A Novel Two-Section Co-Cavity Wavelength Tunable Semiconductor Laser

于2010-11-23批量导入

Co-Si多层膜在稳态热退火中的固相界面反应

于2010-11-23批量导入

Co-Si多层膜的透射电镜研究

国家自然科学基金

Si/Co/GaAs体系中界面反应的竞争机制

于2010-11-23批量导入

Co与Si和SiO_2在快速热退火中的反应

于2010-11-23批量导入

Frequency limitation in calibrating microwave test fixtures

The problem of frequency limitation arising in calibration of the test fixtures is investigated in this paper. It is found that at some frequencies periodically, the accuracy of the methods becomes very low, and. the denominators of the expressions of the required S-parameters approach zero. This conclusion can be drawn whether-the test fixtures, are symmetric or not. A good agreement between theory and experiment is obtained.