Micro-Raman study of stress distribution in local isolation structures and correlation with transmission electron microscopy

Stress in local isolation structures is studied by micro‐Raman spectroscopy. The results are correlated with predictions of an analytical model for the stress distribution and with cross‐sectional transmission electron microscopy observations. The measurements are performed on structures on which the Si3N4 oxidation mask is still present. The influence of the pitch of the periodic local isolation pattern, consisting of parallel lines, the thickness of the mask, and the length of the bird"s beak on the stress distribution are studied. It is found that compressive stress is present in the Si substrate under the center of the oxidation mask lines, with a magnitude dependent on the width of the lines. Large tensile stress is concentrated under the bird"s beak and is found to increase with decreasing length of the bird"s beak and with increasing thickness of the Si3N4 film.

Polymorphous Si thin films from radio frequency plasmas of SiH4 diluted in Ar: A study by transmission electron microscopy and Raman spectroscopy

In this study, we present a detailed structural characterization by means of transmission electron microscopy and Raman spectroscopy of polymorphous silicon (pm-Si:H) thin films deposited using radio-frequency dust-forming plasmas of SiH4 diluted in Ar. Square-wave modulation of the plasma and gas temperature was varied to obtain films with different nanostructures. Transmission electron microscopy and electron diffraction have shown the presence of Si crystallites of around 2 nm in the pm-Si:H films, which are related to the nanoparticles formed in the plasma gas phase coming from their different growth stages, named particle nucleation and coagulation. Raman scattering has proved the role of the film nanostructure in the crystallization process induced ¿in situ¿ by laser heating.

Magnetic microstructures from magnetic force microscopy and Monte Carlo simulation in CoFe-Ag-Cu granular films

CoFe-Ag-Cu granular films, prepared by rf sputtering, displayed magnetic domain microstructures for ferromagnetic concentrations above about 32% at, and below the percolation threshold. All samples have a fcc structure with an (111) texture perpendicular to the film plane. Magnetic force microscopy (MFM) showed a variety of magnetic domain microstructures, extremely sensitive to the magnetic history of the sample, which arise from the balance of the ferromagnetic exchange, the dipolar interactions and perpendicular magnetocrystalline anisotropy, MFM images indicate that in virgin samples, magnetic bubble domains with an out-of-plane component of the magnetization are surrounded by a quasicontinuous background of opposite magnetization domains. The application of a magnetic field in different geometries drastically modifies the microstructure of the system in the remanent state: i) for an in-plane field, the MFM images show that most of the magnetic moments are aligned along the film plane, ii) for an out-of-plane field, the MFM signal increases about one order of magnitude, and out-of-plane striped domains with alternating up and down magnetization are stabilized. Numerical simulations show that a variety of metastable domain structures (similar to those observed experimentally) can be reached, depending on magnetic history, in systems with competing perpendicular anisotropy, exchange and dipolar interactions.

Nanometer-scale oxidation of Si(100) surfaces by tapping mode atomic force microscopy

The nanometer¿scale oxidation of Si(100) surfaces in air is performed with an atomic force microscope working in tapping mode. Applying a positive voltage to the sample with respect to the tip, two kinds of modifications are induced on the sample: grown silicon oxide mounds less than 5 nm high and mounds higher than 10 nm (which are assumed to be gold depositions). The threshold voltage necessary to produce the modification is studied as a function of the average tip¿to¿sample distance.

3D solutions in transmission electron (Cryo) -microscopy in biology

One of the main problems in transmission electron microscopy in thebiological field is the tri-dimensionality. This article explains the technicalprocedures and requirements to prepare biological specimens preserving themclosest to their native state to perform 3D reconstruction of the macromolecularcomplexes and cellular structures in their natural environment.

Transmission electron microscopy in cell biology: sample preparation techniques and image information

Transmission electron microscopy is a proven technique in the field of cell biology and a very useful tool in biomedical research. Innovation and improvements in equipment together with the introduction of new technology have allowed us to improve our knowledge of biological tissues, to visualizestructures better and both to identify and to locate molecules. Of all the types ofmicroscopy exploited to date, electron microscopy is the one with the mostadvantageous resolution limit and therefore it is a very efficient technique fordeciphering the cell architecture and relating it to function. This chapter aims toprovide an overview of the most important techniques that we can apply to abiological sample, tissue or cells, to observe it with an electron microscope, fromthe most conventional to the latest generation. Processes and concepts aredefined, and the advantages and disadvantages of each technique are assessedalong with the image and information that we can obtain by using each one ofthem.

Advanced applications of scanning electron microscopy in geology

Nowadays Scanning Electron Microscopy (SEM) is a basic and fundamental tool in the study of geologic samples. The collision of a highlyaccelerated electron beam with the atoms of a solid sample results in theproduction of several radiation types than can be detected and analysed byspecific detectors, providing information of the chemistry and crystallography ofthe studied material. From this point of view, the chamber of a SEM can beconsidered as a laboratory where different experiments can be carried out. Theapplication of SEM to geology, especially in the fields of mineralogy andpetrology has been summarised by Reed (1996).The aim of this paper is to showsome recent applications in the characterization of geologic materials.

Atomic force microscopy: probing the nanoworld

Atomic Force Microscope and related techniques have played a key role in the development of the nanotechnology revolution that is taking place in science. This paper reviews the basic principles behind the technique and its different operation modes and applications, pointing out research worksperformed in the Nanometric Techniques Unit of the CCiTUB in order to exemplify the vast array of capabilities of these instruments.

Biomedical and biological applications of scanning electron microscopy

This article summarizes the basic principles of scanning electron microscopy and the capabilities of the technique with different examples ofapplications in biomedical and biological research.

Advanced light microscopy techniques

This article summarizes the basic principles of light microscopy, with examples of applications in biomedicine that illustrate the capabilities of thetechnique.

Identificación de patologías causadas por el PVAc en Bienes Culturales

Esta contribución presenta el Proyecto de investigación que se está llevando a cabo en la Sección de Conservación¿Restauración de la Facultad de Bellas Artes de la Universidad de Barcelona desde el año 2006. El proyecto tiene por objetivo identificar los problemas que generan los tratamientos con PVAc, poliacetato de vinilo, en diversos bienes patrimoniales, así como el establecimiento de protocolos para la reversibilización del adhesivo. El trabajo se centra en los materiales de archivo, los materiales arqueológicos, la pinturasobre tela, sobre madera y la pintura mural por ser casos especialmente representativos de patrimonio en los que se ha utilizado este adhesivo y en los que se pueden detectar problemas derivados de su utilización. El estudio parte de la selección de obras originales procedentes de museos e instituciones colaboradoras que fueron tratadas con poliacetato de vinilo. De éstas obras se extrajeron muestras para caracterizar su composición y estado conservación. Una vez conocida la estructura de las obras se prepararon muestras probeta simulando las obras originales y se sometieron a un proceso de envejecimiento acelerado. A partir de estos simulacros se realizaron análisis para conocer los efectos derivados del uso del PVAc en tratamientos de conservación-restauración. Las técnicas de análisis empleadas fueron: medición de pH, espectroscopía de IR por transformada de Fourier (FTIR), análisis de pirolisis-cromatografía de gases / espectrometría de masas (Py-GC-MS), espectroscopia Raman por transformada de Fourier (FT-Raman), análisis de color, microscopía electrónica de barrido, espectroscopia de dispersión de rayos X (SEM-EDX) y microscopía óptica. Con la divulgación de los resultados acerca de la composición, pH, color, efectos del adhesivo sobre los soportes, propiedades mecánicas y reversibilización del adhesivo, obtenidos de las muestras probeta antes y después de la primera fase de envejecimiento acelerado, así como en unas muestras de adhesivos envejecidas de forma natural durante 10 años, se pretende fomentar la difusión y el intercambio de información entre los centros dedicados a la Conservación-Restauración del patrimonio.

Identificación de patologías causadas por el PVAc en Bienes Culturales

Esta contribución presenta el Proyecto de investigación que se está llevando a cabo en la Sección de Conservación¿Restauración de la Facultad de Bellas Artes de la Universidad de Barcelona desde el año 2006. El proyecto tiene por objetivo identificar los problemas que generan los tratamientos con PVAc, poliacetato de vinilo, en diversos bienes patrimoniales, así como el establecimiento de protocolos para la reversibilización del adhesivo. El trabajo se centra en los materiales de archivo, los materiales arqueológicos, la pinturasobre tela, sobre madera y la pintura mural por ser casos especialmente representativos de patrimonio en los que se ha utilizado este adhesivo y en los que se pueden detectar problemas derivados de su utilización. El estudio parte de la selección de obras originales procedentes de museos e instituciones colaboradoras que fueron tratadas con poliacetato de vinilo. De éstas obras se extrajeron muestras para caracterizar su composición y estado conservación. Una vez conocida la estructura de las obras se prepararon muestras probeta simulando las obras originales y se sometieron a un proceso de envejecimiento acelerado. A partir de estos simulacros se realizaron análisis para conocer los efectos derivados del uso del PVAc en tratamientos de conservación-restauración. Las técnicas de análisis empleadas fueron: medición de pH, espectroscopía de IR por transformada de Fourier (FTIR), análisis de pirolisis-cromatografía de gases / espectrometría de masas (Py-GC-MS), espectroscopia Raman por transformada de Fourier (FT-Raman), análisis de color, microscopía electrónica de barrido, espectroscopia de dispersión de rayos X (SEM-EDX) y microscopía óptica. Con la divulgación de los resultados acerca de la composición, pH, color, efectos del adhesivo sobre los soportes, propiedades mecánicas y reversibilización del adhesivo, obtenidos de las muestras probeta antes y después de la primera fase de envejecimiento acelerado, así como en unas muestras de adhesivos envejecidas de forma natural durante 10 años, se pretende fomentar la difusión y el intercambio de información entre los centros dedicados a la Conservación-Restauración del patrimonio.

New features of the layer-by-layer deposition of microcrystalline silicon films revealed by spectroscopic ellipsometry and high resolution transmission electron microscopy

Spectroscopic ellipsometry and high resolution transmission electron microscopy have been used to characterize microcrystalline silicon films. We obtain an excellent agreement between the multilayer model used in the analysis of the optical data and the microscopy measurements. Moreover, thanks to the high resolution achieved in the microscopy measurements and to the improved optical models, two new features of the layer-by-layer deposition of microcrystalline silicon have been detected: i) the microcrystalline films present large crystals extending from the a-Si:H substrate to the film surface, despite the sequential process in the layer-by-layer deposition; and ii) a porous layer exists between the amorphous silicon substrate and the microcrystalline silicon film.