高激光损伤阈值溶胶-凝胶ZrO2薄膜

采用醇热法水解氧氯化锆（ZrOCl2·8H2O）制备ZrO2溶胶，提拉法涂膜。采用粘度、粒度分布、折射率、IR、DSC、AFM等测试手段对溶胶和薄膜性能进行表征。结果表明，ZrO2溶胶颗粒的平均粒径为18．9nm，薄膜经300℃热处理后折射率可高达1．95，膜层表面均匀平整，表面平均粗糙度仅为0．561nm，膜层的激光损伤阈值为14J／cm^2（1064nm，1ns）。

Optical parameters and absorption of copper (II)-azo complexes thin films as optical recording media

Smooth thin films of three kinds of azo dyes of 2-(5'-tert-butyl-3'-azoxylisoxazole)-1, 3-diketones and their copper (II)-azo complexes were prepared by the spin-coating method. Absorption spectra of the thin films on a glass substrate in the 300-600 nm wavelength region were measured. Optical constants (complex refractive index N=n+ik) and thickness of the thin films prepared on single-crystal silicon substrate in the 300-600 nm wavelength region were investigated on rotating analyzer-polarizer type of scanning ellipsometer, and dielectric constants epsilon(epsilon=epsilon(1)+i epsilon(2)), absorption coefficients alpha as well as reflectance R of thin films were then calculated. In addition, one of the copper (II)-azo complex thin film prepared on glass substrate with an Ag reflective layer was also studied by atomic force microscopy (AFM) and static optical recording. AFM study shows that the copper (II)-azo complex thin film is very smooth and has a root mean square surface roughness of 1.89 nm. Static optical recording shows that the recording marks on the copper (II)-azo complex thin film are very clear and circular, and the size of the minimal recording marks can reach 200 nm. (c) 2004 Elsevier B.V. All rights reserved.

Optical properties of nickel(II)-azo complexes thin films for potential application as high-density recordable optical recording media

Smooth thin films of three kinds of nickel(II)-azo complexes were prepared by the spin-coating method. Absorption spectra of the thin films on K9 glass substrate in the 300-600 nn wavelength region were measured. Optical constants (complex refractive index N = n + ik) and thickness of the thin films prepared on single-crystal silicon substrate in the 300-600 nm wavelength region were investigated on rotating analyzer-polarizer type of scanning ellipsometer, and dielectric constants epsilon (epsilon = epsilon(1) + i epsilon(2)), absorption coefficients a as well as reflectance R of thin films were then calculated at 405 nm. In addition, in order to examine the possible use of nickel(II)-azo complex thin film as an optical recording medium, one of the nickel(II)-azo complex thin film prepared on K9 glass substrate with an Ag reflective layer was also studied by atomic force microscopy and static optical recording. The results show that the nickel(II)-azo complex thin film is smooth and has a root mean square surface roughness of 2.25 nm, and the recording marks on the nickel(II)-azo complex thin film are very clear and circular, and their size can reach 200 nn or less. (c) 2006 Elsevier Ltd. All rights reserved.

Optical fiber long-period grating with solgel coating for gas sensor

The novel long-period fiber grating (LPFG) film sensor is composed of the long-period grating coated with solgel-derived sensitive films. The characteristics of the transmissivity of the LPFG film sensor are studied. By analyzing the relation among the sensitivity S-n, the thin film optical parameters, and the fiber grating parameters, the optimal design parameters of the LPFG film sensor are obtained. Data simulation shows that the resolution of the refractive index of this LPFG film sensor is predicted to be 10(-8). Experimentally, a LPFG film sensor for detection Of C2H5OH was fabricated, and a preliminary gas-sensing test was performed. (c) 2006 Optical Society of America.

Low-temperature hydrothermal growth of oriented [0001] ZnO film

Well-aligned ZnO films have been successfully prepared by using low-temperature hydrothermal approach on (0001) sapphire substrates that were pre-coated with a ZnO nano-layer by dip-coating. The characterizations of scanning electron microscopy (SEM) and X-ray diffraction (XRD) indicate that the ZnO films consist of hexagonal rods that grow along the c axis based on the sapphire substrates. It is found that the size of ZnO rods can be adjusted by an aqueous solution with some methenamine. (c) 2006 Elsevier B.V. All rights reserved.

Anisotropic strain relaxation of thin Fe film on c(4 x 4) reconstructed GaAs (001) surface

National Natural Science Foundation of China 60836002 10674130 60521001;Major State Basic Research of China 2007CB924903;Chinese Academy of Sciences KJCX2.YW.W09-1

Giant Goos-Hanchen displacement enhanced by dielectric film in frustrated total internal reflection configuration

It is predicted that the Goos-Hanchen displacement in the usual frustrated total internal reflection configuration can be resonantly enhanced greatly by coating a dielectric thin film onto the surface of the first prism when the angle of incidence is larger than the critical angle for total reflection at the prism-vacuum interface and is smaller than but close to the critical angle for total reflection at the prism-film interface. Theoretical analysis shows that the displacement of transmitted beam is about half the displacement of reflected beam in the thick limit of the vacuum gap between the two prisms. This is to be compared with the relation in the usual symmetric double-prism configuration that the displacement of transmitted beam is equal to the displacement of reflected beam. Numerical simulations for a Gaussian incident beam of waist width of 100 wavelengths reveal that when the dielectric thin film is of the order of wavelength in thickness, both the reflected and transmitted beams maintain well the shape of the incident beam in the thick limit of the vacuum gap. So largely enhanced displacements would lead to applications in optical devices and integrated optics. (c) 2007 American Institute of Physics.

稀土配合物掺杂的中孔杂化发光材料的制备及其表征

稀土配合物由于具有优良的窄带发光性能和较长的荧光寿命，因而在光电学领域比如激光材料或者荧光标记上引起了广泛的兴趣和应用。吸附在固体表面的稀土配合物的发光性质得到了广泛的研究。MCM-48中孔材料是M41S家族中的一种，具有直径20-30A三维结构的中孔孔道，比MCM-41的一维结构孔道更有优势，比如它可以最大可能的避免客体分子的堆积现象。因此本论文中我们研究了将稀土（Eu3+）β-二酮（DBM＝dibenzoylmethane）配合物掺杂到纯硅MCM-48以及三种有机基团嫁接的有机－无机杂化MCM-48的孔道中去，得到了各种不同的杂化中孔发光材料。首先烧结后的MCM-48被装载稀土Eu（OBM）3'2H2O配合物之后。XRD结果说明稀土配合物被组装到了MCM-48中，其有序结构因为稀土配合物的进入而受到一定的影响，但是样品仍保持了MCM-48的立方相结构。分别通过吸收光谱和热失重的方法计算了掺杂后的发光MCM-48样品进行洗涤后留在MCM一48中配合物的量。固体漫反射光谱在紫外区有一个OBM配体的Sn基态能级（π）到S1激发态能级份＊）的电子跃迁形成的吸收宽带。可见区还观察到E护”离子的4f-4畴征吸收线。与稀土配合物中的OBM配体相比，掺杂MCM-48样品的Sn-S1吸收带均发生蓝移，反映了S1能级向高能方向移动。然后采用了室温两步合成法合成MCM-48，模板剂的去除采用了溶剂萃取法。最佳掺杂浓度为6.98×10-3 mol/l；同时最佳掺杂时间为24小时。在同样的掺杂条件下，稀土配合物在基质中的掺杂量MCM-48＞MCM-41＞＞SiO2。萃取之后的MCM-48在外形上近乎于球形，粒子的直径在0.7-1.2μm之间。粒子显现出多孔的海绵状表面形态，并且具有晶体结构外形，呈菱形十二面体被削去顶端立方体的结构。而且在粒子的表面观察到了类似螺旋结构的孔道，我们认为这是MCM一48所特有的双螺旋型三维孔道结构，这是到目前为止首次报道利用扫描电镜观察到中孔分子筛的孔道结构。荧光光谱结果观察到了激发峰的最大值由于纳米粒子效应出现的蓝移现象。不同基质中的发射系数QZ和04比较可知配合物在三种基质SiO2、MCM-41和MCM-48中环境的极性相差不大。掺杂到中孔MCM-48材料中的稀土配合物的热稳定性比在MCM-41中强，这是由于MCM-48的三维孔道对配合物的保护作用。室温条件下合成的MCM-48分子筛利用后合成嫁接的方法[post-synthesis grajng（PSG）]进行表面修饰，修饰剂选用了带有功能性乙烯基的VTES，链长最短的MTES以及带有氨基的长链NTSED。稀土Eu（DBM）3'2H2O配合物被组装到杂化中孔分子筛材料中。红外光谱与2951核磁共振光谱表明MCM-48的表面被成功的接枝上了有机M下任S，盯任s，N丁s任D基团。与MCM-48相比，MCM-48-R的表面积、孔体积和孔径的减少有以下NTSED＞VTES＞MTES的顺序。这也许是修饰的有机基团不同的链的长度不同的原因。稀土配合物在这三种有机一无机杂化基质环境的极性比纯硅MCM-48要增大。同时配合物在三种基质的中的QZ的值及发光效率的顺序为：MCM-48-MTES＜MCM-48-VTES＜MCM-48-NTSED，说明MCM-48经过三种有机硅氧烷修饰之后孔道极性也遵循同样的顺序，可以认为这是由于三种有机基团的链长的不同造成的，链长越长则修饰之后孔道极性增大的就越多。最后通过溶胶一凝胶过程利用提拉法（Dip-coating method）制备了具有中孔结构的SiO2-CTAB-Tb（acac）3透明发光薄膜（Mesostructed Iuminescence thin film，略为MLTF），稀土配合物利用原位合成（In-situ）的办法掺入到透明薄膜中。对薄膜进行热处理过程表明薄膜中的稀土配合物在50℃的时候开始形成。XRO结果表明稀土离子及有机配体的掺入对薄膜中孔相的结构没有太大的影响，荧光薄膜仍保持层状结构。红外光谱结果说明制备的中孔薄膜是由CTAB和硅氧烷聚合物组成的复合薄膜。荧光薄膜的发射光谱给出了Th3+离子的特征发射峰，荧光薄膜中有机配体与丁b离子之间发生了能量传递现象。因为在热处理过程中有机配体逐渐代替了开始与Tb离子配位的OH基团，使得二者间的能量传递更加有效，从而导致了荧光的增强。

Probing structural changes of spin-coated polystyrene film after swelling and precipitation by synchrotron GIUSAXS and AFM

Polystyrenc film of about 50 nm in thickness on silicon wafer was obtained by spin-coating in tetrahydrofuran solution.The film exhibits a rough surface as shown by atomic force microscopy images and ellipsometry data.

Coating Gd2O3 : Eu phosphors with silica by solid-state reaction at room temperature

Silica coating on Gd2O3:Eu particles was obtained by a simple method, e.g. solid-state reaction at room temperature. The urea homogeneous precipitation method was used to synthesize the Gd2O3:Eu cores. Transmission electron microscopy (TEM) shows that the core particles are spherical with submicrometer size which is the soft agglomerates with nanometer crystallites. The TEM morphology of coated particles shows that a thin film is coated on the surface of Gd2O3:Eu cores. Scanning electron microscopy (SEM) and energy-dispersive spectrometer (EDS) analysis indicate that the coating of silica can be used to avoid agglomeration of Gd2O3:Eu particles to obtain smaller particles. X-ray photoelectron spectra (XPS) show that silica is coated on the surface of core particles by forming the chemical bond. Photoluminescence (PL) spectra conform that Gd2O3:Eu phosphors remain well-luminescent properties by the silica coating.

Surface morphology evolution of a thin polymeric supramolecular film by tuning interactions

A polymeric supramolecule consisting of symmetric polystyrene-block-poly(4-vinylpytidine) (PS-b-P4VP), dodecylbenzenesulfonic acid (DBSA), and 3-pentadecylphenol (PDP) was formed by proton transfer and hydrogen bonding. The surface morphology,of a thin film of the polymeric supramolecule has been investigated. The spherical PS microdomains embedded in a P4VP(DBSA)(1.0)(PDP)(1.0) matrix are observed for the as-cast film because the weight fraction, f(comb), of the P4VP(DBSA) (1.0)(PDP)(1.0) blocks is much higher than that of PS as a result of the non-covalent interactions of P4VP and DBSA and DBSA and PDR Upon annealing the PS-b-P4VP(1:1)(DBSA)(1.0)(PDP)(1.0) film at high temperatures, the hydrogen bonding between the DBSA and PDP diminishes, which leads to a change of overall morphology from an ordered sphere to a pitted structure.

Photoluminescent properties of sol-gel derived (La, Gd)MgB5O10 : Ce3+/Tb3+ nanocrystalline thin films

Ce3+ and/or Tb3+-doped (La,Gd)MgB5O10 nanocrystalline thin films were deposited on silica glass substrates by a sol-gel dip-coating process using triethyl borate B(OC2H5)(3) as the boron source. The results of XRD indicated that the films have fully crystallized after annealing at 800 degrees C. The films are transparent, uniform and crack free with a thickness of about 300 nm, consisting of particles with an average grain size of 50 nm. The luminescence and energy transfer properties of Ce3+ and Tb3+ have been studied in the films. It is confirmed that the excitation energy of Ce3+ transfers to the Gd3+, migrates over the Gd3+ sublattices, trapped by the Tb3+ and resulted in its characteristic green emission (D-5(4)-F-7(5) at 543 nm) in GdMgB5O10 nanocrystalline films as in the powder phosphors.

Sol-gel synthesis and photoluminescent properties of LaPO4 : A (A = Eu3+, Ce3+, Tb3+) nanocrystalline thin films

Rare-earth ion (Eu3+, Tb3+, Ce3+)- doped LaPO4 nanocrystalline thin films and their patterning were fabricated by a Pechini sol-gel process combined with soft lithography on silicon and silica glass substrates. X-Ray diffraction (XRD), Fourier transform infrared spectroscopy (FT-IR), thermogravimetric and differential thermal analysis (TG-DTA), atomic force microscopy (AFM), scanning electron microcopy (SEM), optical microscopy, absorption and photoluminescence (PL) spectra as well as lifetimes were used to characterize the resulting films. The results of XRD indicate that the films begin to crystallize at 700 degreesC and the crystallinity increases with increasing annealing temperature. The morphology of the thin film depends on the annealing temperature and the number of coating layers. The 1000 degreesC annealed single layer film is transparent to the naked eye, uniform and crack-free with a thickness of about 200 nm and an average grain size of 100 nm. Patterned thin films with different strip widths ( 5 - 50 mm) were obtained by micromolding in capillaries ( soft lithography). The doped rare earth ions show their characteristic emission in the nanocrystalline LaPO4 films, i.e., Eu3+ D-5(0)-F-7(J) (J = 1, 2, 3, 4), Tb3+ D-5(3,4) - F-7(J) ( J = 6, 5, 4, 3, 2) and Ce3+ 5d-4f transition emissions, respectively. Both the lifetimes and the PL intensities of Eu3+ and Tb3+ increase with increasing annealing temperature, and the optimum concentrations for them were determined to be 5 mol% and 16 mol% of La3+ in LaPO4 thin films, respectively. An energy transfer phenomenon from Ce3+ to Tb3+ has been observed in LaPO4 nanocrystalline thin films, and the energy transfer efficiency depends on the doping concentration of Tb3+ if the concentration of Ce3+ is fixed.

Electrochemical study of isopoly- and heteropoly-oxometallates film modified microelectrodes .6. Preparation and redox properties of 12-molybdophosphoric acid and 12-molybdosilicic acid modified carbon fiber microelectrodes

The redox behaviours of 12-molybdophosphoric acid (12-MPA) and 12-molybdosilicic acid (12-MSA) in aqueous acid media are characterized at the carbon fiber (CF) microelectrode. The preparation of CF microelectrode modified with 12-MPA or 12-MSA monolayer and the oxidation-reduction properties of the modified electrode in aqueous acid media or 50% (v/v) water-organic media containing some inorganic acids are studied by cyclic voltammetry. 12-MPA or 12-MSA monolayer modified CF microelectrode with high stability and redox reversibility in aqueous acidic media can be prepared by simple dip coating. The cyclic voltammograms of 12-MPA and 12-MSA and their modified CF microelectrodes in aqueous acid solution exhibit three two-electron reversible waves with the same half-wave potentials, which defines that the species adsorbed on the CF electrode surface are 12-MPA and 12-MSA themselves. The acidity of electrolyte solution, the organic solvents in the electrolyte solution, and the scanning potential range strongly influence on the redox behaviours and stability of 12-MPA or 12-MSA monolayer modified electrodes. On the other hand, the catalytic effects of the 12-MPA and 12-MSA and chlorate anions in aqueous acidic solution on the electrode reaction processes of 12-MPA or 12-MSA are described.

七氟丁酸酐有序超薄膜的制备与结构

在涂敷有聚合物PEI涂层的单晶硅表面上制备了HFBA单层分子膜,接触角测量及XPS结果表明,HFBA在PEI表面产生了化学吸附发生了化学键合(酰胺键),形成了低表面能的HFBA单分子层膜.这一吸附反应的动力学行为可能表现为Langmuir单分子层化学吸附.