Design and analysis of a metal bridge railing

"Final report for U.S. Department of Commerce, Bureau of Public Works. contract no. CPR 11-7987."

Report on dynamic tests of a 55 ft. [Amdek bridge] member for Concrete Products of America Division, American-Marietta Company, Pottstown, Pennsylvania.

Mode of access: Internet.

De pontibus: a pocket-book for bridge engineers.

Mode of access: Internet.

Electron-tube circuits /

Includes bibliographies.

Electronic control circuits; a compilation.

At head of title: Technology utilization.

Spanish-English and English-Spanish glossary of bridge, highway, and soil stabilization terms,

Mode of access: Internet.

21st National Information Systems Security Conference : building the information security bridge to the 21st century : October 5-8, 1998, Hyatt Regency Crystal City, Arlington, Va.

Cover title.

Standard specifications for road and bridge construction.

"Supplemental specifications. Addenda and amendments to 1959 edition of Standard specifications ..." (1 v. (loose leaf)), issued 1959.

Draft environmental impact statement for the wilderness recommendation, Bering Land Bridge National Preserve, Alaska.

"NPS D-21. February 1988"--P. [3] of cover.

Contract documents for the construction of the substructure [and superstructure] of the Henry Hudson Bridge. Contract #1[-2] at Harlem River Ship Canal in the Boroughs of Manhattan and the Bronx, New York City. Proposals to be opened 2 P.M., E.S.T., on June 14th, 1935.

Cover title.

Contract documents for the construction of the Dyckman Street Bridge. Contract #3 at Dyckman Street in the Borough of Manhattan, New York City. Proposals to be opened at 2 P.M., E.S.T., on June 28th, 1935.

Cover title.

Report [and Plans]; also report on design of Quebec bridge,

Issued also in French.

Circuits and machines in electrical engineering

v. 1. Circuits.--v. 2. Machines.

Semiconductor measurement technology : techniques for measuring the integrity of passivation overcoats on integrated circuits /

Mode of access: Internet.

Metrology for submicrometer devices and circuits /

"Issued June 1980."