ARPA/NBS workshop III : test patterns for integrated circuits /


Autoria(s): Schafft, Harry A.
Data(s)

01/01/1976

Resumo

Consists of synopses of talks and discussions presented at the workshop held Sept. 6, 1974 in Scottsdale, Ariz.

Includes bibliographical references.

Mode of access: Internet.

Formato

bib

bib

bib

Identificador

http://hdl.handle.net/2027/uiug.30112104131583

http://hdl.handle.net/2027/mdp.39015077586249

http://hdl.handle.net/2027/uc1.31210023555772

Idioma(s)

eng

Publicador

Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off.,

Relação

ARPA/NBS workshop III.

ARPA/NBS workshop III.

Direitos

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Palavras-Chave #Industrie électronique #Circuits intégrés #Automatic data collection systems #Electronic industries #Integrated circuits
Tipo

text