Scanning electron microscopy characterization of aluminized layer formation on Ti alloys

Autoria(s): Romankov, S.E.; Sha, Wei; Kaloshkin, S.D.
Data(s)

01/08/2006
Identificador

http://pure.qub.ac.uk/portal/en/publications/scanning-electron-microscopy-characterization-of-aluminized-layer-formation-on-ti-alloys(fa387821-2cb9-4af7-b6cf-810abba8229d).html
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Romankov , S E , Sha , W & Kaloshkin , S D 2006 , ' Scanning electron microscopy characterization of aluminized layer formation on Ti alloys ' Microscopy and Microanalysis , vol 12 (Supplement S2) , no. SUPPL. 2 , pp. 1058-1059 .
Palavras-Chave #/dk/atira/pure/subjectarea/asjc/3100/3105 #Instrumentation
Tipo

article
Acesso ao item digital