about 20 gm were gown in the temperature range 700-720 degrees C. The growth rate of ZnO films was estimated to be 0.3 mu m h(-1). Atomic force microscope analysis showed that the surface roughness of ZnO films was very low, which further confirmed the high crystallinity of ZnO films. (c) 2006 Elsevier B.V. All rights reserved.

高质量LiGaO2晶体的提拉法生长及表征

采用提拉法成功地生长了高质量的LiGaO2单晶体,生长过程中没有观察到挥发现象。通过四晶X射线衍射、化学腐蚀、光学显微、透过光谱以及原子力显微镜对晶体的质量进行了表征。结果表明：晶体中无包裹物及气泡,具有很高的质量,（001）面晶片的摇摆曲线半高宽仅为16.2arcsec,正交的（001）、（100）及（010）三个晶面具有不同的腐蚀形貌,其位错密度均低于10^4/cm^2;LiGaO2晶体的吸收边约为220nm;化学机械抛光后的晶片表面非常光滑,其均方根粗糙度仅为0.1nm（5×5μm^2）。

不同膜层数的Mo/Si多层膜的表界面粗糙度和软X射线反射率

用磁控溅射法制备了顶层分别是Mo膜层和Si膜层的两个系列的Mo/Si多层膜，它们的周期厚度相同但是膜层数各不相同。Mo/Si多层膜的周期厚度和界面粗糙度由小角X射线衍射（SAXRD）曲线拟和得到。用原子力显微镜测量了Mo/Si多层膜的表面粗糙度。在国家同步辐射实验室测量了Mo/Si多层膜的软X射线反射率。通过理论和试验研究，发现Mo/Si多层膜的软X射线反射率主要由周期数和界面粗糙度决定，表面粗糙度对Mo/Si多层膜的软X射线反射率影响较小。

Mo／Si软X射线多层膜的界面粗糙度研究

用磁控溅射法分别制备了以Mo膜层和Si膜层为顶层的Mo／Si多层膜系列，利用小角X射线衍射确定了各多层膜的周期厚度。以不同周期数的Mo／Si多层膜的新鲜表面近似等同于同一多层膜的内界面，通过原子力显微镜研究了多层膜界面粗糙度随膜层数的变化规律。并在国家同步辐射实验室测量了各多层膜的软X射线反射率。研究表明：随着膜层数的增加，Mo膜层和Si膜层的界面粗糙度先减小后增加然后再减小，多层膜的峰值反射率先增加后减小。

Restauração de imagens de microscopia de força atômica com uso da regularização de Tikhonov via processamento em GPU

A Restauração de Imagens é uma técnica que possui aplicações em várias áreas, por exemplo, medicina, biologia, eletrônica, e outras, onde um dos objetivos da restauração de imagens é melhorar o aspecto final de imagens de amostras que por algum motivo apresentam imperfeições ou borramentos. As imagens obtidas pelo Microscópio de Força Atômica apresentam borramentos causados pela interação de forças entre a ponteira do microscópio e a amostra em estudo. Além disso apresentam ruídos aditivos causados pelo ambiente. Neste trabalho é proposta uma forma de paralelização em GPU de um algoritmo de natureza serial que tem por fim a Restauração de Imagens de Microscopia de Força Atômica baseado na Regularização de Tikhonov.