Frequency limitation in calibrating microwave test fixtures
Data(s) |
2002
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Resumo |
The problem of frequency limitation arising in calibration of the test fixtures is investigated in this paper. It is found that at some frequencies periodically, the accuracy of the methods becomes very low, and. the denominators of the expressions of the required S-parameters approach zero. This conclusion can be drawn whether-the test fixtures, are symmetric or not. A good agreement between theory and experiment is obtained. The problem of frequency limitation arising in calibration of the test fixtures is investigated in this paper. It is found that at some frequencies periodically, the accuracy of the methods becomes very low, and. the denominators of the expressions of the required S-parameters approach zero. This conclusion can be drawn whether-the test fixtures, are symmetric or not. A good agreement between theory and experiment is obtained. 于2010-10-29批量导入 Made available in DSpace on 2010-10-29T06:36:25Z (GMT). No. of bitstreams: 1 2794.pdf: 222344 bytes, checksum: 0f3bad756d86eb1c95427955bdb6540e (MD5) Previous issue date: 2002 Chinese Inst Electr.; IEEE Microwave Theory & Techn Soc.; IEEE Electron Devices Soc.; IEE Antennas & Propagat Soc.; Electr Soc, Inst Electr, Informat & Commun Engineers Japan.; Korea Inst Telemat & Electr.; IEEE Beijing Sect.; IEE Beijing Ctr.; IEEE MTT S Beijing Chapter. CAS, State Key Lab Integrated Optoelect, Inst Semicond, Beijing 100083, Peoples R China Chinese Inst Electr.; IEEE Microwave Theory & Techn Soc.; IEEE Electron Devices Soc.; IEE Antennas & Propagat Soc.; Electr Soc, Inst Electr, Informat & Commun Engineers Japan.; Korea Inst Telemat & Electr.; IEEE Beijing Sect.; IEE Beijing Ctr.; IEEE MTT S Beijing Chapter. |
Identificador | |
Idioma(s) |
英语 |
Publicador |
IEEE 345 E 47TH ST, NEW YORK, NY 10017 USA |
Fonte |
Qian C; Wang YL; Chen ZY; Zhu NH .Frequency limitation in calibrating microwave test fixtures .见:IEEE .2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS,345 E 47TH ST, NEW YORK, NY 10017 USA ,2002,146-149 |
Palavras-Chave | #光电子学 #calibration #microwave network analyzer #scattering-parameter measurement #phase uncertainty #NETWORK-ANALYZER CALIBRATION |
Tipo |
会议论文 |