Formation of self-assembly and the mechanism of Si nanoquantum dots prepared by low pressure chemical vapor deposition


Autoria(s): Peng, YC; Ikeda, M; Miyazaki, S
Data(s)

2003

Resumo

Si nanoquantum dots have been formed by self-assembled growth on the both Si-O-Si and Si-OH bonds terminated SiO2 surfaces using the low-pressure chemical vapor deposition (LPCVD) and surface thermal decomposition of pure SiH4 gas. We have experimentally studied the variation of Si. dot density with Si-OH bonds density, deposition temperature and SiH4 pressure, and analyzed qualitatively the formation mechanism of the Si nanoquantum dots based on LPCVD surface thermal dynamics principle. The results are very. important for the control of the density and size of Si nanoquantum dots, and have potential applications in the new quantum devices.

Identificador

http://ir.semi.ac.cn/handle/172111/8238

http://www.irgrid.ac.cn/handle/1471x/63713

Idioma(s)

英语

Fonte

Peng, YC; Ikeda, M; Miyazaki, S .Formation of self-assembly and the mechanism of Si nanoquantum dots prepared by low pressure chemical vapor deposition ,ACTA PHYSICA SINICA,DEC 2003,52 (12):3108-3113

Palavras-Chave #半导体材料 #Si nanoquanturn dots
Tipo

期刊论文