A humidity-resistant highly sensitive holographic photopolymerizable dry film

A new humidity-resistant highly sensitive acrylamide-based photopolymeric holographic recording material has been developed. The photopolymer is resistant to the humidity of environment. Diffraction efficiencies near 50% are obtained with exposure energy of 60 mJ/cm(2) in materials of 150 mu m. thickness. Diphenyl iodonium chloride is added to the material and can increase the exposure sensitivity by a factor of more than 4 (to about 28 mJ/cm(2)). An image has been successfully stored in the material with a small distortion. (C) 2005 Elsevier B.V. All rights reserved.

On the dynamic readout of sub-diffraction-limit pit arrays with a silver thin film

Fast moving arrays of periodic sub-diffraction-limit pits were dynamically read out via a silver thin film. The mechanism of the dynamic readout is analysed and discussed in detail, both experimentally and theoretically. The analysis and experiment show that, in the course of readout, surface plasmons can be excited at the silver/air interface by the focused laser beam and amplified by the silver thin film. The surface plasmons are transmitted into the substrate/silver interface with a large enhancement. The surface waves at the substrate/silver interface are scattered by the sinusoidal pits of sub-diffraction-limit size. The scattered waves are collected by a converging lens and guided into the detector for the readout.

Structure-change-dependent transmittance of PtOx thin film in super-resolution near-field structure: Diffraction effect analysis

To study working mechanism of super-resolution near-field structure (super-RENS) optical disk from a far-field optics view is very necessary because of the actual far-field writing/readout process in the optical disk system. A Gaussian diffraction model based on Fresnel-Kirchhoff diffraction theory of PtOx-type super-RENS has been set up in this Letter. The relationship between micro-structural deformation (change of bubble structure and refractive index profile) with far-field optical response of PtOx thin film has been studied with it in detail. The simulation results are in good agreement with the experimental results reported in literatures with a designed configuration. These results may provide more quantitative information for better understanding of the working mechanism of metal-oxide-type super-RENS. (c) 2007 Elsevier B.V. All rights reserved.

Structure and properties of amorphous thin film for optical data storage

In this paper the magnetic and magneto-optical properties of amorphous rare earth-transition metal (RE-TM) alloys as well as the magnetic coupling in the multi-layer thin films for high density optical data storage are presented. Using magnetic effect in scanning tunneling microscopy the clusters structure of amorphous RE-TM thin films has been observed and the perpendicular magnetic anisotropy in amorphous RE-TM thin films has been interpreted. Experimental results of quick phase transformation under short pulse laser irradiation of amorphous semiconductor and metallic alloy thin films for phase change optical recording are reported. A step-by-step phase transformation process through metastable states has been observed. The waveform of crystallization propagation in micro-size spot during laser recording in amorphous semiconductor thin films is characterized and quick recording and erasing mechanism for optical data storage with high performance are discussed. The nonlinear optical effects in amorphous alloy thin films have been studied. By photo-thermal effect or third order optical nonlinearity, the optical self-focusing is observed in amorphous mask thin films. The application of amorphous thin films with super-resolution near field structure for high-density optical data storage is performed. (c) 2007 Elsevier B.V. All rights reserved.

Super-resolution scanning laser microscopy with a third-order optical nonlinear thin film

In a configuration of optical far-field scanning microscopy, super-resolution achieved by inserting a third-order optical nonlinear thin film is demonstrated and analyzed in terms of the frequency response function. Without the thin film the microscopy is diffraction limited; thus, subwavelength features cannot be resolved. With the nonlinear thin film inserted, the resolution is dramatically improved and thus the microscopy resolves features significantly smaller than the smallest spacing allowed by the diffraction limit. A theoretical model is established and the device is analyzed for the frequency response function. The results show that the frequency response function exceeds the cutoff spatial frequency of the microscopy defined by the laser wavelength and the numerical aperture of the convergent lens. The main contribution to the improvement of the cutoff spatial frequency is from the phase change induced by the complex transmission of the nonlinear thin film. Experimental results are presented and are shown to be consistent with the results of theoretical simulations.

The origin of the super-resolution via a nonlinear thin film

In laser applications, resolutions beyond the diffraction limit can be obtained with a thin film of strong optical nonlinear effect. The optical index of the silicon thin film is modified with the incident laser beam as a function of the local field intensity n(r) similar to E-2(r). For ultrathin films of thickness d << lambda the transmitted light through the film forms a profile of annular rings. Therefore, the device can be related to the realization of super-resolution with annular pupils. Theoretical analysis shows that the focused light spot appears significantly reduced in comparison with the diffraction limit that is determined by the laser wavelength and the numerical aperture of the converging lens. Analysis on the additional optical transfer function due to the thin film confirms that the resolving power is improved in the high spatial frequency region. (C) 2007 Published by Elsevier B.V.

Low-Power Super-resolution Readout with Antimony Bismuth Alloy Film as Mask layer

Sb-Bi alloy films are proposed as a new kind of super-resolution mask layer with low readout threshold power. Using the Sb-Bi alloy film as a mask layer and SiN as a protective layer in a read-only memory disc, the super-resolution pits with diameters of 380 nm are read out by a dynamic setup, the laser wavelength is 780 nm and the numerical aperture of pickup lens is 0.45. The effects of the Sb-Bi thin film thickness, laser readout power and disc rotating velocity on the readout signal are investigated. The results show that the threshold laser power of super-resolution readout of the Sb-Bi mask layer is about 0.5 mW, and the corresponding carrier-to-noise ratio is about 20 dB at the film thickness of 50 nm. The super-resolution mechanism of the Sb-Bi alloy mask layer is discussed based on its temperature dependence of reflection.

Influência da espessura do filme de cimento na resistência adesiva de pinos de fibra de vidro cimentados em condutos radiculares de dentes humanos

O presente estudo visa avaliar a influência da espessura do filme de cimento sobre a resistência de união de pinos de fibra de vidro em diferentes regiões do conduto radicular (cervical, médio e apical), cimentados com cimento resinoso autoadesivo, com e sem a adição de Rodamina B, por meio do teste de push-out. Quarenta raízes foram incluídas em resina epóxi, submetidas a tratamento endodôntico e obturadas com guta percha e cimento endodôntico sem eugenol. Após sete dias, os condutos foram desobstruídos e aleatoriamente divididos em 4 grupos (n=10), de acordo com as brocas do sistema de pinos de fibra WhitePost DC (FGM) usadas: (G1) broca #2; (G2) broca #3; (G3) broca #4; (G4) broca #2. O preparo foi realizado a uma profundidade de 10 mm. A cimentação foi realizada com o cimento resinoso autoadesivo RelyX U100 (3M ESPE), e apenas nos grupos G1, G2 e G3 uma pequena quantidade de Rodamina B em pó foi usada como corante no cimento. Após uma semana, cada raiz foi seccionada em máquina de corte, obtendo-se 6 fatias de 1 0,1 mm de espessura. Antes do ensaio de push-out, imagens digitais foram obtidas, por meio de um estereomicroscópio, de ambas as faces de cada fatia, para determinação do raio dos pinos e da espessura do filme de cimento. Após o ensaio mecânico, novas imagens foram obtidas para determinação do modo de falha. Para determinar a espessura de cimento, foi desenvolvida uma rotina (macro) no software KS 400. Os dados foram estatisticamente analisados com análise de variância (ANOVA) 2 fatores (influência do diâmetro da broca e influência dos terços) e Kruskal-Wallis (influência da espessura do filme de cimento). Comparações múltiplas foram realizadas com o teste Duncan. Todos os testes foram aplicados com α=0,05. Houve diferenças significantes entre os grupos em relação ao diâmetro da broca (p<0,0001), sendo G2 (14,62 5,15 MPa) > G1 (10,04 5,13 MPa) > G3 (7,68 6,14 MPa). O terço do conduto exerceu influência significativa sobre a resistência adesiva (p<0,0001), sendo os maiores valores obtidos no terço apical. As espessuras do filme de cimento foram estatisticamente diferentes nos grupos. Os maiores valores de espessura de cimento foram obtidos no G3 (248,78 μm), seguido de G2 (185,91 μm) e G1 (110,16 μm), sendo o último estatisticamente semelhante ao G4 (119,99 μm). Os resultados de G1(10,04 5,13 MPa) e G4 (8,89 + 5,18 MPa) foram estatisticamente semelhantes, indicando que a presença da Rodamina B não influencia significativamente na resistência de união. O tipo de falha predominante no G1 foi mista, no G2, adesiva entre pino e cimento, e no G3 e G4, adesiva entre cimento e dentina. O diâmetro da broca influenciou significativamente nos resultados de resistência de união ao teste de push-out. O ligeiro aumento na espessura do filme de cimento promoveu um aumento nos valores de resistência, quando comparado com filmes de cimento muito finos ou muito espessos.

Effect of water content in sol on optical properties of hybrid sol-gel derived TiO2/SiO2/ormosil film

Sol-gel derived TiO2/SiO2/ormosil hybrid planar waveguides have been deposited on soda-lime glass slides and silicon substrates, films were heat treated at 150 degreesC for 2 h or dried at room temperature. Different amounts of water were added to sols to study their impacts on microstructures and optical properties of films. The samples were characterized by m-line spectroscopy, Fourier transform infrared spectroscopy (FT-IR), UV/VIS/NIR spectrophotometer (UV-vis), atomic force microscopy (AFM), thermal analysis instrument and scattering-detection method. The refractive index was found to have the largest value at the molar ratio H2O/OR = 1 in sol (OR means -OCH3, -OC2H5 and -OC4H9 in the sol), whereas the thickest film appears at H2O/OR = 1/2. The rms surface roughness of all the films is lower than 1.1 nm, and increases with the increase of water content in sol. Higher water content leads to higher attenuation of film. (C) 2004 Elsevier B.V. All rights reserved.