Parametric studies of tension leg platform with large amplitude motions

Tension leg platform (TLP) is an important kind of working station for deep water exploration and development in ocean, whose dynamic responses deserve a serious thought. It is shown that for severe sea state, the effects of nonlinearities induced by large displacements of TLP may be noteworthy, and then employment of small displacements model should be restrained. In such situation, large amplitude motion model may be an appropriate alternative. The numerical experiments are performed to study the differences of dynamic responses between the two models. It is shown that for most cases, differences between results of the two models are significant. The variances of the differences vs. the wave period are the most remarkable, and that of the differences vs. wave heading angle are also apparent.

Instability Analysis Of Torsional Mems/Nems Actuators Under Capillary Force

The static and dynamic instabilities of a torsional MEMS/NEMS actuator caused by capillary effects are studied, respectively. An instability number, eta, is defined, and the critical gap distance, g(cr), between the mainplate and the substrate is derived. According to the values of eta and g, the instability criteria of the actuator are presented. The dimensionless motion equation of the MEMS/NEMS torsional actuator is derived when it makes nonlinear oscillation under capillary force. The qualitative analysis of the nonlinear equation is made, and the phase portraits are presented on the phase plane. In addition, the bifurcation phenomena in the system are also analyzed. (C) 2008 Elsevier Inc. All rights reserved.

A thin liquid film and its effects in an atomic force microscopy measurement

Recently, it has been observed that a liquid film spreading on a sample surface will significantly distort atomic force microscopy (AFM) measurements. In order to elaborate on the effect, we establish an equation governing the deformation of liquid film under its interaction with the AFM tip and substrate. A key issue is the critical liquid bump height y(0c) at which the liquid film jumps to contact the AFM tip. It is found that there are three distinct regimes in the variation of y(0c) with film thickness H, depending on Hamaker constants of tip, sample and liquid. Noticeably, there is a characteristic thickness H* physically defining what a thin film is; namely, once the film thickness H is the same order as H* , the effect of film thickness should be taken into account. The value of H* is dependent on Hamaker constants and liquid surface tension as well as tip radius.

The influence of Saffman lift force on nanoparticle concentration distribution

The lift force on a spherical nanoparticle near a wall in micro/nanofluidics has not received sufficient attention so far. In this letter the concentration of 200 nm particles is measured at 0.25–2.0 m to a wall in a microchannel with pressure-driven de-ionized water flow pressure gradient 0–2000 kPa/m . The measured data show the influence of the lift force on the nanoparticle concentration distribution. By introducing the Saffman lift force into the Nernst–Planck equation near a wall, we find that the lift force is dominant at the range of 2