Influences of oxygen partial pressure on structure and related properties of ZrO2 thin films prepared by electron beam evaporation deposition

ZrO2 thin films were prepared by electron beam evaporation at different oxygen partial pressures. The influences of oxygen partial pressure on structure and related properties of ZrO2 thin films were studied. Transmittance, thermal absorption, structure and residual stress of ZrO2 thin films were measured by spectrophotometer, surface thermal lensing technique (STL), X-ray diffraction and optical interferometer, respectively. The results showed that the structure and related properties varied progressively with the increase of oxygen partial pressure. The refractive indices and the packing densities of the thin films decreased when the oxygen partial pressure increased. The tetragonal phase fraction in the thin films decreased gradually as oxygen partial pressure increased. The residual stress of film deposited at base pressure was high compressive stress, the value decreased with the increase of oxygen partial pressure, and the residual stress became tensile with the further increase of oxygen pressure, which was corresponding to the evolution of packing densities and variation of interplanar distances. (c) 2007 Elsevier B.V. All rights reserved.

基底对光学薄膜弱吸收测量的影响

对表面热透镜技术测量光学薄膜弱吸收低频调制时不同基底对测量的影响进行了理论分析。用Lambda-900分光光度计测量了K9和石英基底的Ti3O5单层膜的吸收值，将该组样品作为定标片；用表面热透镜装置分别测量了BK7和石英空白基底及HfO2，ZnO两组不同基底不同厚度单层膜样品的吸收。通过分析比较同一工艺条件下镀制的不同基底薄膜样品用与其同种和不同种基底定标片定标测量的结果，表明在低频测量时需要用与测量样品同种基底的定标片定标；不同厚度样品的测量结果表明，在不能严格满足热薄条件时，测量结果需引入修正值。

Influences of CO2 laser annealing on mechanical and laser-induced damage properties of ZrO2 thin films

Zirconium dioxide (ZrO2) thin films were deposited on BK7 glass substrates by the electron beam evaporation method. A continuous wave CO2 laser was used to anneal the ZrO2 thin films to investigate whether beneficial changes could be produced. After annealing at different laser scanning speeds by CO2 laser, weak absorption of the coatings was measured by the surface thermal lensing (STL) technique, and then laser-induced damage threshold (LIDT) was also determined. It was found that the weak absorption decreased first, while the laser scanning speed is below some value, then increased. The LIDT of the ZrO2 coatings decreased greatly when the laser scanning speeds were below some value. A Nomarski microscope was employed to map the damage morphology, and it was found that the damage behavior was defect-initiated both for annealed and as-deposited samples. The influences of post-deposition CO2 laser annealing on the structural and mechanical properties of the films have also been investigated by X-ray diffraction and ZYGO interferometer. It was found that the microstructure of the ZrO2 films did not change. The residual stress in ZrO2 films showed a tendency from tensile to compressive after CO, laser annealing, and the variation quantity of the residual stress increased with decreasing laser scanning speed. The residual stress may be mitigated to some extent at proper treatment parameters. (c) 2007 Elsevier GmbH. All rights reserved.

Influence of SiO2 additional layers on the laser induced damage threshold of Ta2O5 films

A series or Ta2O5 films with different SiO2 additional layers including overcoat, undercoat and interlayer was prepared by electron beam evaporation under the same deposition process. Absorption of samples was measured using the surface thermal lensing (STL) technique. The electric field distributions of the samples were theoretical predicted using thin film design software (TFCalc). The laser induced damage threshold (LIDT) was assessed using an Nd:YAG laser operating at 1064 nm with a pulse length of 12 ns. It was found that SiO2 additional layers resulted in a slight increase of the absorption, whereas they exerted little influence on the microdefects. The electric field distribution among the samples was unchanged by adding an SiO2 overcoat and undercoat, yet was changed by adding an interlayer. SiO2 undercoat. The interlayer improved the LIDT greatly, whereas the SiO2 overcoat had little effect on the LIDT. (C) 2007 Elsevier Ltd. All rights reserved.

Influence of oxygen post-treatment on laser-induced damage of antireflection coatings prepared by electron-beam evaporation and ion beam assisted deposition

Antireflection coatings at the center wavelength of 1053 nm were prepared on BK7 glasses by electron-beam evaporation deposition (EBD) and ion beam assisted deposition (IBAD). Parts of the two kinds of samples were post-treated with oxygen plasma at the environment temperature after deposition. Absorption at 1064 nm was characterized based on surface thermal lensing (STL) technique. The laser-induced damage threshold (LIDT) was measured by a 1064-nm Nd:YAG laser with a pulse width of 38 ps. Leica-DMRXE Microscope was applied to gain damage morphologies of samples. The results revealed that oxygen post-treatment could lower the absorption and increase the damage thresholds for both kinds of as-grown samples. However, the improving effects are not the same. (c) 2008 Elsevier B.V. All rights reserved.

Investigation of annealing effects on the laser-induced damage threshold of amorphous Ta2O5 films

Ta2O5 films were deposited using the conventional electron beam evaporation method and then annealed at temperatures in the range 373-673 K. Chemical composition, scattering and absorption were examined by X-ray photoelectron spectroscopy (XPS), total integrated scattering (TIS) measurement and the surface thermal lensing (m) technique, respectively. The laser-induced damage threshold (LIDT) was assessed using the output from an Nd:YAG laser with a pulse length of 12 ns. The results showed that the improvement of the LIDT after annealing was due to the reduced substoichiometric and structural defects present in the film. The LIDT increased slightly below 573K and then increased significantly with increase in annealing temperature, which could be attributed to different dominant defects. Moreover, the root mean square (RMS) roughness and scattering had little effect on the LIDT, while the absorption and the LIDT were in accord with a general relation. (c) 2008 Elsevier Ltd. All rights reserved.

Formation of self-assembly and the mechanism of Si nanoquantum dots prepared by low pressure chemical vapor deposition

Si nanoquantum dots have been formed by self-assembled growth on the both Si-O-Si and Si-OH bonds terminated SiO2 surfaces using the low-pressure chemical vapor deposition (LPCVD) and surface thermal decomposition of pure SiH4 gas. We have experimentally studied the variation of Si. dot density with Si-OH bonds density, deposition temperature and SiH4 pressure, and analyzed qualitatively the formation mechanism of the Si nanoquantum dots based on LPCVD surface thermal dynamics principle. The results are very. important for the control of the density and size of Si nanoquantum dots, and have potential applications in the new quantum devices.

High average power and short pulse duration continuous wave mode-locked Nd : GdVO4 laser with a semiconductor absorber mirror

Passive mode locking of a solid-state Nd:GdVO4 laser is demonstrated. The laser is mode locked by use of a semiconductor absorber mirror (SAM). A low Nd3+ doped Nd:GdVO4 crystal is used to mitigate the thermal lens effect of the laser crystal at a high pump power. The maximum average output power is up to 6.5 W, and the pulse duration is as short as 6.2 ps. The optic-to-optic conversion efficiency is 32.5% and the repetition rate is about 110 MHz.

月表热参数模型与月壤厚度的被动微波遥感理论分析

利用被动微波遥感亮度温度数据反演月壤厚度是“嫦娥”探月工程的科学目标之一，也是人类探测月壤厚度的一种新的尝试。深入研究月表太阳辐射、月球内部热流以及月表温度的分布和变化规律，是解译遥感数据，反演月壤厚度的前提条件，也为进一步开展月球探测、开发利用月球资源乃至建立月球基地相关研究工作提供必要的参考。 本文根据月表有效太阳辐照度与太阳常数、日月距离和太阳辐射入射角的关系，建立了月表有效太阳辐照度的实时模型如下： (1) 其中， (2) (3) 通过对月表有效太阳辐照度实时模型的各个参数分析发现，影响月表有效太阳辐照度变化的主要因素是日地距离和太阳辐射入射角的变化。对模型的误差分析表明，从1950年到2050年的100年内，月表有效太阳辐照度计算结果的误差百分比小于0.28％，能更准确地反映月表有效太阳辐照度的变化情况。从2007年月表有效太阳辐照度的计算结果发现，该年内的月表有效太阳辐照度变化在1321.5～1416.6 W•m-2之间，平均为1368.0 W•m-2，一个月内的变化最小幅度为6.0 W•m-2，最大幅度为23.6 W•m-2。 在月表有效太阳辐照度的实时模型基础上，根据能量守恒和Stefan-Boltzmann定律，本文还得出了月表温度分布模型如下： (4) 其中，初始条件由下式决定， (5) 通过与月表温度实际观测结果的比较发现，当月表反射率、热发射率和热惯量分别取0.127、0.94和125 J•m-2•s-1/2•K-1时，模型的计算结果与实际观测值比较符合，能较好地预测理想条件下的月表温度。 月表热参数研究的一个重要应用就是解译对月被动微波遥感的亮度温度数据。在对月被动微波遥感探测中，辐射计获得的亮度温度反映了月球表层的热辐射特性。月球表层的热辐射与其自身的热状况紧密相关，结合文中建立的月表热参数模型，根据辐射传播理论进一步分析了对月微波遥感探测中，月球表层在不同情况下对亮度温度的贡献，确定了亮度温度随月表温度和月壤厚度的变化关系，对被动微波遥感探测月壤厚度的可能性和可能达到的精度进行了估算。 对月球表层的热辐射传播的分析发现，对月被动微波遥感探测获得的亮度温度受月球表层热辐射的控制，与月壤厚度具有指数相关性，并受到月表温度的影响。当月壤和月岩的复介电常数分别为2 + 0.005 j和9 + 1 j、相对磁导率均为1时，对应3.0GHz、7.8GHz、19.35GHz和37.0GHz四个频率的亮度温度与月壤厚度及月表温度的关系可分别近似表示为， 3.0GHz亮度温度： (6) 7.8GHz亮度温度： (7) 19.35GHz亮度温度： (8) 37.0GHz亮度温度： (9) 当月壤厚度和月表温度分别在0.5m~30m和100K~400K之间变化时，上述四个频率的亮度温度变化范围分别在212.5K～252.8K、207.4 K～266.7K、193.8 K～288.6K和174.0 K～310.9K之间。对于较低频率的被动微波遥感，亮度温度随月壤厚度的增大逐渐增大并趋于稳定；对较高频率的被动微波遥感，亮度温度随月壤厚度的增大会产生起伏波动，不利于用单波段反演月壤厚度。亮度温度梯度在频率较高时梯度较大，在很小的月壤厚度范围内很快就趋于0，不利于厚度较大时的月壤厚度反演，但对于厚度较小时的月壤厚度反演精度较高；同时，除3.0GHz外，7.8GHz、19.35GHz和37.0GHz三个频率的亮度温度梯度随月表温度的升高降幅较大，尤其是19.35GHz，适合在夜间对月壤厚度较小的地区进行更精确的探测。对于3.0GHz，其亮度温度梯度受月表温度变化的影响很小，能反映出较深层月壤厚度的信息，可以对月球进行全球全天时探测。若辐射计的分辨率为0.02K，3.0GHz频率对10m厚月壤的判别精度达到0.07m；对于20m厚月壤的精度为1.4m。当月壤厚度小于0.5m时，随着月壤厚度从0到0.5m增加，月球表层的亮度温度贡献呈先减小后增大的趋势，从而使某一亮度温度值可能对应存在两种不同的月壤厚度。因此，对于月壤厚度小于0.5m的区域，利用单波段被动微波遥感亮度温度反演月壤厚度是比较困难的。 在对月被动微波遥感探测中，可以利用月球夜晚时段的亮度温度数据判别月壤厚度是否小于0.5m。当月表温度为100K时，3.0GHz、7.8GHz、19.35GHz和37.0GHz四个频率的亮度温度判别参考值分别为212.9K、207.4K、193.5K和174.1K；月表温度为240K时，上述四个频率的亮度温度判别参考值分别为220.8K、226.8K、234.1K和237.2K。当亮度温度小于参考值时表示月壤厚度小于0.5m，反之，表示月壤厚度大于0.5m。更进一步地，可以根据月表温度的影响系数对月岩是否裸露于月表进行判断。当3.0GHz、7.8GHz、19.35GHz和37.0GHz四个频率的月表温度影响系数接近0.77、0.82、0.84和0.85时，可以认为月岩直接暴露于月表。

Thermal-mechanical interface crack behaviour of a surface mount solder joint

The effect of thermal-mechanical loading on a surface mount assembly with interface cracks between the solder and the resistor and between the solder and the printed circuit board (PCB) was studied using a non-linear thermal finite element analysis. The thermal effect was taken as cooling from the solder eutectic temperature to room temperature. Mechanical loading at the ends of the PCB was also applied. The results showed that cooling had the effect of causing large residual shear displacement at the region near the interface cracks. The mechanical loading caused additional crack opening displacements. The analysis on the values of J-integral for the interface cracks showed that J-integral was approximately path independent, and that the effect of crack at the solder/PCB interface is much more serious than that between the component and solder.

Characters of Surface Deformation and Surface Wave in Thermal Capillary Convection

In the field of fluid mechanics, free surface phenomena is one of the most important physical processes. In the present research work, the surface deformation and surface wave caused by temperature difference of sidewalls in a rectangular cavity have been investigated. The horizontal cross-section of the container is 52 mmx42 mm, and there is a silicon oil layer of height 3.5 mm in the experimental cavity. Temperature difference between the two side walls of the cavity is increased gradually, and the flow on the liquid layer will develop from stable convection to un-stable convection. An optical diagnostic system consisting of a modified Michelson interferometer and image processor has been developed for study of the surface deformation and surface wave of thermal capillary convection. The Fourier transformation method is used to interferometer fringe analysis. The quantitative results of surface deformation and surface wave have been calculated from a serial of the interference fringe patterns.The characters of surface deformation and surface wave have been obtained. They are related with temperature gradient and surface tension. Surface deformation is fluctuant with time, which shows the character of surface wave. The cycle period of the wave is 4.8 s, and the amplitudes are from 0 to 0.55 mu m. The phase of the wave near the cool side of the cavity is opposite and correlative to that near the hot side. The present experiment proves that the surface wave of thermal capillary convection exists on liquid free surface, and it is wrapped in surface deformation.

The Optical Methods on Measuring Surface Deformation and Surface Wave in The Thermal Capillary Convection

An optical diagnostic system consisting of the Michelson interferometer with the image processor has been developed for the study of the kinetics of the thermal capillary convection. The capillary convection, surface deformation, surface wave and the velocity field in a rectangular cavity with different temperature's sidewalls have been investigated by optical interference method and PIV technique. In order to calculate the surface deformation from the interference fringe, Fourier transformation is used to grating analysis. The quantitative results of the surface deformation and surface wave have been calculated from the interference fringe pattern.

A New Analytical Model for Residual Stresses due to Thermal Surface Coating

发展了一种新的分析涂层结构（平板、梁）热残余应力的模型,可以研究骤冷过程(Quenching)和冷却过程(Cooling)在涂层结构内引发的残余应力分布。与以往模型相比,其优势在于：它可以考虑源于喷涂过程的涂层孔隙率、温度梯度等因素对于涂层和基底内残余应力的影响。其中孔隙率和温度分布由计算机模拟涂层沉积过程得到。另外,当基底的材料和几何参数被固定时,我们分析了诸如涂层的理想模量、厚度、热膨胀系数等参数,对于涂层结构中最终残余应力分布的改变机理。

Experimental Observation on Surface Wave Phenomena in Thermal Capillary Convection

An optical diagnostic system consisting of the Michelson interferometer with the image processor has been developed for studying of the surface wave in the thermal capillary convection in a rectangular cavity. In this paper, the capillary convection, surface deformation and surface wave due to the different temperature between the two sidewalls have been investigated. The cavity is 52mm?42mm in horizontal cross section and 4mm in height. The temperature difference is increased gradually and flow in liquid layer will change from steady convection to unstable convection. The optical interference method measures the surface deformation and the surface wave of the convection. The deformation of the interference fringes, which produced by the meeting of the reflected light from the liquid surface and the reference light has been captured, and the surface deformation appears when the steady convection is developed. The surface deformation is enhanced with the increasing of the temperature difference, and then several knaggy peeks in the interference fringes appear and move from the heated side to the cooled side, it demonstrates that the surface wave is existed. The surface deformation, the wavelength, the frequency, and the wave amplitude of the surface wave have been calculated.

Influence of thermal annealing on optical properties and surface morphology of NiOx thin films

NiOx thin films were deposited by reactive DC-magnetron sputtering from a nickel metal target in Ar + O-2 with the relative O-2 content of 5%. Thermal annealing effects on optical properties and surface morphology of NiOx, films were investigated by X-ray photoelectron spectroscopy, thermogravimetric analysis, scanning electron microscope and optical measurement. The results showed that the changes in optical properties and surface morphology depended on the temperature. The surface morphology of the films changed obviously as the annealing temperature increased due to the reaction NiOx -> NiO + O-2 releasing O-2. The surface morphology change was responsible for the variation of the optical properties of the films. The optical contrast between the as-deposited films and 400 degrees C annealed films was about 52%. In addition, the relationship of the optical energy band gap with the variation of annealing temperature was studied. (c) 2006 Elsevier B.V. All rights reserved.