Structure-change-dependent transmittance of PtOx thin film in super-resolution near-field structure: Diffraction effect analysis


Autoria(s): Qu Qingling; Wang Yang; 干福熹
Data(s)

2007

Resumo

To study working mechanism of super-resolution near-field structure (super-RENS) optical disk from a far-field optics view is very necessary because of the actual far-field writing/readout process in the optical disk system. A Gaussian diffraction model based on Fresnel-Kirchhoff diffraction theory of PtOx-type super-RENS has been set up in this Letter. The relationship between micro-structural deformation (change of bubble structure and refractive index profile) with far-field optical response of PtOx thin film has been studied with it in detail. The simulation results are in good agreement with the experimental results reported in literatures with a designed configuration. These results may provide more quantitative information for better understanding of the working mechanism of metal-oxide-type super-RENS. (c) 2007 Elsevier B.V. All rights reserved.

Identificador

http://ir.siom.ac.cn/handle/181231/3977

http://www.irgrid.ac.cn/handle/1471x/11369

Idioma(s)

英语

Fonte

Qu Qingling;Wang Yang;干福熹.,Phys. Lett. A,2007,368():271-275

Palavras-Chave #光存储 #Gaussian diffraction model #far-field #Super-RENS #micro-structural deformation
Tipo

期刊论文