A test mode approach to fault detection in sequential circuits,

"C00-1469-0117."

ARPA/NBS workshop III : test patterns for integrated circuits /

Consists of synopses of talks and discussions presented at the workshop held Sept. 6, 1974 in Scottsdale, Ariz.

Design of the program-controlled semiconductor and printed circuit board test console /

"October 21, 1963"

Diagnosis of printed circuit cards on a programmable test equipment /

Originally published as the author's thesis (M.S.)--University of Illinois at Urbana-Champaign, 1970.

Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures /

S/N 003-003-02297-7.

Operator's and organizational maintenance manual : test set, electronic circuit plug-in unit AN/ARM-87 (NSN 6625-00-908-0358).

"4 February 1981."

Direct support maintenance manual, including repair parts list for test set, electrical circuit, bomb dispenser, A/E 24T-79 (NSN 4925-00-915-5735).

"March 1975."

Capacitance, inductance, resistance test set AN/URM-90.

"April 1956."

Operator and organizational maintenance manual : test set, electronic circuit plug-in unit, AN/GRM-55.

"5 November 1962."

Operator's and organizational maintenance manual : test set, electronic circuit plug-in unit, TS-3317( )/TSQ-73 (NSN 1430-01-033-1078).

"14 May 1984."

A production-compatible microelectronic test pattern for evaluating photomask misalignment /

Includes bibliographical references.