Estudo da síntese de zeólitas tipo A, X e sodalita empregando reatores vítreos: análise dos métodos dinâmico e estático de síntese a partir de caulim residual da Região Amazônica

Empresas beneficiadoras de caulim geram resíduo caulinítico que é armazenado em lagoas de sedimentação, e ocupam grandes áreas físicas. O´aproveitamento deste resíduo é um fator importante do ponto de vista econômico e ambiental. Aqui é apresentado um estudo da síntese de zeólitas A, X e sodalita utilizando como matéria-prima um resíduo de caulim da Região Amazônica. O resíduo foi pré-tratado para a eliminação de matéria orgânica, cominuído e ativado termicamente a 750 °C por 2 horas. Ensaios de pré-zeolitização foram realizados em várias frações granulométricas do caulim ativado (metacaulim) a fim de se determinar a granulometria de síntese. Após esta etapa, empregou-se comparativamente dois métodos hidrotermais de obtenção de zeólitas: dinâmico e estático. Para a mistura reacional, utilizou-se a relação SiO₂/Al₂O₃ de 2/1 e 3/1 para obtenção das zeólitas. Análises de caracterização por Difração de Raios-X (DRX), Microscopia Eletrônica de Varredura (MEV) e Espectrometria de Fluorescência de Raios-X (FRX) mostraram uma boa formação da fase zeolítica NaA para a razão 2/1, em ambos os métodos de síntese e sem envelhecimento da mistura, e boa formação da fase NaX para a razão 3/1, em síntese estática com envelhecimento de 12 horas. A fase sodalita foi obtida na mesma estequiometria da zeólita NaX, porém empregando síntese estática e sem envelhecimento.

Síntese e caracterização de compostos HoMn1-x(Ni,Co)xO3

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Síntese, caracterização estrutural e análise do potencial catalítico do SrTiO3 e das Perovskitas duplas de Sr1-xKxTiCux/2O3, onde x = 0,2; 0,3 e 0,5, na preparação de biodiesel

Pós-graduação em Química - IBILCE

Efeito do oxigênio intersticial no módulo de elasticidade de Ligas Ti-15Mo-xZr(x=5,10,15%p)

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Preparação e caracterização de filmes finos ferroelétricos nanoestruturados do tipo Pb1-x(Ca,Ba)xTiO3

O rápido crescimento do mercado de dispositivos eletrônicos portáteis, com aplicações em diferentes áreas (telecomunicações, medicina, engenharia), criou uma grande demanda por fontes de potência compactas leves e, sobretudo, de baixo custo. Essa demanda levou ao desenvolvimento de tecnologia de filmes finos nanoestruturados para a obtenção de componentes eletroeletrônicos, por exemplo, memórias de computador. Estes dispositivos são empregados em “notebooks”, circuitos integrados, telefones celulares. O estudo de cristalização de filmes finos ferroelétricos nanoestruturados será feito através da cristalização induzida por rotas convencionais tal como cristalização em forno mufla. A modulação entre os diferentes cátions (Pb, Ca e Ba) para formar o sistema Pb1-x(Ca,Ba)xTiO3 serão analisadas, visando obter filmes com propriedades compatíveis para uso em memórias ferroelétricas. Para isso, os filmes finos serão depositados em substratos adequados controlando-se a homogeneidade química, a microestrutura e a interação filme-substrato

Estudo das propriedades físicas em materiais vítreos do sistema 50B2O3 - 15CuO - 20Li2O - 15X (X= Na2O, K2O, RbCI e Cs2O)

The increasing demand for devices for solid state applications in many technological areas has resulted in a high demand for new materials. Among these material have the advantage of being manufactured with different chemical compositions, and may have physical properties equal to or higher than the corresponding crystalline material. The aim of this paper was to produce borate glass system 50B2O3 – 15CuO – 20Li2O – 15X (X = Na2O, K2O, RbCl e Cs2O) to analyze the influence of the atomic radius of alkali in the physical properties of this glass system. The glasses were synthesized by the process of melting and molding. The characteristic temperatures were determined by the technique of scanning calorimetry (DSC). The non-crystalline was determined by x-ray diffraction. In order to determine the molar volume a density measurement by using the Archimedes method was used. The structural characterization was carried out using the technique of infrared spectroscopy

Análise da resposta dielétrica e varistora de compostos cerâmicos multifásicos à base de Ca2CU2Ti4-xSnxO12 (0,0 < x< 4,0)

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Copper ore type definition from Sossego Mine using X-ray diffraction and cluster analysis technique

This paper presents the classification of 110 copper ore samples from Sossego Mine, based on X-ray diffraction and cluster analysis. The comparison based on the position and the intensity of the diffracted peaks allowed the distinction of seven ore types, whose differences refer to the proportion of major minerals: quartz, feldspar, actinolite, iron oxides, mica and chlorite. There was a strong correlation between the grouping and the location of the samples in Sequeirinho and Sossego orebodies. This relationship is due to different types and intensities of hydrothermal alteration prevailing in each body, which reflect the mineralogical composition and thus the X-ray diffractograms of samples.

Using X rays to evaluate fissures in rice seeds dried artificially

The objective of the present study was to evaluate the efficiency of X-rays in identifying fissures in artificially dried rice seeds and the relationship between damage and seed performance in the germination test. Irrigated rice seeds of the IRGA 417 and IRGA 420 cultivars were harvested with 23.3 and 24.5% water content respectively and submitted to stationary drying treatments at 32, 38, 44 and 50 °C. X-rays were taken of subsamples of 100 seeds for each treatment, using an MX-20 X-ray equipment. The X-rayed seeds were classified from 1 to 3, where 1 corresponded to seeds without fissures, 2 to seeds with non-severe fissures and 3 to seeds with severe fissures. The same X-rayed seeds were planted and on the seventh day the seedlings (normal or abnormal) and dead seeds were photographed and evaluated to verify any relationship between the fissures and physiological potential. Higher drying temperature increased the percentage of fissures in the two cultivars, which can adversely affect their germination. Seeds with fissures can be identified using X-rays.

X-Ray analysis to assess mechanical damage in sweet corn seeds

The X-ray test is a precise, fast and non-destructive method to detect mechanical damage in seeds. In the present study, the efficiency of X-ray analysis in identifying the extent of mechanical damage in sweet corn seeds and its relationship with germination and vigor was evaluated. Hybrid 'SWB 551' (sh2) seeds with round (R) and flat (F) shapes were classified as large (L), medium (M1, M2 and M3) and small (S), using sieves with round and oblong screens. After artificial exposure to different levels of damage (0, 1, 3, 5 and 7 impacts), seeds were X-rayed (15 kV, 5 min) and submitted to germination (25 °C/5 days) and cold (10 °C/7 days) tests. Digital images of normal and abnormal seedlings and ungerminated seeds from germination and cold tests were jointly analyzed with the seed X-ray images. Results showed that damage affecting the embryonic axis resulted in abnormal seedlings or dead seeds in the germination and cold tests. The X-ray analysis is efficient for identifying mechanical damage in sweet corn seeds, allowing damage severity to be associated with losses in germination and vigor.

Time lags of the kilohertz quasi-periodic oscillations in the low-mass X-ray binaries 4U 1608−52 and 4U 1636−53

We studied the energy and frequency dependence of the Fourier time lags and intrinsic coherence of the kilohertz quasi-periodic oscillations (kHz QPOs) in the neutron-star lowmass X-ray binaries 4U 1608−52 and 4U 1636−53, using a large data set obtained with the Rossi X-ray Timing Explorer. We confirmed that, in both sources, the time lags of the lower kHz QPO are soft and their magnitude increases with energy. We also found that: (i) In 4U 1636−53, the soft lags of the lower kHz QPO remain constant at∼30 μs in the QPO frequency range 500–850 Hz, and decrease to ∼10 μs when the QPO frequency increases further. In 4U 1608−52, the soft lags of the lower kHz QPO remain constant at 40 μs up to 800 Hz, the highest frequency reached by this QPO in our data. (ii) In both sources, the time lags of the upper kHz QPO are hard, independent of energy or frequency and inconsistent with the soft lags of the lower kHz QPO. (iii) In both sources the intrinsic coherence of the lower kHz QPO remains constant at ∼0.6 between 5 and 12 keV, and drops to zero above that energy. The intrinsic coherence of the upper kHz QPO is consistent with being zero across the full energy range. (iv) In 4U 1636−53, the intrinsic coherence of the lower kHz QPO increases from ∼0 at ∼600 Hz to ∼1, and it decreases to ∼0.5 at 920 Hz; in 4U 1608−52, the intrinsic coherence is consistent with the same trend. (v) In both sources the intrinsic coherence of the upper kHz QPO is consistent with zero over the full frequency range of the QPO, except in 4U 1636−53 between 700 and 900 Hz where the intrinsic coherence marginally increases. We discuss our results in the context of scenarios in which the soft lags are either due to reflection off the accretion disc or up-/down-scattering in a hot medium close to the neutron star. We finally explore the connection between, on one hand the time lags and the intrinsic coherence of the kHz QPOs, and on the other the QPOs’ amplitude and quality factor in these two sources.

Reactive sputter magnetron reactor for preparation of thin films and simultaneous in-situ structural study by X-ray diffraction.

Reactive Sputter Magnetron (RSM) is a widely used technique to thin films growing of compounds both, in research laboratories and in industrial processes. The nature of the deposited compound will depend then on the nature of the magnetron target and the nature of the ions generated in the plasma. One important aspect of the problem is the knowledge of the evolution of the film during the process of growing itself. In this work, we present the design, construction of a chamber to be installed in the Huber goniometer in the XRD2 line of LNLS in Campinas, which allows in situ growing kinetic studies of thin films.

Crystallization and preliminary X-ray diffraction analysis of selenophosphate synthetases from Trypanosoma brucei and Leishmania major

Selenophosphate synthetase (SPS) plays an indispensable role in selenium metabolism, being responsible for catalyzing the activation of selenide with adenosine 5'-triphosphate (ATP) to generate selenophosphate, the essential selenium donor for selenocysteine synthesis. Recombinant full-length Leishmania major SPS (LmSPS2) was recalcitrant to crystallization. Therefore, a limited proteolysis technique was used and a stable N-terminal truncated construct (ΔN-LmSPS2) yielded suitable crystals. The Trypanosoma brucei SPS orthologue (TbSPS2) was crystallized by the microbatch method using paraffin oil. X-ray diffraction data were collected to resolutions of 1.9 Å for ΔN-LmSPS2 and 3.4 Å for TbSPS2.

Síntese e caracterização de PSFC (Pr0,5Sr0,5Fe1-xCuxO3-δ, sendo x=0,2 e x=0,4) para aplicação como catodo de células a combustível de óxido sólido

The PSFC (Pr0.5Sr0.5Fe1-xCuxO3-δ) is a new mixed oxide perovskite and has been studied and evaluated the cathode materials for intermediate temperature solid oxide fuel cells (IT-SOFCs), mainly due to its good compatibility with the electrolyte (CGO) and its high ionic conductivity and electronic in intermediate temperature. In this work, PSFC powders with two different compositions (Pr0,5Sr0,5Fe0,8Cu0,2O3- PSFC5582 and Pr0,5Sr0,5Fe0,6Cu0,4O3-PSFC5564) were synthesized by the citrate method using a new route. The powders obtained were characterized by thermal analysis (Differential Scanning Calorimetry and Thermogravimetry), and the material calcined at 800, 900 and 1000 °C for 5h were analyzed by X-ray diffractometry (XRD), with the Rietveld refinement of the diffraction data and dilatometry. PSFC5582 composite films were obtained by screen printing of powder calcined at 1000 °C. The films were deposited on substrate ceria doped with gadolinia (CGO) and then sintered at 1050 °C for 2h. The electrochemical performance of the electrodes was evaluated by impedance spectroscopy and the interface electrode/electrolyte was observed by scanning electron microscopy (SEM). The specific resistance area (ASR) was 0.44 Ω.cm² at 800 °C, slightly lower than those reported in the literature for cathodes containing cobalt. The thermal expansion coefficients of both the PSFC compositions were obtained and varied between 13 and 15 x 10-6 °C-1 , in a temperature range of 200 to 650 °C, demonstrating the good thermal compatibility of cathodes with Ce0,9Gd0,1O1,95 electrolytes (CET = 12 x 10-6 °C).

Estudo da deposição de filmes finos de BaTi(1-X)Zr(X)O3 por meio de planejamento Box-Behnken

Ferroelectric ceramics with perovskite structure (ABO3) are widely used in solid state memories (FeRAM’s and DRAM's) as well as multilayered capacitors, especially as a thin films. When doped with zirconium ions, BaTiO3-based materials form a solid solution known as barium zirconate titanate (BaTi1-xZrxO3). Also called BZT, this material can undergo significant changes in their electrical properties for a small variation of zirconium content in the crystal lattice. The present work is the study of the effects of deposition parameters of BaTi0,75Zr0,25O3 thin films by spin-coating method on their morphology and physical properties, through an experimental design of the Box-Behnken type. The resin used in the process has been synthesized by the polymeric precursor method (Pechini) and subsequently split into three portions each of which has its viscosity adjusted to 10, 20 and 30 mPa∙s by means of a rotary viscometer. The resins were then deposited on Pt/Ti/SiO2/Si substrates by spin-coating method on 15 different combinations of viscosity, spin speed (3000, 5500 and 8000 rpm) and the number of deposited layers (5, 8 and 11 layers) and then calcined at 800 ° C for 1 h. The phase composition of the films was analyzed by X-ray diffraction (XRD) and indexed with the JCPDS 36-0019. Surface morphology and grain size were observed by atomic force microscopy (AFM) indicating uniform films and average grain size around 40 nm. Images of the cross section of the films were obtained by scanning electron microscopy field emission (SEM-FEG), indicating very uniform thicknesses ranging from 140-700 nm between samples. Capacitance measurements were performed at room temperature using an impedance analyzer. The films presented dielectric constant values of 55-305 at 100kHz and low dielectric loss. The design indicated no significant interaction effects between the deposition parameters on the thickness of the films. The response surface methodology enabled better observes the simultaneous effect of variables.