A test mode approach to fault detection in sequential circuits,


Autoria(s): Rettig, J
Data(s)

28/02/1969

Resumo

"C00-1469-0117."

Thesis (M.S.)--University of Illinois.

Bibliography: p. 44.

Mode of access: Internet.

Formato

con

Identificador

http://hdl.handle.net/2027/uiuo.ark:/13960/t6n02pv9x

Idioma(s)

eng

Publicador

Urbana, Dept. of Computer Science, University of Illinois,

Direitos

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Palavras-Chave #Sequential analysis
Tipo

text