Atomic force microscopy: probing the nanoworld
| Contribuinte(s) |
Universitat de Barcelona |
|---|---|
| Data(s) |
07/11/2013
|
| Resumo |
Atomic Force Microscope and related techniques have played a key role in the development of the nanotechnology revolution that is taking place in science. This paper reviews the basic principles behind the technique and its different operation modes and applications, pointing out research worksperformed in the Nanometric Techniques Unit of the CCiTUB in order to exemplify the vast array of capabilities of these instruments. Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166 |
| Identificador | |
| Idioma(s) |
eng |
| Publicador |
Centres Científics i Tecnològics. Universitat de Barcelona |
| Direitos |
(c) Universitat de Barcelona, 2012 info:eu-repo/semantics/openAccess |
| Palavras-Chave | #Microscòpia de força atòmica #Nanotecnologia #Anàlisi instrumental #Atomic force microscopy #Nanotechnology #Instrumental analysis |
| Tipo |
info:eu-repo/semantics/bookPart |
