Characterization of hot-carrier induced degradation via small-signal characteristics in mosfets

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Autoria(s): Lau, Mei Po Mabel

Data(s)	01/01/2002
Identificador	http://espace.library.uq.edu.au/view/UQ:105868/THE16462.pdf http://espace.library.uq.edu.au/view/UQ:105868
Idioma(s)	eng
Publicador	The University of Queensland, School of Computer Science and Electrical Engineering
Palavras-Chave	#Metal oxide semiconductor field-effect transistors #L #290902 Integrated Circuits #671201 Integrated circuits and devices
Tipo	Thesis