Scanning electron microscopy study of microstructural evolution of electroless nickel-phosphorus deposits with heat treatment

This paper follows previous X-ray diffraction work on crystallisation and phase transformation of electroless nickel–phosphorus deposits, concentrating on microstructural changes. Amorphous or nanocrystalline coatings, depending on their phosphorus content, were heat treated at temperatures between 100 and 500 °C for 1 h. Changes in microstructure after the heat treatment were examined using high-resolution field emission scanning electron microscope. Crystallisation and grain growth effects are observed, as well as some inherent defect structures in the coatings and their changes. These are compared with the previous X-ray diffraction work and in general, good agreement is observed. The complementary strength and weakness of the different characterisation techniques are discussed.

The tip-sample water bridge and light emission from scanning tunnelling microscopy

The light emission spectrum from a scanning tunnelling microscope (LESTM) is investigated as a function of relative humidity and shown to provide a novel and sensitive means for probing the growth and properties of a water meniscus on the nanometre scale. An empirical model of the light emission process is formulated and applied successfully to replicate the decay in light intensity and spectral changes observed with increasing relative humidity. The modelling indicates a progressive water filling of the tip-sample junction with increasing humidity or, more pertinently, of the volume of the localized surface plasmons responsible for light emission; it also accounts for the effect of asymmetry in structuring of the water molecules with respect to the polarity of the applied bias. This is juxtaposed with the case of a non-polar liquid in the tip-sample nanocavity where no polarity dependence of the light emission is observed. In contrast to the discrete detection of the presence/absence of a water bridge in other scanning probe experiments through measurement of the feedback parameter for instrument control, LESTM offers a means of continuously monitoring the development of the water bridge with sub-nanometre sensitivity. The results are relevant to applications such as dip-pen nanolithography and electrochemical scanning probe microscopy.

Infrared emission from tunneling electrons: The end of the rainbow in scanning tunneling microscopy

Electromagnetic radiation originating with localized surface plasmons in the metal-tip/metal-sample nanocavity of a scanning tunneling microscope is demonstrated to extend to a wavelength lambda of at least 1.7 mu m. Progressive spectral extension beyond lambda similar to 1.0 mu m occurs for increasing tip radius above similar to 15 nm, reaching lambda similar to 1.7 mu m for tip radius similar to 100 nm; these observations are corroborated by use of a simple physical model that relates the discrete plasmon mode frequencies to the tip radius. This spectral extension opens up a new regime for scanning tunneling microscope-based optical spectroscopy.

Fluorescence enhancement and energy transfer in apertureless scanning near-field optical microscopy

We investigate the mechanisms for fluorescence enhancement and energy transfer near a gold tip in apertureless scanning near-field optical microscopy. Using a simple quasi-static model, we show that the observed enhancement of fluorescence results from competition between enhancement and quenching, and is dependent on a range of experimental parameters. We find good qualitative agreement with the results of measurements of the effect of both sharp and blunt tips on quantum dot fluorescence, and provide a demonstration of tip-enhanced fluorescence imaging with 60 nm resolution.

Effect of the surface water layer on the optical signal in apertureless scanning near field optical microscopy

Optical signals measured in apertureless scanning near field optical microscopy (ASNOM) under ambient conditions are found to be affected significantly by the thin water layer absorbed on the surface under investigation, the presence of which is detected through measurements of the shear force experienced by the tip. This water layer also results in a large hysteresis between optical signals measured during approach and withdrawal of the tip to the sample surface. The role of this effect in ASNOM is anticipated to be significant, with the possibility of resultant topographically induced artefacts for ASNOM involving intermittent contact of tip and sample, but also providing a potential mechanism for nanoscale optical resolution.

Toward Quantitative Electrochemical Measurements on the Nanoscale by Scanning Probe Microscopy: Environmental and Current Spreading Effects

The application of electric bias across tip–surface junctions in scanning probe microscopy can readily induce surface and bulk electrochemical processes that can be further detected though changes in surface topography, Faradaic or conductive currents, or electromechanical strain responses. However, the basic factors controlling tip-induced electrochemical processes, including the relationship between applied tip bias and the thermodynamics of local processes, remains largely unexplored. Using the model Li-ion reduction reaction on the surface in Li-ion conducting glass ceramic, we explore the factors controlling Li-metal formation and find surprisingly strong effects of atmosphere and back electrode composition on the process. We find that reaction processes are highly dependent on the nature of the counter electrode and environmental conditions. Using a nondepleting Li counter electrode, Li particles could grow significantly larger and faster than a depleting counter electrode. Significant Li ion depletion leads to the inability for further Li reduction. Time studies suggest that Li diffusion replenishes the vacant sites after 12 h. These studies suggest the feasibility of SPM-based quantitative electrochemical studies under proper environmental controls, extending the concepts of ultramicroelectrodes to the single-digit nanometer scale.