921 resultados para thin foil


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CCTO thin films were deposited on Pt(1 1 1)/Ti/SiO2/Si substrates using a chemical (polymeric precursor) and pressure method. Pressure effects on CCTO thin films were evaluated by X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and optical properties which revealed that a pressure film (PF) is denser and more homogeneous than a chemical film (CF). Pressure also causes a decrease in the band gap and an increase in the photoluminescence (PL) emission of CCTO films which suggests that the pressure facilitates the displacement of Ti in the titanate clusters and the charge transference from TiO6 to [TiO5V0z], [TiO5V0z] to [CaO11V0z] and [TiO5V0z] to [CuO4]x. © 2013 Elsevier B.V. All rights reserved.

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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

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Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

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The spin injector part of spintronic FET and diodes suffers from fatigue due to rising heat on the depletion layer. In this study the stiffness of Ga1-xMnxAs spin injector in terms of storage modulus with respect to a varying temperature, 45 degrees C <= T <= 70 degrees C was determined. It was observed that the storage modulus for MDLs (Manganese Doping Levels) of 0%, 1% and 10% decreased with increase in temperature while that with MDLs of 20% and 50% increase with increase in temperature. MDLs of 20% and 50% appear not to allow for damping but MDLs <= 20% allow damping at temperature range of 45 degrees C <= T <= 70 degrees C. The magnitude of storage moduli of GaAs is smaller than that for ferromagnetic Ga1-xMnxAs systems. The loss moduli for GaAs were found to reduce with increase in temperature. Its magnitude of reducing gradient is smaller than Ga1-xMnxAs systems. The two temperature extremes show a general reduction in loss moduli for different MDLs at the study temperature range. From damping factor analysis, damping factors for ferromagnetic Ga1-xMnxAs was found to increase with decrease in MDLs contrary to GaAs which recorded the largest damping factor at 45 degrees C <= T <= 70 degrees C Hence, MDL of 20% shows little damping followed by 50% while MDL of 0% has the most damping in an increasing trend with temperature. (C) 2013 Elsevier Ltd. All rights reserved.

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Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

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Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

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Several countries have been passed by change processes in their fundamental geodesic structure with the focus on the adoption of geocentric reference systems. In Brazil, the adoption of the SIRGAS2000 evolves the coexistence of two realizations from the COrrego Alegre system, two realizations from the SAD69 system and one realization from the SIRGAS2000 system. To make use of products in the old reference systems, methods of coordinate transformation between the existent reference frames are necessary. So, in this paper one solution for the transformation between coordinates from different reference frames, based on Thin-Plate Splines (TPS), that allows the estimation of parameters from one linear transformation and also one non-linear model is presented. The TPS model was developed to work with tridimensional coordinates and in this paper the results and analysis are performed with simulated data and also with data from the official Brazilian Geodetic System (SGB). In the check points from SAD69 stations (realization of 1996 - SAD69/96), the values of RMSE obtained were of 78,2 mm in latitude and 67,5 mm in longitude, before the transformation to the SIRGAS2000. In the comparison between the TPS model and ProGriD (Brazilian software provided by IBGE), the statistical indicators were reduced in 97%, by using the TPS model. Based in the obtained results from real dataset, the TPS model appears to be promising, since it allows improving the quality of transformation process with simultaneous distortion modeling.

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