Nitrogen vacancy scattering in GaN grown by metal-organic vapor phase epitaxy


Autoria(s): Chen Z; Yuan HR; Lu DC; Sun XH; Wan SK; Liu XL; Han PD; Wang XH; Zhu QS; Wang ZG
Data(s)

2002

Resumo

Electron mobility limited by nitrogen vacancy scattering was taken into account to evaluate the quality of n-type GaN grown by metal-organic vapor phase epitaxy. Two assumptions were made for this potential for the nitrogen vacancy (1) it acts in a short range, and (2) does not diverge at the vacancy core. According to the above assumptions, a general expression to describe the scattering potential U(r) = - U-0 exp[- (r/beta)(n)], (n = 1, 2,...,infinity) was constructed, where beta is the potential well width. The mobilities for n = 1, 2, and infinity were calculated based on this equation, corresponding to the simple exponential, Gaussian and square well scattering potentials, respectively. In the limiting case of kbeta << 1 (where k is the wave vector), all of the mobilities calculated for n = 1, 2, and infinity showed a same result but different prefactor. Such difference was discussed in terms of the potential tail and was found that all of the calculated mobilities have T-1/2 temperature and beta(-6) well width dependences. A mobility taking account of a spatially complicate scattering potential was studied and the same temperature dependence was also found. A best fit between the calculated results and experimental data was obtained by taking account of the nitrogen vacancy scattering. (C) 2002 Elsevier Science Ltd. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/11720

http://www.irgrid.ac.cn/handle/1471x/64830

Idioma(s)

英语

Fonte

Chen Z; Yuan HR; Lu DC; Sun XH; Wan SK; Liu XL; Han PD; Wang XH; Zhu QS; Wang ZG .Nitrogen vacancy scattering in GaN grown by metal-organic vapor phase epitaxy ,SOLID-STATE ELECTRONICS,2002,46 (12):2069-2074

Palavras-Chave #半导体物理 #nitrogen vacancy scattering #GaN #mobility #MOCVD #N-TYPE GAN #NITRIDE #FILMS
Tipo

期刊论文