Electrical engineering; the engineering journal of the electrical industry.

Vols. 2 and 4 include supplements "The Manchester electrical exhibition of 1908" and "The electrical exhibition of 1911", respectively, each issued in 5 parts.

Contribution from the Dept. of Electrical Engineering.

Reprinted in part from various scientific serials.

Discussion of the precision of measurements : with examples taken mainly from physics and electrical engineering /

Advertising section at the end of the book.

Electrical Engineering Regulations

Mode of access: Internet.

Characteristics of small-signal capacitances of silicon-on-sapphire MOSFETs

The measured inter-electrode capacitances of silicon-on-sapphire (SOS) MOSFETs are presented and compared with simulation results. It is shown that the variations of capacitances with DC bias differ from those of bulk MOSFETs due to change in body potential variation of the SOS device resulting from electron-hole pair generation through impact ionisation.

Role of polarisation in automatic target recognition using resonance descriptions

The role of polarisation in late time complex resonance based target identification is investigated numerically for the case of an L-shaped wire. While repeated extraction of the resonances for varying polarisation allows for better signal-to-noise immunity, it is also found that there are preferred polarisations for each complex resonance. The first few of these polarisations are extracted for the sample target.

An industry/university collaboration to upgrade software engineering knowledge and skills in industry

This paper describes an ongoing collaboration between Boeing Australia Limited and the University of Queensland to develop and deliver an introductory course on software engineering. The aims of the course are to provide a common understanding of the nature of software engineering for all Boeing Australia's engineering staff, and to ensure they understand the practices used throughout the company. The course is designed so that it can be presented to people with varying backgrounds, such as recent software engineering graduates, systems engineers, quality assurance personnel, etc. The paper describes the structure and content of the course, and the evaluation techniques used to collect feedback from the participants and the corresponding results. The immediate feedback on the course indicates that it has been well received by the participants, but also indicates a need for more advanced courses in specific areas. The long-term feedback from participants is less positive, and the long-term feedback from the managers of the course participants indicates a need to expand on the coverage of the Boeing-specific processes and methods. (C) 2004 Elsevier Inc. All rights reserved.

Electronic Education in the Field of Electrical Engineering Disciplines. Combined Didactic Interactive Program System

At present in the educational process of electrical engineering disciplines electronic learning program, providing control over reproductive educational-cognitive activity (the decision of standard problems) and universal modeling program systems, for instance Electronics Workbench, giving a chance of organizing productive, in particular research activity are basically used. However universal modeling program systems can not provide auto control over educational-cognitive activity because of the absence of the feedback with students. The combined didactic interactive program system, providing the closed directed auto control over both the reproductive and productive heuristic educational-cognitive activity of the student is offered.

Programming Paradigms in Computer Science Education

Main styles, or paradigms of programming – imperative, functional, logic, and object-oriented – are shortly described and compared, and corresponding programming techniques are outlined. Programming languages are classified in accordance with the main style and techniques supported. It is argued that profound education in computer science should include learning base programming techniques of all main programming paradigms.

Education in Computer Science and the Role of the Teacher in the Environment of Open Educational Resources

Report published in the Proceedings of the National Conference on "Education in the Information Society", Plovdiv, May, 2013

Ionized cluster beam deposition: Modeling, cluster size measurement and applications

Clusters are aggregations of atoms or molecules, generally intermediate in size between individual atoms and aggregates that are large enough to be called bulk matter. Clusters can also be called nanoparticles, because their size is on the order of nanometers or tens of nanometers. A new field has begun to take shape called nanostructured materials which takes advantage of these atom clusters. The ultra-small size of building blocks leads to dramatically different properties and it is anticipated that such atomically engineered materials will be able to be tailored to perform as no previous material could.^ The idea of ionized cluster beam (ICB) thin film deposition technique was first proposed by Takagi in 1972. It was based upon using a supersonic jet source to produce, ionize and accelerate beams of atomic clusters onto substrates in a vacuum environment. Conditions for formation of cluster beams suitable for thin film deposition have only recently been established following twenty years of effort. Zinc clusters over 1,000 atoms in average size have been synthesized both in our lab and that of Gspann. More recently, other methods of synthesizing clusters and nanoparticles, using different types of cluster sources, have come under development.^ In this work, we studied different aspects of nanoparticle beams. The work includes refinement of a model of the cluster formation mechanism, development of a new real-time, in situ cluster size measurement method, and study of the use of ICB in the fabrication of semiconductor devices.^ The formation process of the vaporized-metal cluster beam was simulated and investigated using classical nucleation theory and one dimensional gas flow equations. Zinc cluster sizes predicted at the nozzle exit are in good quantitative agreement with experimental results in our laboratory.^ A novel in situ real-time mass, energy and velocity measurement apparatus has been designed, built and tested. This small size time-of-flight mass spectrometer is suitable to be used in our cluster deposition systems and does not suffer from problems related to other methods of cluster size measurement like: requirement for specialized ionizing lasers, inductive electrical or electromagnetic coupling, dependency on the assumption of homogeneous nucleation, limits on the size measurement and non real-time capability. Measured ion energies using the electrostatic energy analyzer are in good accordance with values obtained from computer simulation. The velocity (v) is measured by pulsing the cluster beam and measuring the time of delay between the pulse and analyzer output current. The mass of a particle is calculated from m = (2E/v$\sp2).$ The error in the measured value of background gas mass is on the order of 28% of the mass of one N$\sb2$ molecule which is negligible for the measurement of large size clusters. This resolution in cluster size measurement is very acceptable for our purposes.^ Selective area deposition onto conducting patterns overlying insulating substrates was demonstrated using intense, fully-ionized cluster beams. Parameters influencing the selectivity are ion energy, repelling voltage, the ratio of the conductor to insulator dimension, and substrate thickness. ^