Probing structural changes of spin-coated polystyrene film after swelling and precipitation by synchrotron GIUSAXS and AFM
| Data(s) |
2009
|
|---|---|
| Resumo |
Polystyrenc film of about 50 nm in thickness on silicon wafer was obtained by spin-coating in tetrahydrofuran solution.The film exhibits a rough surface as shown by atomic force microscopy images and ellipsometry data. |
| Identificador | |
| Idioma(s) |
英语 |
| Fonte |
Sun BB,Lai YQ,Kim Y,Men YF.Probing structural changes of spin-coated polystyrene film after swelling and precipitation by synchrotron GIUSAXS and AFM,Frontiers of Chemistry in China,2009,4(3):265-268 |
| Palavras-Chave | #thin film #polystyrene #grazing incidence small angle X-ray scattering #morphology |
| Tipo |
期刊论文 |
