845 resultados para Education, Tests and Measurements|Education, Technology of


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Technological investment is an important driver of innovation and the evaluation of technology potential is becoming increasingly important in this context. Although there is a range of possible approaches and tools for understanding and communicating the value of technology to potential customers, not all are useful or accessible in practice, where the situation is often complex and constantly evolving. Although many companies have their own customised processes in place for securing approval for technology development, often combining several techniques, very few empirical studies have been performed to learn from these practices and provide an overall view of the process of ";selling"; technologies internally or externally. In this paper, the current literature and practice related to technology valuation is reviewed and summarised in a five step process for building a business case for technology investment that gives guidance on where and when to use specific valuation tools. The seller or proposer's perspective is taken and consultative sales techniques incorporated. This provides a flexible reference for R&D managers and adds to the body of literature on the selection and use of valuation tools. A user friendly guide has been published detailing the five step approach. © 2011 IEEE.

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This brochure suggests casting a wider net when dealing with governance assessment to include other players.

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This research proposes a method for extracting technology intelligence (TI) systematically from a large set of document data. To do this, the internal and external sources in the form of documents, which might be valuable for TI, are first identified. Then the existing techniques and software systems applicable to document analysis are examined. Finally, based on the reviews, a document-mining framework designed for TI is suggested and guidelines for software selection are proposed. The research output is expected to support intelligence operatives in finding suitable techniques and software systems for getting value from document-mining and thus facilitate effective knowledge management. Copyright © 2012 Inderscience Enterprises Ltd.

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Measurements and predictions are made of a short-cowl coflowing jet with a bypass ratio of 8:1. The Reynolds number is 300,000, and the inlet Mach numbers are representative of aeroengine conditions. The low Reynolds number of the measurements makes the case well suited to the assessment of large-eddy-simulation-related strategies. The nozzle concentricity is carefully controlled to deal with the emerging metastability issues of jets with coflow. Measurements of mean quantities and turbulence statistics are made using both laser Doppler anemometry and particle image velocimetry. The simulations are completed on 6× 106, 12× 106, and 50 × 106 cell meshes. To overcome near-wall modeling problems, a hybrid large-eddy-simulation-Reynolds-averaged-Navier-Stokesrelated method is used. The near-wall Reynolds-averaged-Navier-Stokes layer is helpful in preventing nonphysical separation from the nozzle wall.Copyright © 2010 by the American Institute of Aeronautics and Astronautics, Inc.

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Fluids with controllable flow properties have gained considerable interest in the past few years. Some of these fluids such as magnetorheologic fluids are now widely applied to active dampers and valves. Although these fluids show promising properties for microsystems, their applicability is limited to the microscale since particles suspended in these fluids tend to obstruct microchannels. This paper investigates the applicability of electrorheologic liquid crystals (LCs) in microsystems. Since LCs do not contain suspended particles, they show intrinsic advantages over classic rheologic fluids in micro-applications. This paper presents a novel physical model that describes the static and the dynamic behaviour of electrorheologic LCs. The developed model is validated by comparing simulations and measurements performed on a rectangular microchannel. This assessment shows that the model presented in this paper is able to simulate both static and dynamic properties accurately. Therefore, this model is useful for the understanding, simulation and optimization of devices using LCs as electrorheological fluid. In addition, measurements performed in this paper reveal remarkable properties of LCs, such as high bandwidths and high changes in flow resistance. © 2006 IOP Publishing Ltd.

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Semi-insulating (SI) InP wafers of 2 and 3 in. diameters have been prepared by annealing undoped LEC InP at 930 degreesC for 80 h under pure phosphorus ambient (PP) and iron phosphide ambient (IP). The electrical uniformity of annealed undoped SI wafers, along with a Fe-doped as-grown SI LEC InP wafer, has been characterized by whole wafer PL mapping and radial Hall measurements. Defects in these wafers have been detected by photo-induced current transient spectroscopy (PICTS). The results indicated that the uniformity of IP wafer is much better than that of PP wafer and as-grown Fe-doped Si InP wafer. There are fewer traps in undoped SI InP IP wafer than in as grown Fe-doped and undoped SI InP PP wafer, as evidenced by PICTS. The good uniformity of the IP wafer is related to the nonexistence of high concentration of thermally induced defects. The mechanism for this phenomenon is discussed based on the results. (C) 2002 Elsevier Science B.V. All rights reserved.

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Semi-insulating (SI) InP wafers of 2 and 3 in. diameters have been prepared by annealing undoped LEC InP at 930 degreesC for 80 h under pure phosphorus ambient (PP) and iron phosphide ambient (IP). The electrical uniformity of annealed undoped SI wafers, along with a Fe-doped as-grown SI LEC InP wafer, has been characterized by whole wafer PL mapping and radial Hall measurements. Defects in these wafers have been detected by photo-induced current transient spectroscopy (PICTS). The results indicated that the uniformity of IP wafer is much better than that of PP wafer and as-grown Fe-doped Si InP wafer. There are fewer traps in undoped SI InP IP wafer than in as grown Fe-doped and undoped SI InP PP wafer, as evidenced by PICTS. The good uniformity of the IP wafer is related to the nonexistence of high concentration of thermally induced defects. The mechanism for this phenomenon is discussed based on the results. (C) 2002 Elsevier Science B.V. All rights reserved.

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Radiation-use efficiency (RUE, g/MJ) and the harvest index (HI, unitless) are two helpful characteristics in interpreting crop response to environmental and climatic changes. They are also increasingly important for accurate crop yield simulation, but they are affected by various environmental factors. In this study, the RUE and HI of winter wheat and their relationships to canopy spectral reflectance were investigated based on the massive field measurements of five nitrogen (N) treatments. Crop production can be separated into light interception and RUE. The results indicated that during a long period of slow growth from emergence to regreening, the effect of N on crop production mainly showed up in an increased light interception by the canopy. During the period of rapid growth from regreening to maturity, it was present in both light interception and RUE. The temporal variations of RUEAPAR (aboveground biomass produced per unit of photosynthetically active radiation absorbed by the canopy) during the period from regreening to maturity had different patterns corresponding to the N deficiency, N adequacy and N-excess conditions. Moreover, significant relationships were found between the RUEAPAR and the accumulative normalised difference vegetation index (NDVI) in the integrated season (R-2 = 0.68), between the HI and the accumulative NDVI after anthesis (R-2 = 0.89), and between the RUEgrain (ratio of grain yield to the total amount of photosynthetically active radiation absorbed by the canopy) and the accumulative NDVI of the whole season (R-2 = 0.89) and that after anthesis (R-2 = 0.94). It suggested that canopy spectral reflectance has the potential to reveal the spatial information of the RUEAPAR, HI and RUEgrain. It is hoped that this information will be useful in improving the accuracy of crop yield simulation in large areas.