A Fortran program for analysis of ellipsometer measurements. /

Errata notice inserted in the book.

Determination of the components of the gyration tensor of quartz by oblique incidence transmission two-modulator generalized ellipsometry

The two independent components of the gyration tensor of quartz, g11 and g33, have been spectroscopically measured using a transmission two-modulator generalized ellipsometer. The method is used to determine the optical activity in crystals in directions other than the optic axis, where the linear birefringence is much larger than the optical activity.

Spectroscopic ellipsometry study of the In1-x Gax Asy P1-y / InP Heterojunctions grown by metalorganic chemical-vapor deposition

The dielectric functions of InP, In0.53Ga0.47As, and In0.75Ga0.25As0.5P0.5 epitaxial layers have been measured using a polarization modulation spectroscopic ellipsometer in the 1.5 to 5.3 eV region. The oxide removal procedure has been carefully checked by comparing spectroscopic ellipsometry and x ray photoelectron spectroscopy measurements. These reference data have been used to investigate the structural nature of metalorganic chemical vapor deposition grown In0.53Ga0.47As/InP and In0.75Ga0.25As0.5P0.5/InP heterojunctions, currently used for photodiodes and laser diodes. The sharpness of the interfaces has been systematically compared for the two types of heterojunctions: In1 xGaxAsy/InP and InP/In1 xGaxAsyP1 y. The sharpest interface is obtained for InP growth on In0.75Ga0.25As0.5P0.5 where the interface region is estimated to be (10±10) Å thick. The importance of performing in situ SE measurements is emphasized.

Fundamentals and applications of spectroscopic ellipsometry

This paper describes the use of ellipsometry as a precise and accurate technique for characterizing substrates and overlayers. A brief historical development of ellipsometry and the basic principles necessary to understand how an ellipsometer works are presented. There are many examples of studies performed in addressing materials science issues, and several are presented here: measurements of thickness, optical properties, and modeling of surface roughness. These selected results obtained in our laboratory for substrates, Si/SiO2 interfaces, and polymers provide evidence that ellipsometry can play a critical role in characterizing different types of materials.

Enhanced shape anisotropy and magneto-optical birefringence by high energy ball milling in NixFe1−xFe2O4 ferrofluids

Ferrofluids belonging to the series NixFe1 xFe2O4 were synthesised by two different procedures—one by standard co-precipitation techniques, the other by co-precipitation for synthesis of particles and dispersion aided by high-energy ball milling with a view to understand the effect of strain and size anisotropy on the magneto-optical properties of ferrofluids. The birefringence measurements were carried out using a standard ellipsometer. The birefringence signal obtained for chemically synthesised samples was satisfactorily fitted to the standard second Langevin function. The ball-milled ferrofluids showed a deviation and their birefringence was enhanced by an order. This large enhancement in the birefringence value cannot be attributed to the increase in grain size of the samples, considering that the grain sizes of sample synthesised by both modes are comparable; instead, it can be attributed to the lattice strain-induced shape anisotropy(oblation) arising from the high-energy ball-milling process. Thus magnetic-optical (MO) signals can be tuned by ball-milling process, which can find potential applications.

Enhanced shape anisotropy and magneto-optical birefringence by high energy ball milling in NixFe1 xFe2O4 ferrofluids

Ferrofluids belonging to the series NixFe1 xFe2O4 were synthesised by two different procedures—one by standard co-precipitation techniques, the other by co-precipitation for synthesis of particles and dispersion aided by high-energy ball milling with a view to understand the effect of strain and size anisotropy on the magneto-optical properties of ferrofluids. The birefringence measurements were carried out using a standard ellipsometer. The birefringence signal obtained for chemically synthesised samples was satisfactorily fitted to the standard second Langevin function. The ball-milled ferrofluids showed a deviation and their birefringence was enhanced by an order. This large enhancement in the birefringence value cannot be attributed to the increase in grain size of the samples, considering that the grain sizes of sample synthesised by both modes are comparable; instead, it can be attributed to the lattice strain-induced shape anisotropy(oblation) arising from the high-energy ball-milling process. Thus magnetic-optical (MO) signals can be tuned by ball-milling process, which can find potential applications

Zur Erfassung von form- und materialbedingten Oberflächenstrukturen mit Mikro-Deflexions-Ellipsometrie

Die vorliegende Arbeit berichtet über ein neuartiges, kombiniertes Messverfahren zur gleichzeitigen Erfassung von Form und Material einer glänzenden Probenoberfläche. Die Materialerkennung erfolgt über die polarisationsoptische Brechzahlbestimmung im Messpunkt mit Mikroellipsometrie. Die Mikroellipsometrie ist ein fokussierendes Ellipsometer, das aus der Polarisationsänderung, bedingt durch die Wechselwirkung Licht – Materie, die materialcharakteristische komplexe Brechzahl eines reflektierenden Materials ermitteln kann. Bei der fokussierenden Ellipsometrie ist die Anordnung der fokussierenden Optiken von Bedeutung. Die hier vorgestellte ellipsometerexterne Fokussierung vermeidet Messfehler durch optische Anisotropien und ermöglicht die multispektrale ellipsometrische Messung. Für die ellipsometrische Brechzahlbestimmung ist zwingend die Kenntnis des Einfallswinkels des Messstrahls und die räumliche Orientierung der Oberflächenneigung zum Koordinatensystem des Ellipsometers notwendig. Die Oberflächenneigung wird mit einem Deflektometer ermittelt, das speziell für den Einsatz in Kombination mit der Ellipsometrie entwickelt wurde. Aus der lokalen Oberflächenneigung kann die Topographie einer Probe rekonstruiert werden. Der Einfallswinkel ist ebenfalls aus den Oberflächenneigungen ableitbar. Die Arbeit stellt die Systemtheorie der beiden kombinierten Messverfahren vor, außerdem werden Beiträge zu Messunsicherheiten diskutiert. Der experimentelle Teil der Arbeit beinhaltet die separate Untersuchung zur Leistungsfähigkeit der beiden zu kombinierenden Messverfahren. Die experimentellen Ergebnisse erlauben die Schlussfolgerung, dass ein Mikro-Deflexions-Ellipsometer erfolgreich realisierbar ist.

Sinterização de filmes finos de LiNbO3 em forno microondas: estudo da influência da direção do fluxo de calor

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Projeto e construção de um elipsômetro automatizado

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Synthesis of PDMS-metal oxide hybrid nanocomposites using an in situ sol-gel route

Organic-inorganic hybrid nanocomposites are widely studied and applied in broad areas because of their ability to combine the flexibility, low density of the organic materials with the hardness, strength, thermal stability, good optical and electronic properties of the inorganic materials. Polydimethylsiloxane (PDMS) due to its excellent elasticity, transparency, and biocompatibility has been extensively employed as the organic host matrix for nanocomposites. For the inorganic component, titanium dioxide and barium titanate are broadly explored as they possess outstanding physical, optical and electronic properties. In our experiment, PDMS-TiO2 and PDMS-BaTiO3 hybrid nanocomposites were fabricated based on in-situ sol-gel technique. By changing the amount of metal precursors, transparent and homogeneous PDMS-TiO2 and PDMS-BaTiO3 hybrid films with various compositions were obtained. Two structural models of these two types of hybrids were stated and verified by the results of characterization. The structures of the hybrid films were examined by a conjunction of FTIR and FTRaman. The morphologies of the cross-sectional areas of the films were characterized by FESEM. An Ellipsometer and an automatic capacitance meter were utilized to evaluate the refractive index and dielectric constant of these composites respectively. A simultaneous DSC/TGA instrument was applied to measure the thermal properties. For PDMS-TiO2 hybrids, the higher the ratio of titanium precursor added, the higher the refractive index and the dielectric constant of the composites are. The highest values achieved of refractive index and dielectric constant were 1.74 and 15.5 respectively for sample PDMS-TiO2 (1-6). However, when the ratio of titanium precursor to PDMS was as high as 20 to 1, phase separation occurred as evidenced by SEM images, refractive index and dielectric constant decreased. For PDMS-BaTiO3 hybrids, with the increase of barium and titanium precursors in the system, the refractive index and dielectric constant of the composites increased. The highest value was attained in sample PDMS-BaTiO3 (1-6) with a refractive index of 1.6 and a dielectric constant of 12.2. However, phase separation appeared in SEM images for sample PDMS-BaTiO3 (1-8), the refractive index and dielectric constant reduced to lower values. Different compositions of PDMS-TiO2 and PDMS-BaTiO3 hybrid films were annealed at 60 °C and 100 °C, the influences on the refractive index, dielectric constant, and thermal properties were investigated.

Estudio de las propiedades del grafeno y sus posibilidades

El objetivo principal de este proyecto es el de estudiar mediante elipsometría las propiedades ópticas de una capa de grafeno sobre varios sustratos, y cómo ésta puede alterar los parámetros ópticos del material sobre el que reposa. Partiendo de muestras de cobre y silicio, se estudiará cómo pueden ser modificadas sus propiedades con tan sólo depositar sobre ellas una capa de grafeno cuyo espesor es el de un átomo. Se usará un elipsómetro de alta precisión proporcionado por el INTA para analizar todas las alteraciones respecto al material original sin grafeno. ABSTRACT The main purpose of the project is to study the optical properties of a layer of graphene on various substrates and how it can change the optical parameters of the material on which it rests, using ellipsometry. Starting from substrates of copper and silicon, we will study how their properties can be modified, by coating them with a layer of graphene, whose thickness is of one atom. For analyzing the changes with respect to the materials without graphene, an ellipsometer supply by INTA was employed.