A study of placement algorithms through trial interchange of logic modules

Based on trial interchanges, this paper develops three algorithms for the solution of the placement problem of logic modules in a circuit. A significant decrease in the computation time of such placement algorithms can be achieved by restricting the trial interchanges to only a subset of all the modules in a circuit. The three algorithms are simulated on a DEC 1090 system in Pascal and the performance of these algorithms in terms of total wirelength and computation time is compared with the results obtained by Steinberg, for the 34-module backboard wiring problem. Performance analysis of the first two algorithms reveals that algorithms based on pairwise trial interchanges (2 interchanges) achieve a desired placement faster than the algorithms based on trial N interchanges. The first two algorithms do not perform better than Steinberg's algorithm1, whereas the third algorithm based on trial pairwise interchange among unconnected pairs of modules (UPM) and connected pairs of modules (CPM) performs better than Steinberg's algorithm, both in terms of total wirelength (TWL) and computation time.

An on-line algorithm for the location of cross point faults in programmable logic arrays

An on-line algorithm is developed for the location of single cross point faults in a PLA (FPLA). The main feature of the algorithm is the determination of a fault set corresponding to the response obtained for a failed test. For the apparently small number of faults in this set, all other tests are generated and a fault table is formed. Subsequently, an adaptive procedure is used to diagnose the fault. Functional equivalence test is carried out to determine the actual fault class if the adaptive testing results in a set of faults with identical tests. The large amount of computation time and storage required in the determination, a priori, of all the fault equivalence classes or in the construction of a fault dictionary are not needed here. A brief study of functional equivalence among the cross point faults is also made.