Green Nanosilver as Reinforcing Eco-Friendly Additive to Epoxy Coating for Augmented Anticorrosive and Antimicrobial Behavior

Epoxy resin GY250 representing diglycidyl ethers of bisphenol-A (DGEBA) was reinforced with 1, 3 and 5 wt % of surface functionalized silver nanoparticles (F-AgNPs) which were synthesized using Couroupita guianensis leaves extract with a view of augmenting the corrosion control property of the epoxy resin and also imparting antimicrobial activity to epoxy coatings on mild steel. Corrosion resistance of the coatings was evaluated by EIS, potentiodynamic polarization studies and cross scratch tests. AFM, SEM, HRTEM and EDX were utilized to investigate the surface topography, morphology and elemental composition of the coatings on MS specimens. Results showed that the corrosion resistance, hardness and T-g of the DGEBA/F-AgNPs coatings increased at 1 wt % of F-AgNPs. The DGEBA/F-AgNPs coatings also offered manifold antimicrobial protection to the MS surfaces by inhibiting the growth of biofilm forming bacteria like P. aeruginosa, B. subtilis, the most common human pathogen E. coli and the most virulent human pathogenic yeast C. albicans.

An Electrowetting Model For Rough Surfaces Under Low Voltage

Electrowetting is one of the most effective methods to enhance wettability. A significant change of contact angle for the liquid droplet can result from the surface microstructures and the external electric field, without altering the chemical composition of the system. During the electrowetting process on a rough surface, the droplet exhibits a sharp transition from the Cassie-Baxter to the Wenzel regime at a low critical voltage. In this paper, a theoretical model for electrowetting is put forth to describe the dynamic electrical control of the wetting behavior at the low voltage, considering the surface topography. The theoretical results are found to be in good agreement with the existing experimental results. (c) Koninklijke Brill NV, Leiden, 2008.

Wave Sensor Technologies, St Petersburg, Florida, March 7-9, 2007: workshop proceedings

The Alliance for Coastal Technologies (ACT) convened a workshop on "Wave Sensor Technologies" in St. Petersburg, Florida on March 7-9, 2007, hosted by the University of South Florida (USF) College of Marine Science, an ACT partner institution. The primary objectives of this workshop were to: 1) define the present state of wave measurement technologies, 2) identify the major impediments to their advancement, and 3) make strategic recommendations for future development and on the necessary steps to integrate wave measurement sensors into operational coastal ocean observing systems. The participants were from various sectors, including research scientists, technology developers and industry providers, and technology users, such as operational coastal managers and coastal decision makers. Waves consistently are ranked as a critical variable for numerous coastal issues, from maritime transportation to beach erosion to habitat restoration. For the purposes of this workshop, the participants focused on measuring "wind waves" (i.e., waves on the water surface, generated by the wind, restored by gravity and existing between approximately 3 and 30-second periods), although it was recognized that a wide range of both forced and free waves exist on and in the oceans. Also, whereas the workshop put emphasis on the nearshore coastal component of wave measurements, the participants also stressed the importance of open ocean surface waves measurement. Wave sensor technologies that are presently available for both environments include bottom-mounted pressure gauges, surface following buoys, wave staffs, acoustic Doppler current profilers, and shore-based remote sensing radar instruments. One of the recurring themes of workshop discussions was the dichotomous nature of wave data users. The two separate groups, open ocean wave data users and the nearshore/coastal wave data users, have different requirements. Generally, the user requirements increase both in spatial/temporal resolution and precision as one moves closer to shore. Most ocean going mariners are adequately satisfied with measurements of wave period and height and a wave general direction. However, most coastal and nearshore users require at least the first five Fourier parameters ("First 5"): wave energy and the first four directional Fourier coefficients. Furthermore, wave research scientists would like sensors capable of providing measurements beyond the first four Fourier coefficients. It was debated whether or not high precision wave observations in one location can take the place of a less precise measurement at a different location. This could be accomplished by advancing wave models and using wave models to extend data to nearby areas. However, the consensus was that models are no substitution for in situ wave data.[PDF contains 26 pages]

Discussions on slip length measurements by microPIV/PTV in microchannels

Fluid transportation in microfluidic system could be benefit from the slip on solid-liquid interface. Slip length on many kinds of hydrophilic/hydrophobic surfaces have been measured recently. The two common-used experimental methods for boundary slip measurement include: (1) surface force measurement, such as surface force apparatus (SFA), atom force microscope (AFM), and (2) velocity measurement, like microPIV/PTV (Particle image velocimetry / Particle tracking velocimetry), total internal reflection velocimetry (TIRV). However, the measured results are rather scattered, larger measured slip lengths were reported by microPIV/PTV experiments. In this paper, we will investigate the deviations of the measured slip length on smooth hydrophilic surface. After measuring detailed velocity profiles very close to hydrophilic glass wall, we give a discussion on the effects influencing the slip measurements.

物体表面形貌的正弦相位调制实时干涉测量技术研究

表面形貌干涉测量技术是一种高精度的非接触式测量技术,在工业生产和科学研究中具有广泛的应用。提出一种实时测量表面形貌的正弦相位调制干涉测量新技术。该技术用激光二极管作光源,用自制的高速图像传感器探测干涉信号,通过信号处理电路实时解相得到被测表面所对应的相位分布,实时分析相位获得物体表面形貌。该技术消除了光强和部分外界干扰的影响,提高了系统的测量精度。楔形光学平板表面形貌的测量结果表明,测量点为60×60个的情况下,测量时间小于8.2 ms,重复测量精度(RMS)为4.3 nm。

基于低速面阵CCD的正弦相位调制干涉测量

正弦相位调制(SPM)干涉测量技术用于表面形貌测量时, 需要帧速高于300 frame/s的图像传感器, 同时要求调制信号频率与图像传感器帧速成确定的整数倍关系。提出一种基于低速CCD(30 frame/s)的帧速可调的高速图像传感技术, 通过控制每帧像素总数提高CCD帧速, 研制出一种高帧速图像传感器, 帧速可达300～1600 frame/s, 且每帧大小连续可调。将该CCD传感器用于正弦相位调制干涉泰曼-格林干涉仪, 测量镀膜玻璃板表面形貌, 当CCD图像传感器的帧速与调制信号频率呈16, 8, 4

实时测量表面形貌的正弦相位调制半导体干涉仪

提出一种实时测量表面形貌的正弦相位调制半导体激光干涉仪。利用实时相位检测电路，从正弦相位调制干涉信号中解出被测量物体表面形貌的相位。在实验中，测量了楔形光学平板的表面形貌，对表面形貌上的60

Influência de diferentes métodos de condicionamento superficial em pinos pré-fabricados resinosos fibro-reforçados em vidro e quartzo na resistência adesiva a compósito de polimerização dual: teste de push-out

O objetivo deste estudo foi realizar uma avaliação tridimensional da rugosidade superficial em 3 tipos de pinos de fibra - DT LightPost, FRC Postec Plus e Transluma Post - submetidos a diferentes tratamentos de superfície e avaliar os efeitos dos pré-tratamentos na resistência adesiva a um compósito de presa dual Biscore. Os tratamentos de superfície foram: imersão em ácido hidrofluorídrico, jateamento com óxido de alumínio a 50m, imersão em peróxido de hidrogênio, jateamento com óxido de alumínio a 50m seguido de imersão em ácido hidrofluorídrico e jateamento com óxido de alumínio a 50m seguido de imersão em peróxido de hidrogênio. No experimento 1, 75 pinos foram divididos em 3 grupos (n = 25), de acordo com seu fabricante e subdivididos em cinco subgrupos. A rugosidade superficial foi medida usando um rugosímetro tridimensional e analisada com o software de análise 3D. Os valores de rugosidade foram obtidos antes e após diferentes tratamentos de superfície na área dos mesmos corpos-de-prova. Para o experimento 2, foram utilizados os mesmos corpos-de-prova, os mesmos grupos e subgrupos do experimento 1, tendo sido adicionado o subgrupo de controle (n=90) e a resistência adesiva a um compósito presa dual Biscore foi mensurada através de um teste push-out. A resistência adesiva foi medida em uma máquina universal de ensaios, com uma célula de carga tipo SLBL-5kN em uma velocidade de 0,5 mm / min. Os resultados do experimento 1 foram analisados através de um teste estatístico t-Student. Jateamento e jateamento seguido de imersão em ácido hidrofluorídrico produziram um aumento estatisticamente significante na rugosidade, contudo somente o tratamento por jateamento proporcionou um aumento significativo nos valores de rugosidade. Os resultados do experimento 2 foram obtidos através de um um teste t-unilateral de hipótese com variância desconhecida. Concluiu-se que o jateamento com óxido de alumínio a 50μm em uma distância de 30 mm a 2,5 bar de pressão por 5 segundos foi suficiente para modificar a topografia dos pinos de fibra de vidro e quartzo e que o jateamento com partículas de 50 μ alumina a distância de 30 mm a 2,5 bar de pressão por 5 segundos foi o único tratamento de superfície que aumentou a resistência adesiva do compósito Biscore aos pinos DT Light Post e Transluma Post. Os pinos FRC Postec Plus não demostraram um aumento estatisticamente significante na resistência adesiva em nenhum grupo.

Growth studies of m-GaN layers on LiAlO2 by MOCVD

This paper reports that the m-plane GaN layer is grown on (200)-plane LiAlO2 substrate by metal-organic chemical vapour deposition (MOCVD) method. Tetragonal-shaped crystallites appear at the smooth surface. Raman measurement illuminates the compressive stress in the layer which is released with increasing the layer's thickness. The high transmittance (80%), sharp band edge and excitonic absorption peak show that the GaN layer has good optical quality. The donor acceptor pair emission peak located at similar to 3.41 eV with full-width at half maximum of 120 meV and no yellow peaks in the photoluminescence spectra partially show that no Li incorporated into GaN layer from the LiAlO2 substrate.

Annealing effects on electron-beam evaporated Al2O3 films

The effects of post-deposited annealing on structure and optical properties of electron-beam evaporated Al2O3 single layers were investigated. The films were annealed in air for 1.5 h at different temperatures from 250 to 400 degrees C. The optical constants and cut-off wavelength were deduced. Microstructure of the samples was characterized by X-ray diffraction (XRD). Profile and surface roughness measurement instrument was used to determine the rms surface roughness. It was found that the cut-off wavelength shifted to short wavelength as the annealing temperature increased and the total optical loss decreased. The film structure remained amorphous even after annealing at 400 degrees C temperature and the samples annealed at higher temperature had the higher rms surface roughness. The decreasing total optical loss with annealing temperature was attributed to the reduction of absorption owing to oxidation of the film by annealing. Guidance to reduce the optical loss of excimer laser mirrors was given. (c) 2004 Elsevier B.V. All rights reserved.

退火对电子束热蒸发Al2O3薄膜性能影响的实验研究

用电子束热蒸发方法镀制了Al2O3材料的单层膜，对它们在空气中进行了250～400℃的高温退火。对样品的透射率光谱曲线进行了测量，计算了样品的消光系数、折射率和截止波长。通过X射线衍射仪(XRD)测量分析了薄膜的微观结构，采用表面轮廓仪测量了样品的表面均方根粗糙度。结果发现随着退火温度的提高光学损耗下降，薄膜结构在退火温度为400℃时仍然为无定形态，样品的表面粗糙度随退火温度的升高而增加。引起光学损耗下降起主导作用的是吸收而不是散射，吸收损耗的下降主要是由于退火使材料吸收空气中的氧而进一步氧化，从而使薄膜

热舟蒸发LaF_3薄膜的紫外性能研究

研究了沉积温度对热舟蒸发氟化镧薄膜结构和光学性能的影响,沉积温度从200℃上升到350℃,间隔为50℃.采用分光光度计测量了样品的透射率和反射率光谱曲线,并在此基础上进行了光学损耗、光学常数以及带隙和截止波长的计算.采用表面轮廓仪进行了表面形貌和表面粗糙度的标定,采用X射线衍射(XRD)方法测量了不同沉积温度下样品的微结构.发现在短波长波段,随着沉积温度的升高,光学损耗增加,晶粒尺寸增大,表面粗糙度略有增加.不过散射损耗在光学损耗中所占比例均很小,光学损耗的增加主要由吸收损耗引起.随着沉积温度的升高,折射率与消光系数增大,带隙变小,相对应的截止波长向长波方向移动.

Resistência de união entre cimentos resinosos autoadesivos e cerâmicas de zircônia policristalina

O objetivo deste estudo foi avaliar a resistência de união a microtração de cimentos resinosos autoadesivos a cerâmicas de zircônia policristalina. Dezoito blocos cerâmicos de zircônia 3Y-TZP (9 LAVA e 9 LAVA Plus) foram jateados com partículas de 50 m de Al2O3por 20 s com pressão de 28 psi a uma distância de 10 mm. Os blocos cerâmicos foram duplicados em resina composta (Point 4, Kerr) por moldagem com silicone. Os blocos de resina composta foram cimentados à superfície jateada da zircônia usando três diferentes cimentos resinosos autoadesivos: (1) RelyX Unicem 2 (3M ESPE); (2) SmartCem 2 (Dentsply); (3) Speedcem (Ivoclar Vivadent). Após 24 h imersos em água destilada a 37oC, os blocos cimentados foram cortados em palitos para testes de microtração,com área da interface adesiva de 1 mm2 0,2 mm, e tensionados até a fratura. Os resultados foram analisados pelo teste de análise de variância de dois fatores e pelo teste de comparações múltiplas LSD (α=0.05). As amostras fraturadas foram analisadas com microscopia eletrônica de varredura (MEV) e o modo de falha foi registrado. A topografia das superfícies cerâmicas antes e após o jateamento foi comparada por microscopia de força atômica (AFM). A resistência de união do cimento Speedcem à zircônia foi estatisticamente superior àquela reportada pelos cimentos RelyX Unicem 2 e SmartCem 2, independentemente da cerâmica usada (p<0,05). O fator cerâmica não teve influência estatística na resistência de união. A interação entre os dois fatores se mostrou significativa (p<0,05). O modo de fratura associado ao SmartCem 2 foi quase exclusivamente adesiva, enquanto oRelyX Unicem 2e o Speedcem exibiram um maior percentual de falhas mistas. Não foram observadas falhas coesivas. O AFM não revelou diferença no padrão de topografia de superfície entre as duas cerâmicas antes ou após o jateamento. Concluiu-se que o cimento Speedcem foi superior na adesão a cerâmicas de zircônia policristalina.

A normal force distance regulation scheme for near-field optical microscopy

A near-field optical microscope (NFOM) has been developed that combines the features of a near-field optical microscope and an atomic force microscope. Improved control over tip-sample separation has led to improved optical imaging and independent surface topography information. The tip oscillation is normal to the sample plane thereby reducing lateral forces - important for nonperturbative imaging of soft samples. Both topographic images and reflection near-field optical images are presented which demonstrate the capability of the system. © 1996 American Institute of Physics.

Improved infrared thermal imaging of a CMOS MEMS device

We report a technique which can be used to improve the accuracy of infrared (IR) surface temperature measurements made on MEMS (Micro-Electro-Mechanical- Systems) devices. The technique was used to thermally characterize a SOI (Silicon-On-Insulator) CMOS (Complementary Metal Oxide Semiconductor) MEMS thermal flow sensor. Conventional IR temperature measurements made on the sensor were shown to give significant surface temperature errors, due to the optical transparency of the SiO 2 membrane layers and low emissivity/high reflectivity of the metal. By making IR measurements on radiative carbon micro-particles placed in isothermal contact with the device, the accuracy of the surface temperature measurement was significantly improved. © 2010 EDA Publishing/THERMINIC.