Influence of thermal annealing on optical properties and surface morphology of NiOx thin films


Autoria(s): Zhou Ying; Geng Yongyou; 顾冬红
Data(s)

2007

Resumo

NiOx thin films were deposited by reactive DC-magnetron sputtering from a nickel metal target in Ar + O-2 with the relative O-2 content of 5%. Thermal annealing effects on optical properties and surface morphology of NiOx, films were investigated by X-ray photoelectron spectroscopy, thermogravimetric analysis, scanning electron microscope and optical measurement. The results showed that the changes in optical properties and surface morphology depended on the temperature. The surface morphology of the films changed obviously as the annealing temperature increased due to the reaction NiOx -> NiO + O-2 releasing O-2. The surface morphology change was responsible for the variation of the optical properties of the films. The optical contrast between the as-deposited films and 400 degrees C annealed films was about 52%. In addition, the relationship of the optical energy band gap with the variation of annealing temperature was studied. (c) 2006 Elsevier B.V. All rights reserved.

Identificador

http://ir.siom.ac.cn/handle/181231/3967

http://www.irgrid.ac.cn/handle/1471x/11364

Idioma(s)

英语

Fonte

Zhou Ying;Geng Yongyou;顾冬红.,Mater. Lett.,2007,61():2482-2485

Palavras-Chave #光存储 #NiOx films #annealing #optical properties #surface morphology #optical recording
Tipo

期刊论文