Biblioteca Digital

37 resultados para CMOS integrated circuits

Characterization of hot-carriers induced degradation in mosfets through gate capacitances measurement at room and cryogenic temperatures

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Characterization of hot-carrier induced degradation via small-signal characteristics in mosfets

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SWASAD Smith & Waterman-algorithm-specific ASIC design

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An FPGA architecture for improved arithmetic performance

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Silicon-on-sapphire MOSFET parameter extraction by small-signal measurement

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Development of electronic instrument for defect measurements with eddy currents

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Proceedings of SPIE: Electronics and Structures for MEMS II

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