A standard for RF modulation factor /

Report No. FAA-RD-79-94." Microfiche.

A temperature probe for radio-frequency heated material /

"January 1981."

A Bibliography of publications in the NBS Electromagnetic Fields Division /

"November 1980."

Accurate linewidth measurements on integrated-circuit photomasks /

"Supported by the Defense Advanced Research Projects Agency ... and the National Bureau of Standards."

Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures /

S/N 003-003-02297-7.

Electromagnetic boundary-value problems based upon a modification of residue calculus and function theoretic techniques /

Mode of access: Internet.

Refrigeration for cryogenic sensors and electronic systems : proceedings of a conference held at the National Bureau of Standards, Boulder, CO, October 6-7, 1980 /

Item 247.

Electrical engineering : an elementary textbook suitable for persons employed in the mechanical and electrical engineering trades /

Mode of access: Internet.

Discussion of the precision of measurements : with examples taken mainly from physics and electrical engineering /

Advertising section at the end of the book.

Multinational enterprises and technological effort by local firms:a case study of the Malaysian electronics and electrical industry

It is often assumed that foreign MNEs are the driving force behind technological development in developing economies but it has become evident in recent years that the actions of MNEs in isolation from the domestic economy. The study, therefore, examines the determinants of local firms' decisions to undertake technological effort, not only in isolation, but also in the context of linkages between domestic firms and MNEs. There is evidence that linkages between MNEs and local firms are important in explaining technological effort by local firms but direct technological assistance from MNEs does not seem to play a major role in fostering increased technological effort by local firms.

Catalogue of the naval and marine engineering collection in the science division of the Victoria and Albert museum, South Kensington.

Mode of access: Internet.

Remote learning and laboratory center over Internet and ISDN

Recent advances in telecommunications technologies have transformed the modes of learning and teaching. One potentially vital component in the equation will be Remote Education or Remote Learning, the ability to compress time and space between teachers and students through the judicious application of technology. The purpose of this thesis is to develop a Remote Learning and Laboratory Center over the Internet and ISDN, which provide education and access to resources to those living in remote areas, children in hospitals and traveling families, with audio, video and data.^ Remote Learning and Laboratory Center (RLLC) is not restricted to merely traditional education processes such as universities or colleges, it can be very useful for companies to train their engineers, via networks. This capability will facilitate the best use of scarce, high quality educational resources and will bring equity of services to students as well as will be helpful to the Industries to train their engineers. The RLLC over the Internet and ISDN has been described in details and implemented successfully. For the Remote Laboratory, the experiment procedure has been demonstrated on reprogrammable CPLD design using ISR Kit. ^

A bibliography of selected AEC reports of interest to industry.

Includes bibliographical references.

Annual report of the Division of Risk Assessment, National Center for Devices and Radiological Health /

Mode of access: Internet.

Ionized cluster beam deposition, and thin film analysis

In 1972 the ionized cluster beam (ICB) deposition technique was introduced as a new method for thin film deposition. At that time the use of clusters was postulated to be able to enhance film nucleation and adatom surface mobility, resulting in high quality films. Although a few researchers reported singly ionized clusters containing 10$\sp2$-10$\sp3$ atoms, others were unable to repeat their work. The consensus now is that film effects in the early investigations were due to self-ion bombardment rather than clusters. Subsequently in recent work (early 1992) synthesis of large clusters of zinc without the use of a carrier gas was demonstrated by Gspann and repeated in our laboratory. Clusters resulted from very significant changes in two source parameters. Crucible pressure was increased from the earlier 2 Torr to several thousand Torr and a converging-diverging nozzle 18 mm long and 0.4 mm in diameter at the throat was used in place of the 1 mm x 1 mm nozzle used in the early work. While this is practical for zinc and other high vapor pressure materials it remains impractical for many materials of industrial interest such as gold, silver, and aluminum. The work presented here describes results using gold and silver at pressures of around 1 and 50 Torr in order to study the effect of the pressure and nozzle shape. Significant numbers of large clusters were not detected. Deposited films were studied by atomic force microscopy (AFM) for roughness analysis, and X-ray diffraction.^ Nanometer size islands of zinc deposited on flat silicon substrates by ICB were also studied by atomic force microscopy and the number of atoms/cm$\sp2$ was calculated and compared to data from Rutherford backscattering spectrometry (RBS). To improve the agreement between data from AFM and RBS, convolution and deconvolution algorithms were implemented to study and simulate the interaction between tip and sample in atomic force microscopy. The deconvolution algorithm takes into account the physical volume occupied by the tip resulting in an image that is a more accurate representation of the surface.^ One method increasingly used to study the deposited films both during the growth process and following, is ellipsometry. Ellipsometry is a surface analytical technique used to determine the optical properties and thickness of thin films. In situ measurements can be made through the windows of a deposition chamber. A method for determining the optical properties of a film, that is sensitive only to the growing film and accommodates underlying interfacial layers, multiple unknown underlayers, and other unknown substrates was developed. This method is carried out by making an initial ellipsometry measurement well past the real interface and by defining a virtual interface in the vicinity of this measurement. ^