CARRIER LOSS RESULTING FROM AUGER RECOMBINATION IN INGAASP/INP DOUBLE HETEROJUNCTION LASER-DIODES - SPECTROSCOPY OF 950 NM HIGH-ENERGY EMISSION


Autoria(s): ZHUANG WH; ZHENG BZ; XU JY; LI YH; XU JH; CHEN PL
Data(s)

1985

Identificador

http://ir.semi.ac.cn/handle/172111/14735

http://www.irgrid.ac.cn/handle/1471x/101402

Idioma(s)

英语

Fonte

ZHUANG WH; ZHENG BZ; XU JY; LI YH; XU JH; CHEN PL.CARRIER LOSS RESULTING FROM AUGER RECOMBINATION IN INGAASP/INP DOUBLE HETEROJUNCTION LASER-DIODES - SPECTROSCOPY OF 950 NM HIGH-ENERGY EMISSION,IEEE JOURNAL OF QUANTUM ELECTRONICS,1985,21(6):712-715

Palavras-Chave #半导体器件
Tipo

期刊论文