Quasi delay insensitive asynchronous circuits for low EMI

International audience

Fully Connected PLL Networks: How Filter Determines the Number of Nodes

Synchronization plays an important role in telecommunication systems, integrated circuits, and automation systems. Formerly, the masterslave synchronization strategy was used in the great majority of cases due to its reliability and simplicity. Recently, with the wireless networks development, and with the increase of the operation frequency of integrated circuits, the decentralized clock distribution strategies are gaining importance. Consequently, fully connected clock distribution systems with nodes composed of phase-locked loops (PLLs) appear as a convenient engineering solution. In this work, the stability of the synchronous state of these networks is studied in two relevant situations: when the node filters are first-order lag-lead low-pass or when the node filters are second-order low-pass. For first-order filters, the synchronous state of the network shows to be stable for any number of nodes. For second-order filter, there is a superior limit for the number of nodes, depending on the PLL parameters. Copyright (C) 2009 Atila Madureira Bueno et al.

A small area 8 bits 50 MHz CMOS DAC for Bluetooth transmitter

This paper presents a small-area CMOS current-steering segmented digital-to-analog converter (DAC) design intended for RF transmitters in 2.45 GHz Bluetooth applications. The current-source design strategy is based on an iterative scheme whose variables are adjusted in a simple way, minimizing the area and the power consumption, and meeting the design specifications. A theoretical analysis of static-dynamic requirements and a new layout strategy to attain a small-area current-steering DAC are included. The DAC was designed and implemented in 0.35 mu m CMOS technology, requiring an active area of just 200 mu m x 200 mu m. Experimental results, with a full-scale output current of 700 mu A and a 3.3 V power supply, showed a spurious-free dynamic range of 58 dB for a 1 MHz output sine wave and sampling frequency of 50 MHz, with differential and integral nonlinearity of 0.3 and 0.37 LSB, respectively.

Mutually connected phase-locked loop networks: dynamical models and design parameters

Distribution of timing signals is an essential factor for the development of digital systems for telecommunication networks, integrated circuits and manufacturing automation. Originally, this distribution was implemented by using the master-slave architecture with a precise master clock generator sending signals to phase-locked loops (PLL) working as slave oscillators. Nowadays, wireless networks with dynamical connectivity and the increase in size and operation frequency of the integrated circuits suggest that the distribution of clock signals could be more efficient if mutually connected architectures were used. Here, mutually connected PLL networks are studied and conditions for synchronous states existence are analytically derived, depending on individual node parameters and network connectivity, considering that the nodes are nonlinear oscillators with nonlinear coupling conditions. An expression for the network synchronisation frequency is obtained. The lock-in range and the transmission error bounds are analysed providing hints to the design of this kind of clock distribution system.

Analysis of the gate capacitance measurement technique and its application for the evaluation of hot-carrier degradation in submicrometer MOSFETs

The use of gate-to-drain capacitance (C-gd) measurement as a tool to characterize hot-carrier-induced charge centers in submicron n- and p-MOSFET's has been reviewed and demonstrated. By analyzing the change in C-gd measured at room and cryogenic temperature before and after high gate-to-drain transverse field (high field) and maximum substrate current (I-bmax) stress, it is concluded that the degradation was found to be mostly due to trapping of majority carriers and generation of interface states. These interface states were found to be acceptor states at top half of band gap for n-MOSFETs and donor states at bottom half of band gap for p-MOSFETs. In general, hot electrons are more likely to be trapped in gate oxide as compared to hot holes while the presence of hot holes generates more interface states. Also, we have demonstrated a new method for extracting the spatial distribution of oxide trapped charge, Q(ot), through gate-to-substrate capacitance (C-gb) measurement. This method is simple to implement and does not require additional information from simulation or detailed knowledge of the device's structure. (C) 2001 Elsevier Science Ltd. All rights reserved.

A new method of threshold voltage extraction via MOSFET gate-to-substrate capacitance measurement

A new method to extract MOSFET's threshold voltage VT by measurement of the gate-to-substrate capacitance C-gb of the transistor is presented. Unlike existing extraction methods based on I-V data, the measurement of C-gb does not require de drain current to now between drain and source thus eliminating the effects of source and drain series resistance R-S/D, and at the same time, retains a symmetrical potential profile across the channel. Experimental and simulation results on devices with different sizes are presented to justify the proposed method.

Simulation of interface states effect on the scanning capacitance microscopy measurement of p-n junctions

A two-dimensional numerical simulation model of interface states in scanning capacitance microscopy (SCM) measurements of p-n junctions is presented-In the model, amphoteric interface states with two transition energies in the Si band gap are represented as fixed charges to account for their behavior in SCM measurements. The interface states are shown to cause a stretch-out-and a parallel shift of the capacitance-voltage characteristics in the depletion. and neutral regions of p-n junctions, respectively. This explains the discrepancy between - the SCM measurement and simulation near p-n junctions, and thus modeling interface states is crucial for SCM dopant profiling of p-n junctions. (C) 2002 American Institute of Physics.

Dopant extraction from scanning capacitance microscopy measurements of p-n junctions using combined inverse modeling and forward simulation

This article proposes a more accurate approach to dopant extraction using combined inverse modeling and forward simulation of scanning capacitance microscopy (SCM) measurements on p-n junctions. The approach takes into account the essential physics of minority carrier response to the SCM probe tip in the presence of lateral electric fields due to a p-n junction. The effects of oxide fixed charge and interface state densities in the grown oxide layer on the p-n junction samples were considered in the proposed method. The extracted metallurgical and electrical junctions were compared to the apparent electrical junction obtained from SCM measurements. (C) 2002 American Institute of Physics.

Design of improved rail-to-rail low-distortion and low-stress switches in advanced CMOS technologies

This paper describes the efficient design of an improved and dedicated switched-capacitor (SC) circuit capable of linearizing CMOS switches to allow SC circuits to reach low distortion levels. The described circuit (SC linearization control circuit, SLC) has the advantage over conventional clock-bootstrapping circuits of exhibiting low-stress, since large gate voltages are avoided. This paper presents exhaustive corner simulation results of a SC sample-and-hold (S/H) circuit which employs the proposed and optimized circuits, together with the experimental evaluation of a complete 10-bit ADC utilizing the referred S/H circuit. These results show that the SLC circuits can reduce distortion and increase dynamic linearity above 12 bits for wide input signal bandwidths.

Codificador JPEG baseado em FPGA

O presente trabalho consiste na implementação em hardware de unidades funcionais dedicadas e optimizadas, para a realização das operações de codificação e descodificação, definidas na norma de codificação com perda Joint Photographic Experts Group (JPEG), ITU-T T.81 ISO/IEC 10918-1. Realiza-se um estudo sobre esta norma de forma a caracterizar os seus principais blocos funcionais. A finalidade deste estudo foca-se na pesquisa e na proposta de optimizações, de forma a minimizar o hardware necessário para a realização de cada bloco, de modo a que o sistema realizado obtenha taxas de compressão elevadas, minimizando a distorção obtida. A redução de hardware de cada sistema, codificador e descodificador, é conseguida à custa da manipulação das equações dos blocos Forward Discrete Cosine Transform (FDCT) e Quantificação (Q) e dos blocos Forward Discrete Cosine Transform (IDCT) e Quantificação Inversa (IQ). Com as conclusões retiradas do estudo e através da análise de estruturas conhecidas, descreveu-se cada bloco em Very-High-Speed Integrated Circuits (VHSIC) Hardware Description Language (VHDL) e fez-se a sua síntese em Field Programmable Gate Array (FPGA). Cada sistema implementado recorre à execução de cada bloco em paralelo de forma a optimizar a codificação/descodificação. Assim, para o sistema codificador, será realizada a operação da FDCT e Quantificação sobre duas matrizes diferentes e em simultâneo. O mesmo sucede para o sistema descodificador, composto pelos blocos Quantificação Inversa e IDCT. A validação de cada bloco sintetizado é executada com recurso a vectores de teste obtidos através do estudo efectuado. Após a integração de cada bloco, verificou-se que, para imagens greyscale de referência com resolução de 256 linhas por 256 colunas, é necessário 820,5 μs para a codificação de uma imagem e 830,5 μs para a descodificação da mesma. Considerando uma frequência de trabalho de 100 MHz, processam-se aproximadamente 1200 imagens por segundo.

A Voltage Limiter Circuit for Indoor Light Energy Harvesting Applications

A voltage limiter circuit for indoor light energy harvesting applications is presented. This circuit is a part of a bigger system, whose function is to harvest indoor light energy, process it and store it, so that it can be used at a later time. This processing consists on maximum power point tracking (MPPT) and stepping-up, of the voltage from the photovoltaic (PV) harvester cell. The circuit here described, ensures that even under strong illumination, the generated voltage will not exceed the limit allowed by the technology, avoiding the degradation, or destruction, of the integrated die. A prototype of the limiter circuit was designed in a 130 nm CMOS technology. The layout of the circuit has a total area of 23414 mu m(2). Simulation results, using Spectre, are presented.

A 5GHz1.8V Low Power CMOS Low-Noise Amplifier

Wireless local-area networks (WLANs) have been deployed as office and home communications infrastructures worldwide. The diversification of the standards, such as IEEE 802.11 series demands the design of RF front-ends. Low power consumption is one of the most important design concerns in the application of those technologies. To maintain competitive hardware costs, CMOS has been used since it is the best solution for low cost and high integration processing, allowing analog circuits to be mixed with digital ones. In the receiver chain, the low noise amplifier (LNA) is one of the most critical blocks in a transceiver design. The sensitivity is mainly determined by the LNA noise figure and gain. It interfaces with the pre-select filter and the mixer. Furthermore, since it is the first gain stage, care must be taken to provide accurate input match, low-noise figure, good linearity and a sufficient gain over a wide band of operation. Several CMOS LNAs have been reported during the last decade, showing that the most research has been done at 802.11/b and GSM standards (900-2400MHz spectrum) and more recently at 802.11/a (5GHz band). One of the more significant disadvantages of 802.11/b is that the frequency band is crowded and subject to interference from other technologies, as is 2.4GHz cordless phones and Bluetooth. As the demand for radio-frequency integrated circuits, operating at higher frequency bands, increases, the IEEE 802.11/a standard becomes a very attractive option to wireless communication system developers. This paper presents the design and implementation of a low power, low noise amplifier aimed at IEEE 802.11a for WLAN applications. It was designed to be integrated with an active balun and mixer, representing the first step toward a fully integrated monolithic WLAN receiver. All the required circuits are integrated at the same die and are powered by 1.8V supply source. Preliminary experimental results (S-parameters) are shown and promise excellent results. The LNA circuit design details are illustrated in Section 2. Spectre simulation results focused at gain, noise figure (NF) and input/output matching are presented in Section 3. Finally, conclusions and comparison with other recently reported LNAs are made in Section 4, followed by future work.

Controlador Boundary-Scan

A crescente complexidade dos sistemas electrónicos associada a um desenvolvimento nas tecnologias de encapsulamento levou à miniaturização dos circuitos integrados, provocando dificuldades e limitações no diagnóstico e detecção de falhas, diminuindo drasticamente a aplicabilidade dos equipamentos ICT. Como forma de lidar com este problema surgiu a infra-estrutura Boundary Scan descrita na norma IEEE1149.1 “Test Access Port and Boundary-Scan Architecture”, aprovada em 1990. Sendo esta solução tecnicamente viável e interessante economicamente para o diagnóstico de defeitos, efectua também outras aplicações. O SVF surgiu do desejo de incutir e fazer com que os fornecedores independentes incluíssem a norma IEEE 1149.1, é desenvolvido num formato ASCII, com o objectivo de enviar sinais, aguardar pela sua resposta, segundo a máscara de dados baseada na norma IEEE1149.1. Actualmente a incorporação do Boundary Scan nos circuitos integrados está em grande expansão e consequentemente usufrui de uma forte implementação no mercado. Neste contexto o objectivo da dissertação é o desenvolvimento de um controlador boundary scan que implemente uma interface com o PC e possibilite o controlo e monitorização da aplicação de teste ao PCB. A arquitectura do controlador desenvolvido contém um módulo de Memória de entrada, um Controlador TAP e uma Memória de saída. A implementação do controlador foi feita através da utilização de uma FPGA, é um dispositivo lógico reconfiguráveis constituído por blocos lógicos e por uma rede de interligações, ambos configuráveis, que permitem ao utilizador implementar as mais variadas funções digitais. A utilização de uma FPGA tem a vantagem de permitir a versatilidade do controlador, facilidade na alteração do seu código e possibilidade de inserir mais controladores dentro da FPGA. Foi desenvolvido o protocolo de comunicação e sincronização entre os vários módulos, permitindo o controlo e monitorização dos estímulos enviados e recebidos ao PCB, executados automaticamente através do software do Controlador TAP e de acordo com a norma IEEE 1149.1. A solução proposta foi validada por simulação utilizando o simulador da Xilinx. Foram analisados todos os sinais que constituem o controlador e verificado o correcto funcionamento de todos os seus módulos. Esta solução executa todas as sequências pretendidas e necessárias (envio de estímulos) à realização dos testes ao PCB. Recebe e armazena os dados obtidos, enviando-os posteriormente para a memória de saída. A execução do trabalho permitiu concluir que os projectos de componentes electrónicos tenderão a ser descritos num nível de abstracção mais elevado, recorrendo cada vez mais ao uso de linguagens de hardware, no qual o VHDL é uma excelente ferramenta de programação. O controlador desenvolvido será uma ferramenta bastante útil e versátil para o teste de PCBs e outras funcionalidades disponibilizadas pelas infra-estruturas BS.