Advanced applications of scanning electron microscopy in geology


Autoria(s): García Veigas, Francisco Javier; Prats Miralles, Eva; Domínguez Ximénez, Anna; Villuendas Latorre, Aránzazu
Contribuinte(s)

Universitat de Barcelona

Data(s)

28/09/2012

Resumo

Nowadays Scanning Electron Microscopy (SEM) is a basic and fundamental tool in the study of geologic samples. The collision of a highlyaccelerated electron beam with the atoms of a solid sample results in theproduction of several radiation types than can be detected and analysed byspecific detectors, providing information of the chemistry and crystallography ofthe studied material. From this point of view, the chamber of a SEM can beconsidered as a laboratory where different experiments can be carried out. Theapplication of SEM to geology, especially in the fields of mineralogy andpetrology has been summarised by Reed (1996).The aim of this paper is to showsome recent applications in the characterization of geologic materials.

Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166

Identificador

http://hdl.handle.net/2445/32147

Idioma(s)

eng

Publicador

Centres Científics i Tecnològics. Universitat de Barcelona

Direitos

(c) Universitat de Barcelona, 2012

info:eu-repo/semantics/openAccess

Palavras-Chave #Microscòpia electrònica d'escombratge #Geologia #Anàlisi instrumental #Scanning electron microscopy #Geology #Instrumental analysis
Tipo

info:eu-repo/semantics/bookPart