Silicon-on-sapphire MOSFET parameter extraction by small-signal measurement


Autoria(s): Kong, Frederick.
Data(s)

01/01/2003

Identificador

http://espace.library.uq.edu.au/view/UQ:106311/THE17051.pdf

http://espace.library.uq.edu.au/view/UQ:106311

Idioma(s)

eng

Publicador

The University of Queensland, School of Information Technology and Electrical Engineering

Palavras-Chave #Metal oxide semiconductor field-effect transistors #L #290902 Integrated Circuits #671201 Integrated circuits and devices
Tipo

Thesis