941 resultados para discrete Fourier transform


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Architectures and methods for the rapid design of silicon cores for implementing discrete wavelet transforms over a wide range of specifications are described. These architectures are efficient, modular, scalable, and cover orthonormal and biorthogonal wavelet transform families. They offer efficient hardware utilization by exploiting a number of core wavelet filter properties and allow the creation of silicon designs that are highly parameterized, including in terms of wavelet type and wordlengths. Control circuitry is embedded within these systems allowing them to be cascaded for any desired level of decomposition without any interface glue logic. The time to produce chip designs for a specific wavelet application is typically less than a day and these are comparable in area and performance to handcrafted designs. They are also portable across a wide range of silicon foundries and suitable for field programmable gate array and programmable logic data implementation. The approach described has also been extended to wavelet packet transforms.

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The ability of Raman spectroscopy and Fourier transform infrared (FT-IR) microscopy to discriminate between resins used for the manufacture of architectural finishes was examined in a study of 39 samples taken from a commercial resin library. Both Raman and FT-IR were able to discriminate between different types of resin and both split the samples into several groups (six for FT-IR, six for Raman), each of which gave similar, but not identical, spectra. In addition, three resins gave unique Raman spectra (four in FTIR). However, approximately half the library comprised samples that were sufficiently similar that they fell into a single large group, whether classified using FT-IR or Raman, although the remaining samples fell into much smaller groups. Further sub-division of the FT-IR groups was not possible because the experimental uncertainty was of similar magnitude to the within-group variation. In contrast, Raman spectroscopy was able to further discriminate between resins that fell within the same groups because the differences in the relative band intensities of the resins, although small, were larger than the experimental uncertainty.

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A 64-point Fourier transform chip is described that performs a forward or inverse, 64-point Fourier transform on complex two's complement data supplied at a rate of 13.5MHz and can operate at clock rates of up to 40MHz, under worst-case conditions. It uses a 0.6µm double-level metal CMOS technology, contains 535k transistors and uses an internal 3.3V power supply. It has an area of 7.8×8mm, dissipates 0.9W, has 48 pins and is housed in a 84 pin PLCC plastic package. The chip is based on a FFT architecture developed from first principles through a detailed investigation of the structure of the relevant DFT matrix and through mapping repetitive blocks within this matrix onto a regular silicon structure.

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A bit level systolic array system is proposed for the Winograd Fourier transform algorithm. The design uses bit-serial arithmetic and, in common with other systolic arrays, features nearest-neighbor interconnections, regularity and high throughput. The short interconnections in this method contrast favorably with the long interconnections between butterflies required in the FFT. The structure is well suited to VLSI implementations. It is demonstrated how long transforms can be implemented with components designed to perform a short length transform. These components build into longer transforms preserving the regularity and structure of the short length transform design.

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A bit-level systolic array system is proposed for the Winograd Fourier transform algorithm. The design uses bit-serial arithmetic and, in common with other systolic arrays, features nearest neighbor interconnections, regularity, and high throughput. The short interconnections in this method contrast favorably with the long interconnections between butterflies required in the FFT. The structure is well suited to VLSI implementations. It is demonstrated how long transforms can be implemented with components designed to perform short-length transforms. These components build into longer transforms, preserving the regularity and structure of the short-length transform design.

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A generator for the automated design of Discrete Cosine Transform (DCT) cores is presented. This can be used to rapidly create silicon circuits from a high level specification. These compare very favourably with existing designs. The DCT cores produced are scaleable in terms of point size as well as input/output and coefficient wordlengths. This provides a high degree of flexibility. An example, 8-point 1D DCT design, produced occupies less than 0.92 mm when implemented in a 0.35µ double level metal CMOS technology. This can be clocked at a rate of 100MHz.

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White household paints are commonly encountered as evidence in the forensic laboratory but they often cannot be readily distinguished by color alone so Fourier transform infrared (FT-IR) microscopy is used since it can sometimes discriminate between paints prepared with different organic resins. Here we report the first comparative study of FT-IR and Raman spectroscopy for forensic analysis of white paint. Both techniques allowed the 51 white paint samples in the study to be classified by inspection as either belonging to distinct groups or as unique samples. FT-IR gave five groups and four unique samples; Raman gave seven groups and six unique samples. The basis for this discrimination was the type of resin and/ or inorganic pigments/extenders present. Although this allowed approximately half of the white paints to be distinguished by inspection, the other half were all based on a similar resin and did not contain the distinctive modifiers/pigments and extenders that allowed the other samples to be identified. The experimental uncertainty in the relative band intensities measured using FT-IR was similar to the variation within this large group, so no further discrimination was possible. However, the variation in the Raman spectra was larger than the uncertainty, which allowed the large group to be divided into three subgroups and four distinct spectra, based on relative band intensities. The combination of increased discrimination and higher sample throughput means that the Raman method is superior to FT-IR for samples of this type. © 2005 Society for Applied Spectroscopy.