Refractive changes after descemet stripping endothelial keratoplasty: a simplified mathematical model.

PURPOSE: To develop a mathematical model that can predict refractive changes after Descemet stripping endothelial keratoplasty (DSEK). METHODS: A mathematical formula based on the Gullstrand eye model was generated to estimate the change in refractive power of the eye after DSEK. This model was applied to four DSEK cases retrospectively, to compare measured and predicted refractive changes after DSEK. RESULTS: The refractive change after DSEK is determined by calculating the difference in the power of the eye before and after DSEK surgery. The power of the eye post-DSEK surgery can be calculated with modified Gullstrand eye model equations that incorporate the change in the posterior radius of curvature and change in the distance between the principal planes of the cornea and lens after DSEK. Analysis of this model suggests that the ratio of central to peripheral graft thickness (CP ratio) and central thickness can have significant effect on refractive change where smaller CP ratios and larger graft thicknesses result in larger hyperopic shifts. This model was applied to four patients, and the average predicted hyperopic shift in the overall power of the eye was calculated to be 0.83 D. This change reflected in a mean of 93% (range, 75%-110%) of patients' measured refractive shifts. CONCLUSIONS: This simplified DSEK mathematical model can be used as a first step for estimating the hyperopic shift after DSEK. Further studies are necessary to refine the validity of this model.

¿Es el agua un espejismo? algunas reflexiones desde la perspectiva de la educación matemática crítica

Teniendo en cuenta que la educación tradicional es vista como un modelo pedagógico que entre otras: i) se enfoca en desarrollar en los estudiantes conocimientos algorítmicos, ii) hace un énfasis en la ejercitación de procedimientos, iii) no tiene en cuenta el desarrollo social del individuo dentro de una comunidad y tampoco se enfoca en el proceso que tiene un estudiante al desarrollar una actividad con determinado objeto matemático; hoy en día se propende por buscar perspectivas que le permitan a los estudiantes encontrarle sentido a las actividades que el profesor lleva al aula. A la luz de lo anterior, en Colombia han surgido diversas tendencias que han buscado la renovación pedagógica, didáctica y conceptual en la educación escolar, enmarcadas –la mayoría de estas propuestas– dentro de la idea de que los estudiantes se relacionen directamente con el conocimiento, mientras que el profesor toma una postura de orientador del proceso de aprendizaje del estudiante. Teniendo en cuenta lo anterior, muchos profesores han buscado cambiar sus prácticas tradicionales de enseñanza, un ejemplo de ello lo encontramos en el colectivo de profesores de la Institución Educativa Distrital Colegio Paulo Freire de la localidad de Usme (Bogotá, Colombia); donde los profesores –en concordancia con las ideas del pedagogo Paulo Freire– comparten, como parte de su proyecto educativo, el hecho de ver a la enseñanza como un proceso que debe generar en los estudiantes una comprensión crítica de la realidad social, política y económica en la que él está inmerso.

Explotando los conocimientos geométricos de los alumnos de enseñanza media superior

La enseñanza de la Geometría es una ramificación de las Matemáticas que tiene una importancia fundamental en el razonamiento de los chicos y chicas de cualquiera nivel de la Educación Básica. El presente artículo tiene como objetivo presentar los resultados obtenidos de la evaluación diagnostica de Geometría Euclidiana Plana en los alumnos de Enseñanza Medio Superior. La metodología utilizada ha sido la Cuantitativa con Estudio Descriptivo. La muestra ha sido compuesta de 534 alumnos de cuatro escuelas particulares de Enseñanza Mediana de Belém – Pará – Brasil. Ha sido aplicado un cuestionario con cinco cuestiones básicas de Geometría. Los resultados muestran que los discentes están llegando en la enseñanza medio superior con poco o casi ningún conocimiento de Geometría.

Reliability analysis of flip chip designs via computer simulation

A flip chip component is a silicon chip mounted to a substrate with the active area facing the substrate. This paper presents the results of an investigation into the relationship between a number of important material properties and geometric parameters on the thermal-mechanical fatigue reliability of a standard flip chip design and a flip chip design with the use of microvias. Computer modeling has been used to analyze the mechanical conditions of flip chips under cyclic thermal loading where the Coffin-Manson empirical relationship has been used to predict the life time of the solder interconnects. The material properties and geometry parameters that have been investigated are the Young's modulus, the coefficient of thermal expansion (CTE) of the underfill, the out-of-plane CTE (CTEz) of the substrate, the thickness of the substrate, and the standoff height. When these parameters vary, the predicted life-times are calculated and some of the features of the results are explained. By comparing the predicted lifetimes of the two designs and the strain conditions under thermal loading, the local CTE mismatch has been found to be one of most important factors in defining the reliability of flip chips with microvias.

Predicting the behaviour of micro-electronic displays using computational mechanics

Micro-electronic displays are indispensible devices used in high performance applications such as aerospace, medical, marine and industrial sectors.These devices provide an interface to real time mission critical devices and therefore require good optical visual performance and high reliability, all this within varied and challenging environments.

Parameter sensitivity for optimal design of 65 nm node SOI transistors

Mixed-mode simulation, where device simulation is embedded directly within a circuit simulator, is used for the first time to provide scaling guidelines to achieve optimal digital circuit performance for double gate SOI MOSFETs. This significant advance overcomes the lack of availability of SPICE model parameters. The sensitivity of the gate delay and on-off current ratio to each of the key geometric and technological parameters of the transistor is quantified. The impact of the source-drain doping profile on circuit performance is comprehensively investigated.

A new look at the pulsating DB white dwarf GD 358: Line-of-sight velocity measurements and constraints on model atmospheres

We report on our findings of the bright, pulsating, helium atmosphere white dwarf GD 358, based on time-resolved optical spectrophotometry. We identify 5 real pulsation modes and at least 6 combination modes at frequencies consistent with those found in previous observations. The measured Doppler shifts from our spectra show variations with amplitudes of up to 5.5 km s-1 at the frequencies inferred from the flux variations. We conclude that these are variations in the line-of-sight velocities associated with the pulsational motion. We use the observed flux and velocity amplitudes and phases to test theoretical predictions within the convective driving framework, and compare these with similar observations of the hydrogen atmosphere white dwarf pulsators (DAVs). The wavelength dependence of the fractional pulsation amplitudes (chromatic amplitudes) allows us to conclude that all five real modes share the same spherical degree, most likely, l=1. This is consistent with previous identifications based solely on photometry. We find that a high signal-to-noise mean spectrum on its own is not enough to determine the atmospheric parameters and that there are small but significant discrepancies between the observations and model atmospheres. The source of these remains to be identified. While we infer Teff =24 kK and log g ~ 8.0 from the mean spectrum, the chromatic amplitudes, which are a measure of the derivative of the flux with respect to the temperature, unambiguously favour a higher effective temperature, 27 kK, which is more in line with independent determinations from ultra-violet spectra.