886 resultados para Delay circuits
Resumo:
A wireless Energy Harvesting Sensor (EHS) needs to send data packets arriving in its queue over a fading channel at maximum possible throughput while ensuring acceptable packet delays. At the same time, it needs to ensure that energy neutrality is satisfied, i.e., the average energy drawn from a battery should equal the amount of energy deposited in it minus the energy lost due to the inefficiency of the battery. In this work, a framework is developed under which a system designer can optimize the performance of the EHS node using power control based on the current channel state information, when the EHS node employs a single modulation and coding scheme and the channel is Rayleigh fading. Optimal system parameters for throughput optimal, delay optimal and delay-constrained throughput optimal policies that ensure energy neutrality are derived. It is seen that a throughput optimal (maximal) policy is packet delay-unbounded and an average delay optimal (minimal) policy achieves negligibly small throughput. Finally, the influence of the harvested energy profile on the performance of the EHS is illustrated through the example of solar energy harvesting.
Resumo:
We study the trade-off between delivery delay and energy consumption in delay tolerant mobile wireless networks that use two-hop relaying. The source may not have perfect knowledge of the delivery status at every instant. We formulate the problem as a stochastic control problem with partial information, and study structural properties of the optimal policy. We also propose a simple suboptimal policy. We then compare the performance of the suboptimal policy against that of the optimal control with perfect information. These are bounds on the performance of the proposed policy with partial information. Several other related open loop policies are also compared with these bounds.
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A single source network is said to be memory-free if all of the internal nodes (those except the source and the sinks) do not employ memory but merely send linear combinations of the symbols received at their incoming edges on their outgoing edges. In this work, we introduce network-error correction for single source, acyclic, unit-delay, memory-free networks with coherent network coding for multicast. A convolutional code is designed at the source based on the network code in order to correct network- errors that correspond to any of a given set of error patterns, as long as consecutive errors are separated by a certain interval which depends on the convolutional code selected. Bounds on this interval and the field size required for constructing the convolutional code with the required free distance are also obtained. We illustrate the performance of convolutional network error correcting codes (CNECCs) designed for the unit-delay networks using simulations of CNECCs on an example network under a probabilistic error model.
Resumo:
A single-source network is said to be memory-free if all of the internal nodes (those except the source and the sinks) do not employ memory but merely send linear combinations of the incoming symbols (received at their incoming edges) on their outgoing edges. Memory-free networks with delay using network coding are forced to do inter-generation network coding, as a result of which the problem of some or all sinks requiring a large amount of memory for decoding is faced. In this work, we address this problem by utilizing memory elements at the internal nodes of the network also, which results in the reduction of the number of memory elements used at the sinks. We give an algorithm which employs memory at all the nodes of the network to achieve single- generation network coding. For fixed latency, our algorithm reduces the total number of memory elements used in the network to achieve single- generation network coding. We also discuss the advantages of employing single-generation network coding together with convolutional network-error correction codes (CNECCs) for networks with unit- delay and illustrate the performance gain of CNECCs by using memory at the intermediate nodes using simulations on an example network under a probabilistic network error model.
Resumo:
In this paper, we present a belief propagation (BP) based equalizer for ultrawideband (UWB) multiple-input multiple-output (MIMO) inter-symbol interference (ISI) channels characterized by severe delay spreads. We employ a Markov random field (MRF) graphical model of the system on which we carry out message passing. The proposed BP equalizer is shown to perform increasingly closer to optimal performance for increasing number of multipath components (MPC) at a much lesser complexity than that of the optimum equalizer. The proposed equalizer performs close to within 0.25 dB of SISO AWGN performance at 10-3 bit error rate on a severely delay-spread MIMO-ISI channel with 20 equal-energy MPCs. We point out that, although MIMO/UWB systems are characterized by fully/densely connected graphical models, the following two proposed features are instrumental in achieving near-optimal performance for large number of MPCs at low complexities: i) use of pairwise compatibility functions in densely connected MRFs, and ii) use of damping of messages.
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We study small perturbations of three linear Delay Differential Equations (DDEs) close to Hopf bifurcation points. In analytical treatments of such equations, many authors recommend a center manifold reduction as a first step. We demonstrate that the method of multiple scales, on simply discarding the infinitely many exponentially decaying components of the complementary solutions obtained at each stage of the approximation, can bypass the explicit center manifold calculation. Analytical approximations obtained for the DDEs studied closely match numerical solutions.
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We consider the computational power of constant width polynomial size cylindrical circuits and non deterministic branching programs. We show that every function computed by a Pi(2) o MOD o AC(0) circuit can also be computed by a constant width polynomial size cylindrical nondeterministic branching program (or cylindrical circuit) and that every function computed by a constant width polynomial size cylindrical circuit belongs to ACC(0).
Resumo:
A (k-, K) circuit is one which can be decomposed into nonintersecting blocks of gates where each block has no more than K external inputs, such that the graph formed by letting each block be a node and inserting edges between blocks if they share a signal line, is a partial k-tree. (k, K) circuits are special in that they have been shown to be testable in time polynomial in the number of gates in the circuit, and are useful if the constants k and K are small. We demonstrate a procedure to synthesise (k, K) circuits from a special class of Boolean expressions.
Resumo:
We investigate the feasibility of developing a comprehensive gate delay and slew models which incorporates output load, input edge slew, supply voltage, temperature, global process variations and local process variations all in the same model. We find that the standard polynomial models cannot handle such a large heterogeneous set of input variables. We instead use neural networks, which are well known for their ability to approximate any arbitrary continuous function. Our initial experiments with a small subset of standard cell gates of an industrial 65 nm library show promising results with error in mean less than 1%, error in standard deviation less than 3% and maximum error less than 11% as compared to SPICE for models covering 0.9- 1.1 V of supply, -40degC to 125degC of temperature, load, slew and global and local process parameters. Enhancing the conventional libraries to be voltage and temperature scalable with similar accuracy requires on an average 4x more SPICE characterization runs.
Resumo:
We investigate the feasibility of developing a comprehensive gate delay and slew models which incorporates output load, input edge slew, supply voltage, temperature, global process variations and local process variations all in the same model. We find that the standard polynomial models cannot handle such a large heterogeneous set of input variables. We instead use neural networks, which are well known for their ability to approximate any arbitrary continuous function. Our initial experiments with a small subset of standard cell gates of an industrial 65 nm library show promising results with error in mean less than 1%, error in standard deviation less than 3% and maximum error less than 11% as compared to SPICE for models covering 0.9- 1.1 V of supply, -40degC to 125degC of temperature, load, slew and global and local process parameters. Enhancing the conventional libraries to be voltage and temperature scalable with similar accuracy requires on an average 4x more SPICE characterization runs.
Resumo:
Abstract—A method of testing for parametric faults of analog circuits based on a polynomial representaion of fault-free function of the circuit is presented. The response of the circuit under test (CUT) is estimated as a polynomial in the applied input voltage at relevant frequencies apart from DC. Classification of CUT is based on a comparison of the estimated polynomial coefficients with those of the fault free circuit. The method needs very little augmentation of circuit to make it testable as only output parameters are used for classification. This procedure is shown to uncover several parametric faults causing smaller than 5 % deviations the nominal values. Fault diagnosis based upon sensitivity of polynomial coefficients at relevant frequencies is also proposed.
Resumo:
Abstract—DC testing of parametric faults in non-linear analog circuits based on a new transformation, entitled, V-Transform acting on polynomial coefficient expansion of the circuit function is presented. V-Transform serves the dual purpose of monotonizing polynomial coefficients of circuit function expansion and increasing the sensitivity of these coefficients to circuit parameters. The sensitivity of V-Transform Coefficients (VTC) to circuit parameters is up to 3x-5x more than sensitivity of polynomial coefficients. As a case study, we consider a benchmark elliptic filter to validate our method. The technique is shown to uncover hitherto untestable parametric faults whose sizes are smaller than 10 % of the nominal values. I.
Resumo:
Technology scaling has caused Negative Bias Temperature Instability (NBTI) to emerge as a major circuit reliability concern. Simultaneously leakage power is becoming a greater fraction of the total power dissipated by logic circuits. As both NBTI and leakage power are highly dependent on vectors applied at the circuit’s inputs, they can be minimized by applying carefully chosen input vectors during periods when the circuit is in standby or idle mode. Unfortunately input vectors that minimize leakage power are not the ones that minimize NBTI degradation, so there is a need for a methodology to generate input vectors that minimize both of these variables.This paper proposes such a systematic methodology for the generation of input vectors which minimize leakage power under the constraint that NBTI degradation does not exceed a specified limit. These input vectors can be applied at the primary inputs of a circuit when it is in standby/idle mode and are such that the gates dissipate only a small amount of leakage power and also allow a large majority of the transistors on critical paths to be in the “recovery” phase of NBTI degradation. The advantage of this methodology is that allowing circuit designers to constrain NBTI degradation to below a specified limit enables tighter guardbanding, increasing performance. Our methodology guarantees that the generated input vector dissipates the least leakage power among all the input vectors that satisfy the degradation constraint. We formulate the problem as a zero-one integer linear program and show that this formulation produces input vectors whose leakage power is within 1% of a minimum leakage vector selected by a search algorithm and simultaneously reduces NBTI by about 5.75% of maximum circuit delay as compared to the worst case NBTI degradation. Our paper also proposes two new algorithms for the identification of circuit paths that are affected the most by NBTI degradation. The number of such paths identified by our algorithms are an order of magnitude fewer than previously proposed heuristics.