Extraction of MOSFET threshold voltage, series resistance, effective channel length, and inversion layer mobility from small-signal channel conductance measurement

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Autoria(s): Yeow, T.Y.T.; Kong, F. C. J.

Contribuinte(s)	D. Verret
Data(s)	01/01/2001
Identificador	http://espace.library.uq.edu.au/view/UQ:59916
Idioma(s)	eng
Publicador	IEEE
Palavras-Chave	#C1 #671201 Integrated circuits and devices #290902 Integrated Circuits
Tipo	Journal Article