Dynamic pricing for used products in remanufacturing with back orders(ABS 3* Journal, Accepted with Revision on 2nd December 2011).

In remanufacturing, the supply of used products and the demand for remanufactured products are usually mismatched because of the great uncertainties on both sides. In this paper, we propose a dynamic pricing policy to balance this uncertain supply and demand. Specifically, we study a remanufacturer’s problem of pricing a single class of cores with random price-dependent returns and random demand for the remanufactured products with backlogs. We model this pricing task as a continuous-time Markov decision process, which addresses both the finite and infinite horizon problems, and provide managerial insights by analyzing the structural properties of the optimal policy. We then use several computational examples to illustrate the impacts of particular system parameters on pricing policy.

2ND-HARMONIC LIGHT GENERATION IN THE INTERACTION OF LASER-BEAMS WITH UNDERCRITICAL PLASMAS

The process of second harmonic generation (SHG) in undercritical plasmas is studied. It is shown that filamentation and self-focusing of the laser beam in the plasma can break the plasma density symmetry and lead to SHG by free electrons. In turn, second harmonic emission may be used to investigate the plasma parameters and to diagnose the process of laser beam filamentation itself.

SPECTRALLY MODULATED 2ND-HARMONIC EMISSION FROM LASER-PLASMA FILAMENTS

Spectra of forward emitted second harmonic light from laser interaction with filamentary plasmas have been experimentally studied. Rather regular modulations in the frequency domain have been observed into overall red-shifted spectra. The observed spectral features are consistent with self-phase-modulation of the intense laser light in growing filaments. A model accounts for this effect.

Design and test of a bit parallel 2nd order IIR filter structure

Test procedures for a pipelined bit-parallel IIR filter chip which maximally exploit its regularity are described. It is shown that small modifications to the basic architecture result in significant reductions in the number of test patterns required to test such chips. The methods used allow 100% fault coverage to be achieved using less than 1000 test vectors for a chip which has 12 bit data and coefficients.