641 resultados para SIO2
Resumo:
A SiGe/Si multi-quantum wells resonant-cavity-enhanced(RCE) detector with high reflectivity bottom mirror is fabricated by a new method.The bottom mirror is deposited in the hole,which is etched from the backside of the sample by ethylenediamine-pyrocatechol-water(EPW) solution with the buried SiO2 layer in SOI substrate as the etching-stop layer.Reflectivity spectrum indicates that the mirror deposited in the hole has a reflectivity as high as 99% in the range of 1.2~1.5μm.The peak responsivity of the RCE detector at 1.344μm is 1.2mA/W and the full width at half maximum is 12nm.Compared with the conventional p-i-n photodetector,the responsivity of RCE detector is enhanced 8 times.
Resumo:
采用有限差分法对GaN基多量子阱(MQWs)脊形激光器进行二维光场模拟.InGaN和AlGaN材料的折射率分别由修正的Brunner以及Bergmann方法得到.分析了激光器单模特性和远场发散角同器件的脊形刻蚀深度和脊形条宽的关系.研究了在脊形上用Si/SiO2膜取代传统SiO2介质膜这种新的脊形设计对激光器结构参数的影响.模拟结果发现,脊形条宽越窄,脊形刻蚀深度越深,平行结平面方向的发散角越大,但由此会引起单模特性不稳定,两者之间有一个折衷值.通过引入新的脊形设计,可以降低对器件刻蚀深度精度的要求,同时有很好的单模稳定性.
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采用有机改性硅酸盐制备了光敏性溶胶-凝胶,并应用四丙氧基锆作为调节折射率的材料.为了增加薄膜与硅片的粘附作用,先用干氧热氧化法在硅片上生长一层厚度约为150nm的SiO2,然后使用提拉法在硅片上提拉成膜,薄膜厚度达到3.6μm.研究发现紫外曝光时间和坚膜时的后烘温度都会使薄膜的折射率增大.样品的原子力显微镜照片表明薄膜的表面非常平整,在5μm×5μm的范围内表面起伏只有0.657nm.利用波导阵列掩膜版,对制备的薄膜在紫外光波段下曝光,得到了表面平坦、侧墙光滑、陡直的沟道波导阵列.
Resumo:
Si基高效发光与受激光发射是Si基光子学突破性发展的关键课题,它的实现对Si基微电子学的发展有深远的重大意义.由于受到天然Si材料间接带能带结构的限制,Si材料的发光效率极低,更谈不上可实现受激光发射,人工改性就成为当代研究、开拓的主要途径.新的Si基直接带体材料(如β-FeSi2等)的探索,Ge/Si量子阱、超晶格、量子点的能带工程介观改性,子带发光跃迁的探索,异类元素插入短周期超晶格中的化学键改性,以及SiO2高浓度nc-Si的生成和高激活度稀土离子的掺入发光等已开展了多途径的研究,不同程度上取得了重要的进展,一种MIS结构电子隧道注入高效发光器件已在SiO2:RE MOS结构中实现.运用激光器件物理的深入设计和新的器件技术的引入,可以预计本世纪初叶,对实现Si基激光器的奢望将会成为现实,无疑它对Si基光子学、Si基集成光电子学乃至信息高科技的发展将作出历史性的巨大贡献.
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采用全矢量交替方向隐含迭代方法系统分析了高折射率SiON薄膜对Si基SiO2阵列波导光栅中波导应力双折射的影响.分析结果表明在芯区上或下表面沉积SiON薄膜可以明显减小Si基SiO2阵列波导光栅(AWG)中波导的应力双折射,但这两种补偿方法容易使模场偏移中心位置,不利于波导与光纤的耦合.理想的补偿方法是在芯区上下同时补偿,可减小模场偏移,并用该方法设计了偏振无关的16通道AWG.
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用火焰水解和高温烧结的方法在单晶硅基片上制备了厚SiO2和B2O3-P2O5-SiO2光波导包层材料.并用扫描电镜(SEM)和X射线粉末衍射(XRD)方法对其微观形貌和物相结构进行了观察和检测.重点对硅基片上沉积厚SiO2时的龟裂和析晶问题进行了深入研究.从扫描电镜照片可以看出,火焰水解法形成的SiO2粉末呈多孔的蜂窝状结构.这种粉末具有很高的比表面积,因而很容易烧结成玻璃.X射线衍射图谱表明,这种粉末是完全非晶态的.经过烧结以后,从扫描电镜照片可以明显看出硅基片上的SiO2薄膜出现龟裂.同时,X射线衍射测试结果表明有少量SiO2析晶.而通过在SiO2中掺入B2O3、P2O5,上述龟裂和析晶完全消失.用这种工艺制备的SiO2波导包层材料厚度达到20 μm以上,表面光滑、没有龟裂,而且是完全玻璃态的,可以用于制备性能优良的各种硅基二氧化硅波导器件.
Resumo:
Integrated multimode interference (MMI) coupler based on silicon-on-insulator(SOI) has been becoming a kind of more and more attractive device in optical systems. SiO2thin cladding layers (<1.0 μm) can be usedin SOI waveguide due to the large index step be-tween Si and SiO2, making them compatible with VLSI technology. The design and fabrica-tion of MMI optical couplers and optical switches in SOI technology are presented in thepa-per. We demonstrated the switching time of 2 × 2 MMI-MZI thermo-optical switch is less than 20 μs:
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随着大规模集成电路的发展,需要一种高介质材料来代替传统的SiO2,介绍了可能替代SiO2的几种二元材料的研究现状,主要包括Si3N4,Ta2O5,TiO2,ZrO2,Y2O3,Gd2O3和CeO2几种材料的结构和电学性能,以及制备薄膜的几种方法;蒸发法,化学气相沉积和离子束沉积。
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以Raman散射、X射线电子能谱和红外吸了光谱细致研究了PECVD法250℃衬底温度下制备的氢化非晶硅氧(a-SiOx:H)薄膜的微结构及键构型。研究表明,在0.52≤x≤1.58的氧含量范围内,a-SiOx:H薄膜成分和结构不是均一的,依赖于局域键构型氧化程度的不同,大致存在着5种在一定程度上相互分离的结构组分,即Si,Si2O(:H),SiO(:H),Si2O3(:H)和SiO2。其中的Si相以非氢化的非晶硅(a-Si)颗粒形式存在,随氧含量x的增加其尺度持续减小但始终存在。提出一种多壳层模型来描述a-SiOx:H薄膜的结构,认为a-SiOx:H薄膜中a-Si颗粒依次为Si2O(:H),SiO(:H),Si2O3(:H)和SiO2壳层所包围。随薄膜氧含量x的增加,各壳层厚度相应变化但各自的化学构成基本保持不变。
Resumo:
MMI (multimode interference) coupler, modulator and switch based on SOI (silicon- on-insulator) have been become more and more attractive in optical systems since they show important performances. SiO2 thin cladding layers (<1.0mum) can be used in SOI waveguide due to the large index step between Si and SiO2, making them compatible with the VLSI technology. The design and fabrication of multimode interference (MMI) optical coupler, modulator and switche in SOI technology are presented in the paper. The results demonstrated that the modulator has an extinction ratio of -11.0dB and excess loss of -2.5dB, while the optical switch has a crosstalk of -12.5dB and responding time of less than 20 mus.
Microstructural and compositional characteristics of GaN films grown on a ZnO-buffered Si(111) wafer
Resumo:
Polycrystalline GaN thin films have been deposited epitaxially on a ZnO-buffered (111)-oriented Si substrate by molecular beam epitaxy. The microstructural and compositional characteristics of the films were studied by analytical transmission electron microscopy (TEM). A SiO2 amorphous layer about 3.5 nm in thickness between the Si/ZnO interface has been identified by means of spatially resolved electron energy loss spectroscopy. Cross-sectional and plan-view TEM investigations reveal (GaN/ZnO/SiO2/Si) layers exhibiting definite a crystallographic relationship: [111](Si)//[111](ZnO)//[0001](GaN) along the epitaxy direction. GaN films are polycrystalline with nanoscale grains (similar to100 nm in size) grown along [0001] direction with about 20degrees between the (1 (1) over bar 00) planes of adjacent grains. A three-dimensional growth mode for the buffer layer and the film is proposed to explain the formation of the as-grown polycrystalline GaN films and the functionality of the buffer layer. (C) 2004 Elsevier Ltd. All rights reserved.
Resumo:
Integrated multimode interference coupler based on silicon-on-insulator has been become a kind of more and more attractive device in optical systems. Thin cladding layers (<1.0mum) can be used in SOI waveguide due to the large index step between Si and SiO2, making them compatible with the VLSI technology. Here we demonstrate the design and fabrication of multimode interference (MMI) optical couplers and optical switches in SOI technology.
Resumo:
The quantum well intermixing of Ga(In)NAs/GaAs simple quantum well (SQW) using SiO2 encapsulation and rapid thermal annealing has been studied. Obvious enhanced intermixing of GaInNAs/GaAs SQW was observed due to the localized SiO2 capping layer and RTA at temperature between 650degreesC and 900degreesC. The selective intermixing strongly depends on N composition and In composition. An obvious selective intermixing had been found in the samples with small N composition and/or high In composition.
Resumo:
Structural dependence on annealing of a-SiOx:H was studied by using infrared absorption and Raman scattering. The appearance of Raman peaks in the range of 513-519cm(-1) after 1170 degreesC annealing was interpreted as the formation nanocrystalline silicon with the sizes from 3-10nm. The Raman spectra also show the existence of amorphous-like silicon phase, which is associated with Si-Si bond re-construction at boundaries of silicon nanocrystallites. The presence of the shoulder at 980cm(-1) of Si-O-Si stretching vibration at 1085cm(-1) in infrared spectra imply that except that SiO2 phase, there is silicon sub-oxide phase in the films annealed at 1170 degreesC. This sub-oxide phase is located at the interface between Si crystallites and SiO2, and thus support the shell model for the mixed structures of Si grains and SiO2 matrix.
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Electroabsorption (EA) modulator integrated with partially gain coupling distributed feedback (DFB) lasers have been fabricated and shown high single mode yield and wavelength stability. The small signal bandwidth is about 7.5 GHz. Strained Si1-chiGechi/Si multiple quantum well (MQW) resonant-cavity enhanced (RCE) photodetectors with SiO2/Si distributed Bragg reflector (DBR) as the mirrors have been fabricated and shown a clear narrow bandwidth response. The external quantum efficiency at 1.3 mum is measured to be about 3.5% under reverse bias of 16 V. A novel GaInNAs/GaAs MQW RCE p-i-n photodetector with high reflectance GaAs/ALAs DBR mirrors has also been demonstrated and shown the selectively detecting function with the FWHM of peak response of 12 nm.