QUANTITATIVE-ANALYSIS OF INXGA1-XAS BY AUGER-ELECTRON SPECTROSCOPY

Quantitative Auger electron spectroscopy analysis for the ternary system InGa1-xAs grown by molecular-beam epitaxy has been studied. The relative sensitivity factors are determined by with an internal reference element. The matrix correction factor for In relative to Ga was shown to be 1.08. No preferential sputtering of As for the ternary compounds was found, and the sputter correction factor, K(s)InGa is 0.75. The results are compared with that measured by the x-ray double-crystal diffraction analysis, electron probe microanalysis, and Auger analysis without matrix and sputter corrections.

Determination of AlxGa1-xAs Auger sensitivity factors

AlxGa1-xAs Auger sensitivity factors have been determined by using PHI610 scanning Auger microprobe with pure elemental standards Al, Ag and matrix GaAs. The quantitative results of AlxGa1-xAs measured by the present method are in very good agreement with X-ray double crystal measurements. it is shown that by using sensitivity factors obtained from the self-instrument, the accuracy of the quantitative AES analysis can be considerably improved compared with that using elemental relative sensitivity factors given by the PHI handbook or internal standard method.

1.55μm InGaAsP/InP DH激光器中的0.95μm发光带与Auger复合

于2010-11-23批量导入

铜的价态光电子能谱和X光引发的Auger谱分析

在合金或化合物中，准确地确定铜的价态（Ｃｕ０、Ｃｕ＋、Ｃｕ２＋和Ｃｕ３＋）是很复杂的。采用Ｘ光电子能谱学中的峰位确认法、伴线指纹法、Ａｕｇｅｒ参数法是十分方便的。本文报道了有关，ＣｕＬ３Ｍ４５Ｍ４５电子结合能（ｅＶ）和动能（ｅＶ）标量的变化，讨论了标准样品金属铜、Ｃｕ２Ｏ、ＣｕＣｌ、ＣｕＯ、ＣｕＣｌ２及超导样品ＹＢａ２Ｃｕ３Ｏ７中铜的价态简捷鉴别法。

CHARACTERIZATION OF OXIDES AND HALOGENIDES OF CERIUM BY ESCA .2. AUGER PEAKS OF CE-M5N45N45

The larger chemical shift of cerium compounds was discoveried. The chemical states of the cerium compounds were identified by the chemical shifts of Auger energy. The changes in Anger energy and parameters are principally due to the changes in extra-atomic relaxation or polarization energy. The increase of the polarizable properties in anions of cerium compounds corresponds to the increase of Auger energy and parameter. The Auger parameter can be measured more accurately. Ce(CF3COO)(x)Cl-3-x was also studied by ESCA. It is shown that the electron density at cerium atom increases with the increase of x, while the electron density at oxygen atom decreases.