Accelerated life test of high luminosity AlGaInP LEDs
| Data(s) |
01/09/2012
|
|---|---|
| Resumo |
Specific tests to assess reliability of high luminosity AlInGaP LED for outdoor applications are needed. In this paper tests to propose a model involving three parameters: temperature, humidity and current have been carried out. Temperature, humidity and current accelerated model has been proposed to evaluate the reliability of this type of LED. Degradation and catastrophic failure mechanisms have been analyzed. Finally we analyze the effect of serial resistance in power luminosity degradation. |
| Formato |
application/pdf |
| Identificador | |
| Idioma(s) |
eng |
| Publicador |
E.U.I.T. Telecomunicación (UPM) |
| Relação |
http://oa.upm.es/16229/1/INVE_MEM_2012_132881.pdf http://www.sciencedirect.com/science/article/pii/S0026271412003228 info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2012.06.125 |
| Direitos |
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ info:eu-repo/semantics/openAccess |
| Fonte |
Microelectronics Reliability, ISSN 0026-2714, 2012-09, Vol. 52, No. 9-10 |
| Palavras-Chave | #Energía Eléctrica #Electrónica |
| Tipo |
info:eu-repo/semantics/article Artículo PeerReviewed |
