Semiconductor measurement technology : techniques for measuring the integrity of passivation overcoats on integrated circuits /
| Data(s) |
29/12/1977
|
|---|---|
| Resumo |
Mode of access: Internet. |
| Formato |
bib bib bib bib |
| Identificador |
http://hdl.handle.net/2027/uc1.31210023555749 http://hdl.handle.net/2027/uiug.30112104130718 |
| Idioma(s) |
eng |
| Publicador |
Washington : Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., |
| Direitos |
Items in this record are available as Public Domain, Google-digitized. View access and use profile at http://www.hathitrust.org/access_use#pd-google. Please see individual items for rights and use statements. |
| Palavras-Chave | #Microelectronics #Protective coatings #Integrated circuits |
| Tipo |
text |
