Fiabilidad de minimodulos de silicio

El objetivo de este Proyecto Final de Carrera es la realización de un ensayo de fiabilidad de componentes electrónicos, más concretamente de Minimódulos de Silicio, con el fin de estudiar su comportamiento a lo largo del tiempo de vida. Debido a la larga duración de los Minimódulos de Silicio , un ensayo de este tipo podría durar años, por lo que es necesario realizar un ensayo acelerado que acorte significativamente el tiempo del experimento, para ello, han de someterse a esfuerzos mayores que en condiciones normales de funcionamiento. A día de hoy, los Minimódulos de silicio, que conocemos como placas solares fotovoltaicas, se usan en infinidad de dispositivos debido a las múltiples ventajas que conllevan. La principal ventaja es poder llevar electricidad a cualquier parte del planeta sin necesidad de tener que hacer unas elevadas inversiones. Esta electricidad proviene de una fuente de energía inagotable y nada contaminante, con lo que ayudamos a mantener el equilibrio del planeta. La mayoría de las veces estas placas solares fotovoltaicas se usan en el exterior, soportando cambios de temperatura y de humedad elevados, de ahí, la importancia de realizar ensayos de fiabilidad, que muestren sus posibles causas de fallo, los efectos que producen estos fallos y los aspectos de diseño, fabricación y mantenimiento que puedan afectarles. Los Minimódulos de silicio utilizados en este proyecto son el modelo MC-SP0.8-NF-GCS de la empresa fabricante Multicomp. Para realizar el Proyecto hubiéramos necesitado una cámara climática que simulara unas condiciones ambientales determinadas, pero debido a la dificultad de iluminar el módulo dentro de la cámara climática hemos desarrollado un nuevo sistema de ensayos acelerados en temperatura. El nuevo sistema de ensayos acelerados consiste en: •Colocar los módulos fotovoltaicos en el laboratorio con un foco de 500W que irradia lo equivalente al sol. •Los tres módulos trabajarán a tres temperaturas diferentes para simular condiciones ambientales distintas, concretamente a 60°C, 72°C y 84°C. •Mediante un sistema automático de medida diseñado en LabVIEW, de manera simultánea tomará medidas de tensión en las tres placas y estudiaremos el grado degradación en cada placa. Se analizaran los resultados obtenido de cada una de las medidas y se realizará un estudio de fiabilidad y del proceso de degradación sufrido por los Minimódulos de silicio. Este PFC se puede dividir en las siguientes fases de trabajo siendo el ensayo la parte más larga en el tiempo: •Búsqueda de bibliografía documentación y normas aplicables. •Familiarización con los equipos y software, estudiando el manejo del software que viene con el Multímetro Keithley 2601 y el programa LabVIEW. •Desarrollo del hardware y sistemas necesarios para la realización del ensayo. •Montaje del ensayo •Realización del ensayo. •Análisis de resultados. ABSTRACT. The objective of this Final Project is conducting a test reliability of electronic components, more specifically Silicon minimodules, in order to study their behavior throughout the life span. Due to the long duration of Silicon minimodules a test like this could take years, so it is necessary to perform an accelerated significantly shorten the time of the experiment, testing for it, should be subjected to greater efforts than in normal operating. Today, the mini-modules, silicon is known as photovoltaic solar panels are used in a multitude of devices due to the many advantages they bring. The main advantage is to bring electricity to anywhere in the world without having to make high investments. This electricity comes from an inexhaustible source of energy and no pollution, thus helping to maintain the balance of the planet. Most of the time these solar photovoltaic panels are used on the outside, enduring changes in temperature and high humidity, hence, the importance of reliability testing, showing the possible causes of failure, the effects produced by these faults and aspects of design, manufacturing and maintenance that may affect them. The silicon mini-modules used in this project are the MC-SP0.8-NF-GCS model Multicomp manufacturing company. To realize the project we would have needed a climatic chamber to simulate specific environmental conditions, but due to the difficulty of illuminating the module in the climate chamber we have developed a new system of accelerated tests in temperature. The new system is accelerated tests: •Place the PV modules in the laboratory with a focus on the equivalent 500W radiating sun. •The three modules work at three different temperatures to simulate different environmental conditions, namely at 60 °C, 72 °C and 84 °C. •Automatic measurement system designed in LabVIEW, simultaneous voltage measurements taken at the three plates and study the degradation degree in each plate. The results obtained from each of the measurements and a feasibility study and degradation suffered by the silicon is performed minimodules were analyzed. This PFC can be divided into the following phases of the test work the longest part being overtime: •Literature search and documentation standards. •Familiarization with equipment and software, studying management software that comes with the Keithley 2601 multimeter and the LabVIEW program. •Development of hardware and systems necessary for the conduct of the trial. •Experiment setup •Carrying out the experiment. •Analysis of results.

Real-time reliability test for a CPV module based on a power degradation model

Models based on degradation are powerful and useful tools to evaluate the reliability of those devices in which failure happens because of degradation in the performance parameters. This paper presents a procedure for assessing the reliability of concentrator photovoltaic (CPV) modules operating outdoors in real-time conditions. With this model, the main reliability functions are predicted. This model has been applied to a real case with a module composed of GaAs single-junction solar cells and total internal reflection (TIR) optics

Statistical Calculation of the Main Reliability Functions of GaAs Concentrator III-V Solar Cells

This paper presents some of the results of a method to determine the main reliability functions of concentrator solar cells. High concentrator GaAs single junction solar cells have been tested in an Accelerated Life Test. The method can be directly applied to multi-junction solar cells. The main conclusions of this test carried out show that these solar cells are robust devices with a very low probability of failure caused by degradation during their operation life (more than 30 years). The evaluation of the probability operation function (i.e. the reliability function R(t)) is obtained for two nominal operation conditions of these cells, namely simulated concentration ratios of 700 and 1050 suns. Preliminary determination of the Mean Time to Failure indicates a value much higher than the intended operation life time of the concentrator cells.

Thermal effects in Ni/Au and Mo/Au gate metallization AlGaN/GaN HEMT's reliability

AlGaN/GaN high electron mobility transistors (HEMT) are key devices for the next generation of high-power, high-frequency and high-temperature electronics applications. Although significant progress has been recently achieved [1], stability and reliability are still some of the main issues under investigation, particularly at high temperatures [2-3]. Taking into account that the gate contact metallization is one of the weakest points in AlGaN/GaN HEMTs, the reliability of Ni, Mo, Pt and refractory metal gates is crucial [4-6]. This work has been focused on the thermal stress and reliability assessment of AlGaN/GaN HEMTs. After an unbiased storage at 350 o C for 2000 hours, devices with Ni/Au gates exhibited detrimental IDS-VDS degradation in pulsed mode. In contrast, devices with Mo/Au gates showed no degradation after similar storage conditions. Further capacitance-voltage characterization as a function of temperature and frequency revealed two distinct trap-related effects in both kinds of devices. At low frequency (< 1MHz), increased capacitance near the threshold voltage was present at high temperatures and more pronounced for the Ni/Au gate HEMT and as the frequency is lower. Such an anomalous “bump” has been previously related to H-related surface polar charges [7]. This anomalous behavior in the C-V characteristics was also observed in Mo/Au gate HEMTs after 1000 h at a calculated channel temperatures of around from 250 o C (T2) up to 320 ºC (T4), under a DC bias (VDS= 25 V, IDS= 420 mA/mm) (DC-life test). The devices showed a higher “bump” as the channel temperature is higher (Fig. 1). At 1 MHz, the higher C-V curve slope of the Ni/Au gated HEMTs indicated higher trap density than Mo/Au metallization (Fig. 2). These results highlight that temperature is an acceleration factor in the device degradation, in good agreement with [3]. Interface state density analysis is being performed in order to estimate the trap density and activation energy.

Design and Test of a High QoS Radio Network for CBTC Systems in Subway Tunnels

Communications Based Train Control Systems require high quality radio data communications for train signaling and control. Actually most of these systems use 2.4GHz band with proprietary radio transceivers and leaky feeder as distribution system. All them demand a high QoS radio network to improve the efficiency of railway networks. We present narrow band, broad band and data correlated measurements taken in Madrid underground with a transmission system at 2.4 GHz in a test network of 2 km length in subway tunnels. The architecture proposed has a strong overlap in between cells to improve reliability and QoS. The radio planning of the network is carefully described and modeled with narrow band and broadband measurements and statistics. The result is a network with 99.7% of packets transmitted correctly and average propagation delay of 20ms. These results fulfill the specifications QoS of CBTC systems.

Advances in the modeling, characterization and reliability of concentrator multijunction solar cells

Los sistemas de concentración fotovoltaica (CPV) parecen ser una de las vías más prometedoras para generar electricidad a gran escala a precios competitivos. La investigación actual se centra en aumentar la eficiencia y la concentración de los sistemas para abaratar costes. Al mismo tiempo se investiga sobre la fiabilidad de los diferentes componentes que integran un sistema de concentración, ya que para que los sistemas de concentración sean competitivos es necesario que tengan una fiabilidad al menos similar a los sistemas basados en células de silicio. En la presente tesis doctoral se ha llevado a cabo el estudio de aspectos avanzados de células solares multi-unión diseñadas para trabajar a concentraciones ultra-altas. Para ello, se ha desarrollado un modelo circuital tridimensional distribuido con el que simular el comportamiento de las células solares triple-unión bajo distintas condiciones de funcionamiento, así mismo se ha realizado una caracterización avanzada de este tipo de células para comprender mejor su modo de operación y así poder contribuir a mejorar su eficiencia. Finalmente, se han llevado a cabo ensayos de vida acelerados en células multiunión comerciales para conocer la fiabilidad de este tipo de células solares. Para la simulación de células solares triple-unión se ha desarrollado en la presente tesis doctoral un modelo circuital tridimensinal distribuido el cuál integra una descripción completa de la unión túnel. De este modo, con el modelo desarrollado, hemos podido simular perfiles de luz sobre la célula solar que hacen que la densidad de corriente fotogenerada sea mayor a la densidad de corriente pico de la unión túnel. El modelo desarrollado también contempla la distribución lateral de corriente en las capas semiconductoras que componen y rodean la unión túnel. Por tanto, se ha podido simular y analizar el efecto que tiene sobre el funcionamiento de la célula solar que los concentradores ópticos produzcan perfiles de luz desuniformes, tanto en nivel de irradiancia como en el contenido espectral de la luz (aberración cromática). Con el objetivo de determinar cuáles son los mecanismos de recombinación que están limitando el funcionamiento de cada subcélula que integra una triple-unión, y así intentar reducirlos, se ha llevado a cabo la caracterización eléctrica de células solares monouni ón idénticas a las subcelulas de una triple-unión. También se ha determinado la curva corriente-tensión en oscuridad de las subcélulas de GaInP y GaAs de una célula dobleunión mediante la utilización de un teorema de reciprocidad electro-óptico. Finalmente, se ha analizado el impacto de los diferentes mecanismos de recombinación en el funcionamiento de la célula solar triple-unión en concentración. Por último, para determinar la fiabilidad de este tipo de células, se ha llevado a cabo un ensayo de vida acelerada en temperatura en células solares triple-unión comerciales. En la presente tesis doctoral se describe el diseño del ensayo, el progreso del mismo y los datos obtenidos tras el análisis de los resultados preliminares. Abstract Concentrator photovoltaic systems (CPV) seem to be one of the most promising ways to generate electricity at competitive prices. Nowadays, the research is focused on increasing the efficiency and the concentration of the systems in order to reduce costs. At the same time, another important area of research is the study of the reliability of the different components which make up a CPV system. In fact, in order for a CPV to be cost-effective, it should have a warranty at least similar to that of the systems based on Si solar cells. In the present thesis, we will study in depth the behavior of multijunction solar cells under ultra-high concentration. With this purpose in mind, a three-dimensional circuital distributed model which is able to simulate the behavior of triple-junction solar cells under different working conditions has been developed. Also, an advanced characterization of these solar cells has been carried out in order to better understand their behavior and thus contribute to improving efficiency. Finally, accelerated life tests have been carried out on commercial lattice-matched triple-junction solar cells in order to determine their reliability. In order to simulate triple-junction solar cells, a 3D circuital distributed model which integrates a full description of the tunnel junction has been developed. We have analyzed the behavior of the multijunction solar cell under light profiles which cause the current density photo-generated in the solar cell to be higher than the tunnel junction’s peak current density. The advanced model developed also takes into account the lateral current spreading through the semiconductor layers which constitute and surround the tunnel junction. Therefore, the effects of non-uniform light profiles, in both irradiance and the spectral content produced by the concentrators on the solar cell, have been simulated and analyzed. In order to determine which recombination mechanisms are limiting the behavior of each subcell in a triple-junction stack, and to try to reduce them when possible, an electrical characterization of single-junction solar cells that resemble the subcells in a triplejunction stack has been carried out. Also, the dark I-V curves of the GaInP and GaAs subcells in a dual-junction solar cell have been determined by using an electro-optical reciprocity theorem. Finally, the impact of the different recombination mechanisms on the behavior of the triple-junction solar cell under concentration has been analyzed. In order to determine the reliability of these solar cells, a temperature accelerated life test has been carried out on commercial triple-junction solar cells. In the present thesis, the design and the evolution of the test, as well as the data obtained from the analysis of the preliminary results, are presented.

Accelerated life test of high luminosity AlGaInP LEDs

Specific tests to assess reliability of high luminosity AlInGaP LED for outdoor applications are needed. In this paper tests to propose a model involving three parameters: temperature, humidity and current have been carried out. Temperature, humidity and current accelerated model has been proposed to evaluate the reliability of this type of LED. Degradation and catastrophic failure mechanisms have been analyzed. Finally we analyze the effect of serial resistance in power luminosity degradation.

Preliminary temperature Accelerated Life Test (ALT) on III-V commercial concentrator triple-junction solar cells

A quantitative temperature accelerated life test on sixty GaInP/GaInAs/Ge triple-junction commercial concentrator solar cells is being carried out. The final objective of this experiment is to evaluate the reliability, warranty period, and failure mechanism of high concentration solar cells in a moderate period of time. The acceleration of the degradation is realized by subjecting the solar cells at temperatures markedly higher than the nominal working temperature under a concentrator Three experiments at three different temperatures are necessary in order to obtain the acceleration factor which relates the time at the stress level with the time at nominal working conditions. . However, up to now only the test at the highest temperature has finished. Therefore, we can not provide complete reliability information but we have analyzed the life data and the failure mode of the solar cells inside the climatic chamber at the highest temperature. The failures have been all of them catastrophic. In fact, the solar cells have turned into short circuits. We have fitted the failure distribution to a two parameters Weibull function. The failures are wear-out type. We have observed that the busbar and the surrounding fingers are completely deteriorate

Evaluation of the reliability of commercial concentrator triple-junction solar cells by means of accelerated life tests (ALT)

A temperature accelerated life test on commercial concentrator lattice-matched GaInP/GaInAs/Ge triple-junction solar cells has been carried out. The solar cells have been tested at three different temperatures: 119, 126 and 164 °C and the nominal photo-current condition (820 X) has been emulated by injecting current in darkness. All the solar cells have presented catastrophic failures. The failure distributions at the three tested temperatures have been fitted to an Arrhenius-Weibull model. An Arrhenius activation energy of 1.58 eV was determined from the fit. The main reliability functions and parameters (reliability function, instantaneous failure rate, mean time to failure, warranty time) of these solar cells at the nominal working temperature (80 °C) have been obtained. The warranty time obtained for a failure population of 5 % has been 69 years. Thus, a long-term warranty could be offered for these particular solar cells working at 820 X, 8 hours per day at 80 °C.

Cognitive test-bed for wireless sensor networks

Cognitive Wireless Sensor Networks are an emerging technology with a vast potential to avoid traditional wireless problems such as reliability, interferences and spectrum scarcity in Wireless Sensor Networks. Cognitive Wireless Sensor Networks test-beds are an important tool for future developments, protocol strategy testing and algorithm optimization in real scenarios. A new cognitive test-bed for Cognitive Wireless Sensor Networks is presented in this paper. This work in progress includes both the design of a cognitive simulator for networks with a high number of nodes and the implementation of a new platform with three wireless interfaces and a cognitive software for extracting real data. Finally, as a future work, a remote programmable system and the planning for the physical deployment of the nodes at the university building is presented.

Preliminary temperature accelerated life test (ALT) on lattice mismatched triple-junction concentrator solar cells-on-carriers

A temperature accelerated life test on concentrator lattice mismatched Ga0.37In0.63P/Ga0.83In0.17As/Ge triple-junction solar cells-on-carrier is being carried out. The solar cells have been tested at three different temperatures: 125, 145 and 165°C and the nominal photo-current condition (500X) is emulated by injecting current in darkness. The final objective of these tests is to evaluate the reliability, warranty period, and failure mechanism of these solar cells in a moderate period of time. Up to now only the test at 165°C has finished. Therefore, we cannot provide complete reliability information, but we have carried out preliminary data and failure analysis with the current results.

Analysis, reliability and optimization of reinforced concrete 2-D structures

In this paper a consistent analysis of reinforced concrete (RC) two-dimensional (2-D) structures,namely slab structures subjected to in-plane and out-plane forces, is presented. By using this method of analysis the well established methodology for dimensioning and verifying RC sections of beam structures is extended to 2-D structures. The validity of the proposed analysis results is checked by comparing them with some published experimental test results. Several examples show some of these proposed analysis features, such as the influence of the reinforcement layout on the service and ultimate behavior of a slab structure and the non straightforward problem of the optimal dimension at a slab point subjected to several loading cases. Also, in these examples, the method applications to design situations as multiple steel families and non orthogonal reinforcement layout are commented.