980 resultados para Drop Test Equipment.


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Abstract—DC testing of parametric faults in non-linear analog circuits based on a new transformation, entitled, V-Transform acting on polynomial coefficient expansion of the circuit function is presented. V-Transform serves the dual purpose of monotonizing polynomial coefficients of circuit function expansion and increasing the sensitivity of these coefficients to circuit parameters. The sensitivity of V-Transform Coefficients (VTC) to circuit parameters is up to 3x-5x more than sensitivity of polynomial coefficients. As a case study, we consider a benchmark elliptic filter to validate our method. The technique is shown to uncover hitherto untestable parametric faults whose sizes are smaller than 10 % of the nominal values. I.

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Scan circuit is widely practiced DFT technology. The scan testing procedure consist of state initialization, test application, response capture and observation process. During the state initialization process the scan vectors are shifted into the scan cells and simultaneously the responses captured in last cycle are shifted out. During this shift operation the transitions that arise in the scan cells are propagated to the combinational circuit, which inturn create many more toggling activities in the combinational block and hence increases the dynamic power consumption. The dynamic power consumed during scan shift operation is much more higher than that of normal mode operation.

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A geometric and non parametric procedure for testing if two finite set of points are linearly separable is proposed. The Linear Separability Test is equivalent to a test that determines if a strictly positive point h > 0 exists in the range of a matrix A (related to the points in the two finite sets). The algorithm proposed in the paper iteratively checks if a strictly positive point exists in a subspace by projecting a strictly positive vector with equal co-ordinates (p), on the subspace. At the end of each iteration, the subspace is reduced to a lower dimensional subspace. The test is completed within r ≤ min(n, d + 1) steps, for both linearly separable and non separable problems (r is the rank of A, n is the number of points and d is the dimension of the space containing the points). The worst case time complexity of the algorithm is O(nr3) and space complexity of the algorithm is O(nd). A small review of some of the prominent algorithms and their time complexities is included. The worst case computational complexity of our algorithm is lower than the worst case computational complexity of Simplex, Perceptron, Support Vector Machine and Convex Hull Algorithms, if d

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This paper is focused on the development of a model for predicting the mean drop size in effervescent sprays. A combinatorial approach is followed in this modeling scheme, which is based on energy and entropy principles. The model is implemented in cascade in order to take primary breakup (due to exploding gas bubbles) and secondary breakup (due to shearing action of surrounding medium) into account. The approach in this methodology is to obtain the most probable drop size distribution by maximizing the entropy while satisfying the constraints of mass and energy balance. The comparison of the model predictions with the past experimental data is presented for validation. A careful experimental study is conducted over a wide range of gas-to-liquid ratios, which shows a good agreement with the model predictions: It is observed that the model gives accurate results in bubbly and annular flow regimes. However, discrepancies are observed in the transitional slug flow regime of the atomizer.

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A method of precise measurement of on-chip analog voltages in a mostly-digital manner, with minimal overhead, is presented. A pair of clock signals is routed to the node of an analog voltage. This analog voltage controls the delay between this pair of clock signals, which is then measured in an all-digital manner using the technique of sub-sampling. This sub-sampling technique, having measurement time and accuracy trade-off, is well suited for low bandwidth signals. This concept is validated by designing delay cells, using current starved inverters in UMC 130nm CMOS process. Sub-mV accuracy is demonstrated for a measurement time of few seconds.

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Creep properties of QE22 magnesium based alloy and composites reinforced with 20 volume percent of short-fibers - Maftech (R), Saffil (R) or Supertech (R), were evaluated using the impression creep test. In the impression creep test, a load is applied with the help of a cylindrical tungsten carbide indenter of 1 mm diameter. This has advantages over conventional creep testing in terms of small specimen size requirement and simple machining. Depth of impression is recorded with time and steady state strain rate is obtained from the slope of the secondary strain (depth of impression divided by indenter diameter) vs. time plot. The results are compared with the creep obtained from conventional creep performed in tension on the same materials earlier. Microstructural examination of the plastically deformed regions is carried out to explain creep behaviour of these composites.