Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures /

Autoria(s): Mitchell, Michael A.; Linholm, Loren W.; United States. National Bureau of Standards. Special publication.; Center for Electronics and Electrical Engineering (U.S.); Air Force Wright Aeronautical Laboratories.
Data(s)

14/01/1981
Resumo

S/N 003-003-02297-7.

Issued March 1981."

"Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."

Includes bibliographical references.

Mode of access: Internet.
Formato

bib

bib

bib
Identificador

http://hdl.handle.net/2027/mdp.39015077586009

http://hdl.handle.net/2027/uiug.30112075693660

http://hdl.handle.net/2027/uc1.31210023555574

URN:ISBN:
Idioma(s)

eng
Publicador

Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O.,
Direitos

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Palavras-Chave #Electronic apparatus and appliances #Integrated circuits
Tipo

text
Acesso ao item digital